{"title":"Nanotechnology: From Materials Science to Insulation Design","authors":"Yue Xu;Vaibhav Bahadur;Robert Hebner","doi":"10.1109/MEI.2026.11493690","DOIUrl":"https://doi.org/10.1109/MEI.2026.11493690","url":null,"abstract":"Global research uses nano- and microparticles to produce innovative insulation for winding insulation, electromobility, anticorona paint, transformer insulation, and bushings. Scientific, multifunctional research on materials provided the engineering data required to design manufacturable insulation. This article overviews the holistic approach needed to successfully develop insulation materials by examining specific insulation systems from recent research.","PeriodicalId":444,"journal":{"name":"IEEE Electrical Insulation Magazine","volume":"42 3","pages":"20-27"},"PeriodicalIF":1.3,"publicationDate":"2026-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147732967","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Young Professionals: Baptiste Robbiani—2024 DEIS Graduate Student Fellow","authors":"Baptiste Robbiani","doi":"10.1109/MEI.2026.11440035","DOIUrl":"https://doi.org/10.1109/MEI.2026.11440035","url":null,"abstract":"My project “Electroluminescence and mechanoluminescence of model epoxy resins to investigate electromechanical degradation mechanisms” was selected for the 2024 Graduate Fellowship program. This project was conducted at the LAPLACE laboratory, Toulouse, France, and part of the results were presented during the 2025 Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) in Manchester, UK (Figure 1).","PeriodicalId":444,"journal":{"name":"IEEE Electrical Insulation Magazine","volume":"42 2","pages":"48-48"},"PeriodicalIF":1.3,"publicationDate":"2026-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11440035","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147558054","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Stories from China: Nondestructive 3D Imaging of Electric Tree Evolution via In Situ Autofluorescence","authors":"Zepeng Lv","doi":"10.1109/MEI.2026.11440085","DOIUrl":"https://doi.org/10.1109/MEI.2026.11440085","url":null,"abstract":"Polymers serve as foundational insulating materials critical for the operational safety of power equipment and integrated circuits. However, during service, stresses from multi-physical fields (electrical, thermal, mechanical) can induce the formation of fractal electrical tree damage at composite interfaces. These micro- to nano-scale conductive channels are characterized by trunk diameters ranging from several to tens of micrometers, terminating in submicron tips [1], [2]. Polymer interfaces govern electrical tree evolution through competing mechanisms. On one hand, they act as weak links where electric fields concentrate because of material compatibility mismatches [3]; on the other hand, they can form inhibitory barriers via localized chain conformational adjustments. The propagation of electrical trees triggers a catastrophic cascade, initiating a process that evolves from localized microstructural degradation to systemic failure and, ultimately, insulation breakdown. This behavioral complexity, coupled with the unique physicochemical properties of interfaces and the severity of the resulting damage, presents a core challenge in dielectric failure research. Consequently, the integration of in situ three-dimensional (3D) characterization techniques [4], [5] to investigate the micro-dynamic processes of interfacial electrical trees is critical: it not only advances the science of interfacial insulation, but also provides key support for improving the service reliability of power equipment.","PeriodicalId":444,"journal":{"name":"IEEE Electrical Insulation Magazine","volume":"42 2","pages":"45-47"},"PeriodicalIF":1.3,"publicationDate":"2026-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11440085","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147557729","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Bulletin Board: IEEE ICD 2026—Almost here!","authors":"","doi":"10.1109/MEI.2026.11440042","DOIUrl":"https://doi.org/10.1109/MEI.2026.11440042","url":null,"abstract":"The 6th International Conference on Dielectrics (ICD 2026) taking place June 21–25 in Southampton, UK, is just around the corner, with preparations in full swing!","PeriodicalId":444,"journal":{"name":"IEEE Electrical Insulation Magazine","volume":"42 2","pages":"54-55"},"PeriodicalIF":1.3,"publicationDate":"2026-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11440042","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147557962","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Bulletin Board: In Memoriam Arend von Roggen","authors":"","doi":"10.1109/MEI.2026.11440040","DOIUrl":"https://doi.org/10.1109/MEI.2026.11440040","url":null,"abstract":"Arend van Roggen, editor in chief of the IEEE Transactions on Dielectrics and Electrical Insulation (TDEI) for a quarter century from 1977 until 2001, passed away peacefully on Saturday, August 2, 2025, at the age of 97 in Boxborough, Massachusetts. He was born in Nijmegen, the Netherlands, on January 2, 1928. He earned his undergraduate degree in physics and chemistry and his “doctorandus” degree at the University of Leiden and moved to the United States in 1954 together with his wife, Lien. In 1956 he completed his PhD in physics at Duke University in Durham, North Carolina, with Professor Walter Gordy (1909–1985) and started his day job at E.I. du Pont de Nemours Inc. at their Experimental Station in Wilmington, Delaware—first in the Polychemicals Department dealing with EPR magnetic-resonance experiments, then in the Radiation Physics Department, and finally in Engineering Physics.","PeriodicalId":444,"journal":{"name":"IEEE Electrical Insulation Magazine","volume":"42 2","pages":"53-53"},"PeriodicalIF":1.3,"publicationDate":"2026-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11440040","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"147558055","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Failure Mechanisms and Characterization of High-Temperature-Vulcanized Silicone Rubber Under AC Electric Fields Subject to Corrosive Environments","authors":"Guohui Pang;Zhijin Zhang;Steven Qi Li;Jiayu Li;Simon M. Rowland;Song Yue;Konstantinos Kopsidas;Xingliang Jiang","doi":"10.1109/MEI.2026.11306299","DOIUrl":"https://doi.org/10.1109/MEI.2026.11306299","url":null,"abstract":"This study predicts the failure of energized silicone rubber exposed to corrosive fog environments by analyzing leakage current characteristics and the hydrophobicity loss ratio, which serve as indicators of insulation degradation and operational reliability.","PeriodicalId":444,"journal":{"name":"IEEE Electrical Insulation Magazine","volume":"42 1","pages":"16-29"},"PeriodicalIF":1.3,"publicationDate":"2025-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145778261","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}