{"title":"Combined Use of Acoustic Measurement Techniques with X-ray Imaging for Real-Time Observation of Laser-Based Manufacturing","authors":"Mahdieh Samimi, Mehran Saadabadi, Hassan Hosseinlaghab","doi":"10.3390/metrology4020012","DOIUrl":"https://doi.org/10.3390/metrology4020012","url":null,"abstract":"Ensuring high-quality control in laser additive manufacturing and laser welding relies on the implementation of reliable and cost-effective real-time observation techniques. Real-time monitoring techniques play an important role in understanding critical physical phenomena, namely, melt pool dynamics and defect formation, during the manufacturing of components. This review aims to explore the integration of acoustic measurement techniques with X-ray imaging for studying these physical phenomena in laser manufacturing. A key aspect emphasized in this work is the importance of time synchronization for real-time observation using multiple sensors. X-ray imaging has proven to be a powerful tool for observing the dynamics of the melt pools and the formation of defects in real time. However, X-ray imaging has limitations in terms of accessibility which can be overcome through combination with other more-accessible measurement methods, such as acoustic emission spectroscopy. Furthermore, this combination simplifies the interpretation of acoustic data, which can be complex in its own right. This combined approach, which has evolved in recent years, presents a promising strategy for understanding acoustic emission signals during laser processing. This work provides a comprehensive review of existing research efforts in this area.","PeriodicalId":514840,"journal":{"name":"Metrology","volume":"56 8","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-04-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140729777","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
MetrologyPub Date : 2024-04-02DOI: 10.3390/metrology4020011
João P. Z. Machado, Gabriel Thaler, Antonio L. S. Pacheco, R. Flesch
{"title":"Impact of Angular Speed Calculation Methods from Encoder Measurements on the Test Uncertainty of Electric Motor Efficiency","authors":"João P. Z. Machado, Gabriel Thaler, Antonio L. S. Pacheco, R. Flesch","doi":"10.3390/metrology4020011","DOIUrl":"https://doi.org/10.3390/metrology4020011","url":null,"abstract":"The imperative need to advance the development of more efficient electric motors requires the meticulous measurement of small increments while minimizing the associated uncertainty in dynamometer tests. One of the key variables in such tests is the angular speed, which is typically obtained based on encoder measurements. This paper proposes a systematic measurement uncertainty assessment method based on the Guide to the Expression of Uncertainty for the two most widely used methods for angular speed measurement, namely, the frequency and period methods. In addition, the impact of the angular speed calculation method on the efficiency test uncertainty is assessed using an automatic test rig for electric motors. Our experimental results consider both steady-state and dynamic analyses. The results show that the period measurement method provides measurements with lower uncertainty for the encoders typically used in such test rigs, about 30 times less than the uncertainty determined for the frequency measurement method. Based on these results, the choice of a proper method can drastically decrease the angular speed uncertainty, and consequently the motor efficiency uncertainty, without increasing instrumentation cost.","PeriodicalId":514840,"journal":{"name":"Metrology","volume":"8 ","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-04-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140754855","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
MetrologyPub Date : 2024-03-26DOI: 10.3390/metrology4020010
Clement Moreau, Julie Lemesle, David Páez Margarit, F. Blateyron, Maxence Bigerelle
{"title":"Statistical Analysis of Measurement Processes Using Multi-Physic Instruments: Insights from Stitched Maps","authors":"Clement Moreau, Julie Lemesle, David Páez Margarit, F. Blateyron, Maxence Bigerelle","doi":"10.3390/metrology4020010","DOIUrl":"https://doi.org/10.3390/metrology4020010","url":null,"abstract":"Stitching methods allow one to measure a wider surface without the loss of resolution. The observation of small details with a better topographical representation is thus possible. However, it is not excluded that stitching methods generate some errors or aberrations on topography reconstruction. A device including confocal microscopy (CM), focus variation (FV), and coherence scanning interferometry (CSI) instrument modes was used to chronologically follow the drifts and the repositioning errors on stitching topographies. According to a complex measurement plan, a wide measurement campaign was performed on TA6V specimens that were ground with two neighboring SiC FEPA grit papers (P#80 and P#120). Thanks to four indicators (quality, drift, stability, and relevance indexes), no measurement drift in the system was found, indicating controlled stitching and repositioning processes for interferometry, confocal microscopy, and focus variation. Measurements show commendable stability, with interferometric microscopy being the most robust, followed by confocal microscopy, and then focus variation. Despite variations, robustness remains constant for each grinding grit, minimizing interpretation biases. A bootstrap analysis reveals time-dependent robustness for confocal microscopy, which is potentially linked to human presence. Despite Sa value discrepancies, all three metrologies consistently discriminate between grinding grits, highlighting the reliability of the proposed methodology.","PeriodicalId":514840,"journal":{"name":"Metrology","volume":"108 40","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140379595","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
MetrologyPub Date : 2024-03-13DOI: 10.3390/metrology4010009
Yatao Huang, Zihan Su, Di Chang, Yunke Sun, Jiubin Tan
{"title":"Error Analysis of an Economical On-Site Calibration System for Linear Optical Encoders","authors":"Yatao Huang, Zihan Su, Di Chang, Yunke Sun, Jiubin Tan","doi":"10.3390/metrology4010009","DOIUrl":"https://doi.org/10.3390/metrology4010009","url":null,"abstract":"A calibration system was designed to evaluate the accuracy of linear optical encoders at the micron level in a fast and economical manner. The system uses a commercial interferometer and motor stage as the calibrator and moving platform. Error analysis is necessary to prove the effectiveness and identify areas for optimization. A fixture was designed for the scale and interferometer target to meet the Abbe principle. A five-degree-of-freedom manual stage was utilized to adjust the reading head in optimal or suboptimal working conditions, such as working distance, offset, and angular misalignment. The results indicate that the calibration system has an accuracy of ±2.2 μm. The geometric errors of the calibration system, including mounting errors and non-ideal motions, are analyzed in detail. The system could be an inexpensive solution for encoder manufacturers and customers to calibrate a linear optical encoder or test its performance.","PeriodicalId":514840,"journal":{"name":"Metrology","volume":"2019 17","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-03-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140246103","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
MetrologyPub Date : 2024-03-05DOI: 10.3390/metrology4010007
A. Bülau, Daniela Walter, André Zimmermann
{"title":"A 10 V Transfer Standard Based on Low-Noise Solid-State Zener Voltage Reference ADR1000","authors":"A. Bülau, Daniela Walter, André Zimmermann","doi":"10.3390/metrology4010007","DOIUrl":"https://doi.org/10.3390/metrology4010007","url":null,"abstract":"Voltage standards are widely used to transfer volts from Josephson voltage standards (JVSs) at national metrology institutes (NMIs) into calibration labs to maintain the volts and to transfer them to test equipment at production lines. Therefore, commercial voltage standards based on Zener diodes are used. Analog Devices Inc. (San Jose, CA, USA), namely, Eric Modica, introduced the ADR1000KHZ, a successor to the legendary LTZ1000, at the Metrology Meeting 2021. The first production samples were already available prior to this event. In this article, this new temperature-stabilized Zener diode is compared to several others as per datasheet specifications. Motivated by the superior parameters, a 10 V transfer standard prototype for laboratory use with commercial off-the-shelf components such as resistor networks and chopper amplifiers was built. How much effort it takes to reach the given parameters was investigated. This paper describes how the reference was set up to operate it at its zero-temperature coefficient (z.t.c.) temperature and to lower the requirements for the oven stability. Furthermore, it is shown how the overall temperature coefficient (t.c.) of the circuit was reduced. For the buffered Zener voltage, a t.c. of almost zero, and with amplification to 10 V, a t.c. of <0.01 µV/V/K was achieved in a temperature span of 15 to 31 °C. For the buffered Zener voltage, a noise of ~584 nVp-p and for the 10 V output, ~805 nVp-p were obtained. Finally, 850 days of drift data were taken by comparing the transfer standard prototype to two Fluke 7000 voltage standards according to the method described in NBS Technical Note 430. The drift specification was, however, not met.","PeriodicalId":514840,"journal":{"name":"Metrology","volume":"107 26","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-03-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140079402","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
MetrologyPub Date : 2024-02-07DOI: 10.3390/metrology4010006
Jake D. Sundet, Jake Merrell, Maxwell Tree, Trevor Christensen, Stephen M Schultz
{"title":"Foam Pressure Mapping with Optimized Electrodes","authors":"Jake D. Sundet, Jake Merrell, Maxwell Tree, Trevor Christensen, Stephen M Schultz","doi":"10.3390/metrology4010006","DOIUrl":"https://doi.org/10.3390/metrology4010006","url":null,"abstract":"Nano-composite piezo-responsive foam (NCPF) is an inexpensive foam that can be used to measure a static load while still providing a comfortable interface. The purpose of this study was to create a modularized foam-based pressure measurement system. A measurement system was developed that uses an interdigitated electrode applied to the NCPF. Applied pressure changes the impedance of the NCPF, which, in turn, is converted into a voltage using a voltage divider. A modular measurement system is described that uses an ATtiny 1627 microcontroller to measure the pressure at nine electrodes. The nine electrode modules are controlled by an ESP32 microcontroller that aggregates the data and wirelessly transmits the data to a tablet. The modular system was demonstrated with 1008 individual electrodes. The characterization of the electrode combined with the NCPF is presented, along with optimization of the electrode geometry.","PeriodicalId":514840,"journal":{"name":"Metrology","volume":"92 11","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-02-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139794812","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
MetrologyPub Date : 2024-02-07DOI: 10.3390/metrology4010006
Jake D. Sundet, Jake Merrell, Maxwell Tree, Trevor Christensen, Stephen M Schultz
{"title":"Foam Pressure Mapping with Optimized Electrodes","authors":"Jake D. Sundet, Jake Merrell, Maxwell Tree, Trevor Christensen, Stephen M Schultz","doi":"10.3390/metrology4010006","DOIUrl":"https://doi.org/10.3390/metrology4010006","url":null,"abstract":"Nano-composite piezo-responsive foam (NCPF) is an inexpensive foam that can be used to measure a static load while still providing a comfortable interface. The purpose of this study was to create a modularized foam-based pressure measurement system. A measurement system was developed that uses an interdigitated electrode applied to the NCPF. Applied pressure changes the impedance of the NCPF, which, in turn, is converted into a voltage using a voltage divider. A modular measurement system is described that uses an ATtiny 1627 microcontroller to measure the pressure at nine electrodes. The nine electrode modules are controlled by an ESP32 microcontroller that aggregates the data and wirelessly transmits the data to a tablet. The modular system was demonstrated with 1008 individual electrodes. The characterization of the electrode combined with the NCPF is presented, along with optimization of the electrode geometry.","PeriodicalId":514840,"journal":{"name":"Metrology","volume":"151 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-02-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139854743","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
MetrologyPub Date : 2024-02-05DOI: 10.3390/metrology4010005
Mthabisi Adriano Nyathi, Jiping Bai, Ian David Wilson
{"title":"Deep Learning for Concrete Crack Detection and Measurement","authors":"Mthabisi Adriano Nyathi, Jiping Bai, Ian David Wilson","doi":"10.3390/metrology4010005","DOIUrl":"https://doi.org/10.3390/metrology4010005","url":null,"abstract":"Concrete structures inevitably experience cracking, which is a common form of damage. If cracks are left undetected and allowed to worsen, catastrophic failures, with costly implications for human life and the economy, can occur. Traditional image processing techniques for crack detection and measurement have several limitations, which include complex parameter selection and restriction to measuring cracks in pixels, rather than more practical units of millimetres. This paper presents a three-stage approach that utilises deep learning and image processing for crack classification, segmentation and measurement. In the first two stages, custom CNN and U-Net models were employed for crack classification and segmentation. The final stage involved measuring crack width in millimetres by using a novel laser calibration method. The classification and segmentation models achieved 99.22% and 96.54% accuracy, respectively, while the mean absolute error observed for crack width measurement was 0.16 mm. The results demonstrate the adequacy of the developed crack detection and measurement method, and shows the developed deep learning and laser calibration method promotes safer, quicker inspections that are less prone to human error. The method’s ability to measure cracks in millimetres provides a more insightful assessment of structural damage, which is, in comparison to traditional pixel-based measurement methods, a significant improvement for practical field applications.","PeriodicalId":514840,"journal":{"name":"Metrology","volume":"171 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-02-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139862907","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
MetrologyPub Date : 2024-02-05DOI: 10.3390/metrology4010005
Mthabisi Adriano Nyathi, Jiping Bai, Ian David Wilson
{"title":"Deep Learning for Concrete Crack Detection and Measurement","authors":"Mthabisi Adriano Nyathi, Jiping Bai, Ian David Wilson","doi":"10.3390/metrology4010005","DOIUrl":"https://doi.org/10.3390/metrology4010005","url":null,"abstract":"Concrete structures inevitably experience cracking, which is a common form of damage. If cracks are left undetected and allowed to worsen, catastrophic failures, with costly implications for human life and the economy, can occur. Traditional image processing techniques for crack detection and measurement have several limitations, which include complex parameter selection and restriction to measuring cracks in pixels, rather than more practical units of millimetres. This paper presents a three-stage approach that utilises deep learning and image processing for crack classification, segmentation and measurement. In the first two stages, custom CNN and U-Net models were employed for crack classification and segmentation. The final stage involved measuring crack width in millimetres by using a novel laser calibration method. The classification and segmentation models achieved 99.22% and 96.54% accuracy, respectively, while the mean absolute error observed for crack width measurement was 0.16 mm. The results demonstrate the adequacy of the developed crack detection and measurement method, and shows the developed deep learning and laser calibration method promotes safer, quicker inspections that are less prone to human error. The method’s ability to measure cracks in millimetres provides a more insightful assessment of structural damage, which is, in comparison to traditional pixel-based measurement methods, a significant improvement for practical field applications.","PeriodicalId":514840,"journal":{"name":"Metrology","volume":"2 6","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-02-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139802887","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Experimental Investigation on the Transfer Behavior and Environmental Influences of Low-Noise Integrated Electronic Piezoelectric Acceleration Sensors","authors":"Jan-Hauke Bartels, Ronghua Xu, Chongjie Kang, Ralf Herrmann, Steffen Marx","doi":"10.3390/metrology4010004","DOIUrl":"https://doi.org/10.3390/metrology4010004","url":null,"abstract":"Acceleration sensors are vital for assessing engineering structures by measuring properties like natural frequencies. In practice, engineering structures often have low natural frequencies and face harsh environmental conditions. Understanding sensor behavior on such structures is crucial for reliable measurements. The research focus is on understanding the behavior of acceleration sensors in harsh environmental conditions within the low-frequency acceleration range. The main question is how to distinguish sensor behavior from structural influences to minimize errors in assessing engineering structure conditions. To investigate this, the sensors are tested using a long-stroke calibration unit under varying temperature and humidity conditions. Additionally, a mini-monitoring system configured with four IEPE sensors is applied to a small-scale support structure within a climate chamber. For the evaluation, a signal-energy approach is employed to distinguish sensor behavior from structural behavior. The findings show that IEPE sensors display temperature-dependent nonlinear transmission behavior within the low-frequency acceleration range, with humidity having negligible impact. To ensure accurate engineering structure assessment, it is crucial to separate sensor behavior from structural influences using signal energy in the time domain. This study underscores the need to compensate for systematic effects, preventing the underestimation of vibration energy at low temperatures and overestimation at higher temperatures when using IEPE sensors for engineering structure monitoring.","PeriodicalId":514840,"journal":{"name":"Metrology","volume":"33 2","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139874890","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}