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Advances in Imaging and Electron Physics最新文献

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Convolution in (max,min)-algebra and its role in mathematical morphology (max,min)代数中的卷积及其在数学形态学中的作用
Advances in Imaging and Electron Physics Pub Date : 2017-01-01 DOI: 10.1016/BS.AIEP.2017.07.003
J. Angulo
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引用次数: 6
Critical Magnetic Field and Its Slope, Specific Heat, and Gap for Superconductivity as Modified by Nanoscopic Disorder 纳米无序修饰的超导临界磁场及其斜率、比热和间隙
Advances in Imaging and Electron Physics Pub Date : 2017-01-01 DOI: 10.1016/BS.AIEP.2017.07.004
C. Krowne
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引用次数: 1
Phase Plates for Transmission Electron Microscopy 透射电子显微镜用相板
Advances in Imaging and Electron Physics Pub Date : 2017-01-01 DOI: 10.1016/BS.AIEP.2017.01.007
C. Edgcombe
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引用次数: 3
Chapter Seven – General Conclusion 第七章:总论
Advances in Imaging and Electron Physics Pub Date : 2016-12-31 DOI: 10.1016/bs.aiep.2016.04.007
M. Jourlin
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引用次数: 0
Symmetry Breaking by Electric Discharges in Water and Formation of Lochak’s Light Magnetic Monopoles in an Extended Standard Model 水中放电的对称性破缺和扩展标准模型中Lochak光磁单极子的形成
Advances in Imaging and Electron Physics Pub Date : 2016-01-26 DOI: 10.1016/BS.AIEP.2015.01.002
H. Stumpf
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引用次数: 0
Foreword: Short History of the LIP Model 前言:LIP模型简史
Advances in Imaging and Electron Physics Pub Date : 2016-01-01 DOI: 10.1016/S1076-5670(16)30078-7
M. Jourlin
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引用次数: 1
Utilizing the Eigen-Emittance Concept for Bright Electron Beams 利用本征发射度概念研究明亮电子束
Advances in Imaging and Electron Physics Pub Date : 2016-01-01 DOI: 10.1016/BS.AIEP.2015.11.001
L. Duffy, A. Dragt
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引用次数: 4
Chapter One - Gray-Level LIP Model. Notations, Recalls, and First Applications 第一章:灰度LIP模型。符号、回忆和首次应用
Advances in Imaging and Electron Physics Pub Date : 2016-01-01 DOI: 10.1016/BS.AIEP.2016.04.001
M. Jourlin
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引用次数: 6
Chapter Three – Quest for Ultimate Resolution Using Coherent Electron Waves: An Aberration-Corrected High-Voltage Electron Microscope 第三章-探索使用相干电子波的最终分辨率:一种像差校正的高压电子显微镜
Advances in Imaging and Electron Physics Pub Date : 2016-01-01 DOI: 10.1016/BS.AIEP.2016.08.004
T. Tanigaki, T. Akashi, Yoshio Takahashi, T. Kawasaki, H. Shinada
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引用次数: 7
Chapter Two – Transmission Electron Microscopy: Emerging Investigations for Cultural Heritage Materials 第二章-透射电子显微镜:文化遗产材料的新兴研究
Advances in Imaging and Electron Physics Pub Date : 2016-01-01 DOI: 10.1016/BS.AIEP.2016.09.002
P. Sciau
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引用次数: 14
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