Habib Ullah, Q. Cao, S. Rahman, I. Khan, Inam Ullah
{"title":"Design and Performance Evaluation of SWB MIMO Antenna with Tri-Notch Functionality and Mutual Coupling Suppression","authors":"Habib Ullah, Q. Cao, S. Rahman, I. Khan, Inam Ullah","doi":"10.1587/elex.20.20230246","DOIUrl":"https://doi.org/10.1587/elex.20.20230246","url":null,"abstract":"","PeriodicalId":50387,"journal":{"name":"Ieice Electronics Express","volume":null,"pages":null},"PeriodicalIF":0.8,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67302684","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
H. Ito, Yuma Kawamoto, Takahiro Ohara, Tadao Nagatsuma, Tadao Ishibashi
{"title":"Low-noise balanced mixer for 300-GHz band based on Fermi-level managed barrier diode on SiC platform","authors":"H. Ito, Yuma Kawamoto, Takahiro Ohara, Tadao Nagatsuma, Tadao Ishibashi","doi":"10.1587/elex.20.20230395","DOIUrl":"https://doi.org/10.1587/elex.20.20230395","url":null,"abstract":"","PeriodicalId":50387,"journal":{"name":"Ieice Electronics Express","volume":null,"pages":null},"PeriodicalIF":0.8,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67302727","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Bond wires aging monitoring for IGBT module based on junction temperature difference of TSEPs","authors":"Yulin Liu, Mingxing Du, Jinliang Yin, Chao Dong","doi":"10.1587/elex.20.20230275","DOIUrl":"https://doi.org/10.1587/elex.20.20230275","url":null,"abstract":"","PeriodicalId":50387,"journal":{"name":"Ieice Electronics Express","volume":null,"pages":null},"PeriodicalIF":0.8,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67302817","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Hongyu Ren, Yaoyi Yu, Junliang Liu, Junjie Zhou, Xiong Du
{"title":"Lifetime prediction of power MOSFET based on LSTM with successive variational mode decomposition and error compensation","authors":"Hongyu Ren, Yaoyi Yu, Junliang Liu, Junjie Zhou, Xiong Du","doi":"10.1587/elex.20.20230277","DOIUrl":"https://doi.org/10.1587/elex.20.20230277","url":null,"abstract":"","PeriodicalId":50387,"journal":{"name":"Ieice Electronics Express","volume":null,"pages":null},"PeriodicalIF":0.8,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67302837","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}