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Exploration of Electronic States at Electrochemical Interfaces using Photoelectron Spectroscopy 利用光电子能谱研究电化学界面的电子态
Hyomen to shinku Pub Date : 2023-09-10 DOI: 10.1380/vss.66.531
Yasuyuki YOKOTA
{"title":"Exploration of Electronic States at Electrochemical Interfaces using Photoelectron Spectroscopy","authors":"Yasuyuki YOKOTA","doi":"10.1380/vss.66.531","DOIUrl":"https://doi.org/10.1380/vss.66.531","url":null,"abstract":"Microscopic studies on electrolyte solution/electrode interfaces provide the most fundamental information not only for understanding the electric double layer formed at the interfaces but also for designing sophisticated electrochemical devices. As with various electronic devices, it is critical to understand the electronic structure of the interfaces, but direct assessment has been limited by the presence of solution. This article presents our exploration of the electronic structure of electrochemical interfaces using photoelectron spectroscopy and electrochemical measurements.","PeriodicalId":470115,"journal":{"name":"Hyomen to shinku","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136071861","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
マイクロビームアナリシス技術部会（MBA技術部会）第13回定例研究会開催報告 微波束分析技术部会(MBA技术部会)第13次定期研究会召开报告
Hyomen to shinku Pub Date : 2023-09-10 DOI: 10.1380/vss.66.557
Susumu SHIRAKI
{"title":"マイクロビームアナリシス技術部会（MBA技術部会）第13回定例研究会開催報告","authors":"Susumu SHIRAKI","doi":"10.1380/vss.66.557","DOIUrl":"https://doi.org/10.1380/vss.66.557","url":null,"abstract":"","PeriodicalId":470115,"journal":{"name":"Hyomen to shinku","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136071755","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
日本表面真空学会 真空技術部会2023年6月研究例会「真空とビーム応用」開催報告 日本表面真空学会 真空技術部会2023年6月研究例会「真空とビーム応用」開催報告
Hyomen to shinku Pub Date : 2023-09-10 DOI: 10.1380/vss.66.555
Masahiro YAMAMOTO
{"title":"日本表面真空学会 真空技術部会2023年6月研究例会「真空とビーム応用」開催報告","authors":"Masahiro YAMAMOTO","doi":"10.1380/vss.66.555","DOIUrl":"https://doi.org/10.1380/vss.66.555","url":null,"abstract":"","PeriodicalId":470115,"journal":{"name":"Hyomen to shinku","volume":"68 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136071756","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
[R-757] メタルレジスト：[R-758] 導電性高分子による歪センサー技術 [R-757]金属对位:[R-758]导电高分子失真传感器技术
Hyomen to shinku Pub Date : 2023-08-10 DOI: 10.1380/vss.66.502
{"title":"[R-757] メタルレジスト：[R-758] 導電性高分子による歪センサー技術","authors":"","doi":"10.1380/vss.66.502","DOIUrl":"https://doi.org/10.1380/vss.66.502","url":null,"abstract":"","PeriodicalId":470115,"journal":{"name":"Hyomen to shinku","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-08-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135492600","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Nanoarchitectonics at Surfaces : Reaction, Adsorption, and Assembly 纳米结构在表面:反应，吸附和组装
Hyomen to shinku Pub Date : 2023-06-10 DOI: 10.1380/vss.66.322
Katsuhiko ARIGA
{"title":"Nanoarchitectonics at Surfaces : Reaction, Adsorption, and Assembly","authors":"Katsuhiko ARIGA","doi":"10.1380/vss.66.322","DOIUrl":"https://doi.org/10.1380/vss.66.322","url":null,"abstract":"The development of nanotechnology has made it possible to evaluate properties and functions at the nano-level. In order to fulfill this as material chemistry, it is necessary to develop a concept that integrates nanotechnology with existing fields such as supramolecular chemistry. This role is assigned to nanoarchitectonics, which is considered as a post-nanotechnology concept. In this paper, several recent examples related to nanoarchitectonics especially at interfaces are reviewed and discussed. In addition to nontechnology-driven organic reaction at solid surfaces, various nano-films preparation though techniques such as Langmuir-Blodgett (LB) method and layer-by-layer (LbL) assembly were discussed as nanoarchitectonics approaches to create functional materials such as two-dimensional nanocarbons and electroactive ultrathin films at interfaces.","PeriodicalId":470115,"journal":{"name":"Hyomen to shinku","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-06-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135006153","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
On the 20 Year Anniversary of <i>e-Journal of Surface Science and Nanotechnology</i> 《表面科学与纳米技术》电子杂志创刊20周年纪念&lt;
Hyomen to shinku Pub Date : 2023-05-10 DOI: 10.1380/vss.66.261
Ayahiko ICHIMIYA
{"title":"On the 20 Year Anniversary of &lt;i&gt;e-Journal of Surface Science and Nanotechnology&lt;/i&gt;","authors":"Ayahiko ICHIMIYA","doi":"10.1380/vss.66.261","DOIUrl":"https://doi.org/10.1380/vss.66.261","url":null,"abstract":"","PeriodicalId":470115,"journal":{"name":"Hyomen to shinku","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135672710","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Electron Inelastic Scattering in Surface Analysis 表面分析中的电子非弹性散射
Hyomen to shinku Pub Date : 2023-05-10 DOI: 10.1380/vss.66.292
Shigeo TANUMA
{"title":"Electron Inelastic Scattering in Surface Analysis","authors":"Shigeo TANUMA","doi":"10.1380/vss.66.292","DOIUrl":"https://doi.org/10.1380/vss.66.292","url":null,"abstract":"This paper describes the recent progress in electron inelastic mean free paths (IMFPs) calculations with the dielectric response function and the optical energy loss function (ELF) as key parameters. As a result, it has been found that for most materials, the IMFP values calculated by the various calculation algorithms agreed well each other in the energy region above 300 eV. However, there is a large difference in the energies under 200 eV. The energy dependence of IMFPs calculated from optical ELFs could be expressed by the modified Bethe equation in the energies between 50 eV and 200 keV. The material dependence of IMFPs could be expressed by the TPP-2M equation. For IMFP calculations, the treatments and evaluations of the electron exchange effect, the effect of energy gap in the energy loss function, and the associated integral region also remain important issues to be addressed in the future.","PeriodicalId":470115,"journal":{"name":"Hyomen to shinku","volume":"103 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135672707","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Step-bunching Instability of Growing Interfaces between Ice and Supercooled Water 冰与过冷水生长界面的阶梯聚束不稳定性
Hyomen to shinku Pub Date : 2023-04-10 DOI: 10.1380/vss.66.221
Ken-ichiro MURATA, Gen SAZAKI
{"title":"Step-bunching Instability of Growing Interfaces between Ice and Supercooled Water","authors":"Ken-ichiro MURATA, Gen SAZAKI","doi":"10.1380/vss.66.221","DOIUrl":"https://doi.org/10.1380/vss.66.221","url":null,"abstract":"We review our recent study on step-bunching instability (SBI) of ice melt growth, one of the interfacial instabilities driven by self-organization of elementary step flow associated with crystal growth dynamics. With the aid of an advanced optical microscope and its combination with a two-beam interferometer, we realized quantitative in situ observations of the spatiotemporal dynamics of the SBI. This enables us to examine the origin of the SBI at the level of the step–step interaction. Our finding offers a significant clue to understanding the general mechanism of melt growth beyond ice-crystal growth, inseparably involving several broad research fields, including cryobiological, geophysical, and material branches.","PeriodicalId":470115,"journal":{"name":"Hyomen to shinku","volume":"142 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-04-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135543070","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Report on the 172nd Seminar of Division of Sputtering and Plasma Processes 第172届溅射与等离子体工艺分会研讨会报告
Hyomen to shinku Pub Date : 2023-03-10 DOI: 10.1380/vss.66.186
Tetsuhide SHIMIZU
{"title":"Report on the 172nd Seminar of Division of Sputtering and Plasma Processes","authors":"Tetsuhide SHIMIZU","doi":"10.1380/vss.66.186","DOIUrl":"https://doi.org/10.1380/vss.66.186","url":null,"abstract":"","PeriodicalId":470115,"journal":{"name":"Hyomen to shinku","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136096801","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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