Chapter Three – Quest for Ultimate Resolution Using Coherent Electron Waves: An Aberration-Corrected High-Voltage Electron Microscope

Q4 Physics and Astronomy

Advances in Imaging and Electron Physics Pub Date : 2016-01-01 DOI:10.1016/BS.AIEP.2016.08.004

T. Tanigaki, T. Akashi, Yoshio Takahashi, T. Kawasaki, H. Shinada

引用次数: 7

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第三章-探索使用相干电子波的最终分辨率:一种像差校正的高压电子显微镜

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Advances in Imaging and Electron Physics 物理-物理：应用

CiteScore

0.40

自引率

0.00%

发文量

审稿时长

>12 weeks

期刊介绍： Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.