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Advances in Imaging and Electron Physics最新文献

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Off-Axis Electron Holography 离轴电子全息术
Advances in Imaging and Electron Physics Pub Date : 2016-01-01 DOI: 10.1016/BS.AIEP.2016.02.010
G. Pozzi
{"title":"Off-Axis Electron Holography","authors":"G. Pozzi","doi":"10.1016/BS.AIEP.2016.02.010","DOIUrl":"https://doi.org/10.1016/BS.AIEP.2016.02.010","url":null,"abstract":"","PeriodicalId":50863,"journal":{"name":"Advances in Imaging and Electron Physics","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2016-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/BS.AIEP.2016.02.010","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"54026781","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Chapter Two - Voltage Contrast Modes in a Scanning Electron Microscope and Their Application 第二章扫描电子显微镜的电压对比模式及其应用
Advances in Imaging and Electron Physics Pub Date : 2016-01-01 DOI: 10.1016/BS.AIEP.2016.04.010
V. Dyukov, S. Nepijko, G. Schönhense
{"title":"Chapter Two - Voltage Contrast Modes in a Scanning Electron Microscope and Their Application","authors":"V. Dyukov, S. Nepijko, G. Schönhense","doi":"10.1016/BS.AIEP.2016.04.010","DOIUrl":"https://doi.org/10.1016/BS.AIEP.2016.04.010","url":null,"abstract":"","PeriodicalId":50863,"journal":{"name":"Advances in Imaging and Electron Physics","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2016-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/BS.AIEP.2016.04.010","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"54027665","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Particle Theory of Image Formation 图像形成的粒子理论
Advances in Imaging and Electron Physics Pub Date : 2016-01-01 DOI: 10.1016/BS.AIEP.2016.02.003
G. Pozzi
{"title":"Particle Theory of Image Formation","authors":"G. Pozzi","doi":"10.1016/BS.AIEP.2016.02.003","DOIUrl":"https://doi.org/10.1016/BS.AIEP.2016.02.003","url":null,"abstract":"","PeriodicalId":50863,"journal":{"name":"Advances in Imaging and Electron Physics","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2016-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/BS.AIEP.2016.02.003","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"54026467","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
The Wavefunction of the Paraxial Electrons 近轴电子的波函数
Advances in Imaging and Electron Physics Pub Date : 2016-01-01 DOI: 10.1016/BS.AIEP.2016.02.006
G. Pozzi
{"title":"The Wavefunction of the Paraxial Electrons","authors":"G. Pozzi","doi":"10.1016/BS.AIEP.2016.02.006","DOIUrl":"https://doi.org/10.1016/BS.AIEP.2016.02.006","url":null,"abstract":"","PeriodicalId":50863,"journal":{"name":"Advances in Imaging and Electron Physics","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2016-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/BS.AIEP.2016.02.006","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"54026531","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Other Interference Experiments 其他干扰实验
Advances in Imaging and Electron Physics Pub Date : 2016-01-01 DOI: 10.1016/BS.AIEP.2016.02.008
G. Pozzi
{"title":"Other Interference Experiments","authors":"G. Pozzi","doi":"10.1016/BS.AIEP.2016.02.008","DOIUrl":"https://doi.org/10.1016/BS.AIEP.2016.02.008","url":null,"abstract":"","PeriodicalId":50863,"journal":{"name":"Advances in Imaging and Electron Physics","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2016-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/BS.AIEP.2016.02.008","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"54026671","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Waveoptical Analysis of the Spherical Aberration 球差的波光学分析
Advances in Imaging and Electron Physics Pub Date : 2016-01-01 DOI: 10.1016/BS.AIEP.2016.02.011
G. Pozzi
{"title":"Waveoptical Analysis of the Spherical Aberration","authors":"G. Pozzi","doi":"10.1016/BS.AIEP.2016.02.011","DOIUrl":"https://doi.org/10.1016/BS.AIEP.2016.02.011","url":null,"abstract":"","PeriodicalId":50863,"journal":{"name":"Advances in Imaging and Electron Physics","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2016-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/BS.AIEP.2016.02.011","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"54026825","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Metrics Based on Logarithmic Laws 基于对数定律的度量
Advances in Imaging and Electron Physics Pub Date : 2016-01-01 DOI: 10.1016/BS.AIEP.2016.04.003
M. Jourlin
{"title":"Metrics Based on Logarithmic Laws","authors":"M. Jourlin","doi":"10.1016/BS.AIEP.2016.04.003","DOIUrl":"https://doi.org/10.1016/BS.AIEP.2016.04.003","url":null,"abstract":"","PeriodicalId":50863,"journal":{"name":"Advances in Imaging and Electron Physics","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2016-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/BS.AIEP.2016.04.003","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"54027081","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Various Contrast Concepts 各种对比概念
Advances in Imaging and Electron Physics Pub Date : 2016-01-01 DOI: 10.1016/BS.AIEP.2016.04.002
M. Jourlin
{"title":"Various Contrast Concepts","authors":"M. Jourlin","doi":"10.1016/BS.AIEP.2016.04.002","DOIUrl":"https://doi.org/10.1016/BS.AIEP.2016.04.002","url":null,"abstract":"","PeriodicalId":50863,"journal":{"name":"Advances in Imaging and Electron Physics","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2016-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/BS.AIEP.2016.04.002","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"54026991","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Ability of the LIP Model to Simulate Variable Acquisition Conditions LIP模型模拟可变采集条件的能力
Advances in Imaging and Electron Physics Pub Date : 2016-01-01 DOI: 10.1016/BS.AIEP.2016.04.005
M. Jourlin
{"title":"Ability of the LIP Model to Simulate Variable Acquisition Conditions","authors":"M. Jourlin","doi":"10.1016/BS.AIEP.2016.04.005","DOIUrl":"https://doi.org/10.1016/BS.AIEP.2016.04.005","url":null,"abstract":"","PeriodicalId":50863,"journal":{"name":"Advances in Imaging and Electron Physics","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2016-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/BS.AIEP.2016.04.005","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"54027192","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
WITHDRAWN: A Review of Scanning Electron Microscopy in Near Field Emission Mode 摘自:近场发射模式扫描电镜研究综述
Advances in Imaging and Electron Physics Pub Date : 2016-01-01 DOI: 10.1016/BS.AIEP.2016.04.009
T. L. Kirk
{"title":"WITHDRAWN: A Review of Scanning Electron Microscopy in Near Field Emission Mode","authors":"T. L. Kirk","doi":"10.1016/BS.AIEP.2016.04.009","DOIUrl":"https://doi.org/10.1016/BS.AIEP.2016.04.009","url":null,"abstract":"","PeriodicalId":50863,"journal":{"name":"Advances in Imaging and Electron Physics","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2016-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/BS.AIEP.2016.04.009","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"54027610","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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