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2011 IEEE International Symposium on Electromagnetic Compatibility最新文献

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Stochastic and statistics in superposition of multipole radiators 多极辐射体叠加的随机与统计
2011 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2011-10-10 DOI: 10.1109/ISEMC.2011.6038315
O. Doring, A. Kreth, H. Garbe
{"title":"Stochastic and statistics in superposition of multipole radiators","authors":"O. Doring, A. Kreth, H. Garbe","doi":"10.1109/ISEMC.2011.6038315","DOIUrl":"https://doi.org/10.1109/ISEMC.2011.6038315","url":null,"abstract":"The multipole approximation is a sufficient method for fast calculations of the electromagnetic field and for complex electromagnetic environments with many field sources. In this paper, the influences on the superposition of electromagnetic fields generated by multipole sources are under consideration. The phase angle of the multipole field sources is unknown when estimating multipole parameters. Therefore, the influence of random phase angles on interference patterns is under investigation. This paper demonstrates two phase independent superposition methods. Additionally, a probability distribution for field strength values is derived. This distribution demonstrates the influence of random variables on the probability of field strength values.","PeriodicalId":440959,"journal":{"name":"2011 IEEE International Symposium on Electromagnetic Compatibility","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128923591","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Estimation of standards compliance uncertainty for radiated emission measurement in the pt program pt计划中辐射发射测量标准符合性不确定度的估计
2011 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2011-10-10 DOI: 10.1109/ISEMC.2011.6038453
K. Osabe, T. Kato
{"title":"Estimation of standards compliance uncertainty for radiated emission measurement in the pt program","authors":"K. Osabe, T. Kato","doi":"10.1109/ISEMC.2011.6038453","DOIUrl":"https://doi.org/10.1109/ISEMC.2011.6038453","url":null,"abstract":"VLAC, a Japanese laboratory accreditation body mainly in the field of EMC testing, has organized PT (Proficiency Testing) program of EMI measurement six times since 2005. The program has been performed with the type of inter-laboratory comparison by circulating an artifact. Based on the evaluation result of programs, the SCU (standards compliance uncertainty) of radiated emission measurement was estimated from the group interval of the collected data. Each test site carried out the measurement of radiated electromagnetic interference from the artifact under the conditions specified in the program including the use of the accompanying VHF LISN (Line Impedance Stabilization Network) to specify the common mode impedance of AC power supply of each participated test site. This paper discusses the calculation value of SCU which resulted in no greater than 6.9dB if EUT (Equipment under Test) has a simple operating condition and makes a simple test arrangement, and if the terminating condition of AC mains power supply is specified with using a stabilization device such as VHF-LISN.","PeriodicalId":440959,"journal":{"name":"2011 IEEE International Symposium on Electromagnetic Compatibility","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129292902","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Stand-alone electric-field probe for measurements within enclosures 用于外壳内测量的独立电场探头
2011 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2011-10-10 DOI: 10.1109/ISEMC.2011.6038276
H. Funato, T. Suga
{"title":"Stand-alone electric-field probe for measurements within enclosures","authors":"H. Funato, T. Suga","doi":"10.1109/ISEMC.2011.6038276","DOIUrl":"https://doi.org/10.1109/ISEMC.2011.6038276","url":null,"abstract":"We propose a stand-alone electric-field probe for realizing electric-field measurements within enclosures that have no slits or holes. The prototype probe has an radio frequency (RF) power detector IC, a programmable IC for storing the electric field measurement data, and a bent monopole antenna printed on a PCB that is mounted in a shielding box. The probe was evaluated using electric fields in the range 10 to 100 V/m. The probe functioned up to 1 GHz. The prototype probe was used to measure the electric field inside an enclosure. There was a good correlation between the normalized electric field strength measured by the prototype probe and measurements by a conventional probe. The maximum error was 8 dB at 0.2 GHz.","PeriodicalId":440959,"journal":{"name":"2011 IEEE International Symposium on Electromagnetic Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128797951","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Integration of wireless communications with modernized power grids: EMI impacts and considerations 无线通信与现代化电网的集成:电磁干扰的影响和考虑
2011 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2011-10-10 DOI: 10.1109/ISEMC.2011.6038331
Qin Yu, R. Johnson
{"title":"Integration of wireless communications with modernized power grids: EMI impacts and considerations","authors":"Qin Yu, R. Johnson","doi":"10.1109/ISEMC.2011.6038331","DOIUrl":"https://doi.org/10.1109/ISEMC.2011.6038331","url":null,"abstract":"SmartGrid has spurred huge enthusiasm in investment and a frenzy to develop various elements of the SmartGrid, including sensing, monitoring, metering, communications, control and automation devices. The integration of information technologies (IT), smart devices and advanced communication technologies with power grids can lead to electromagnetic interference (EMI) issues. The communication infrastructure is the foundation for “smart” devices and will be everyplace where the SmartGrid exists. Therefore, studying the impact of deploying communications equipment in the SmartGrid and understanding the EMI radiated emissions and immunity requirements is important for reducing interference with other SmartGrid devices. This paper provides a brief overview about the electromagnetic environment in power grids and the EMI emissions requirements of international standards for wireless communication equipment to be used in SmartGrid. The impact of SmartGrid environment on the wireless communications equipment and EMI radiated emissions and immunity testing requirements are discussed. The design hardening for improving the radiated immunity performance of SmartGrid equipment is proposed.","PeriodicalId":440959,"journal":{"name":"2011 IEEE International Symposium on Electromagnetic Compatibility","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115106838","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Numerical and metrological investigations for pacemakers with unipolar and bipolar electrodes in electric and magnetic fields 电场和磁场中单极和双极电极起搏器的数值和计量研究
2011 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2011-10-10 DOI: 10.1109/ISEMC.2011.6038407
S. Hille, K. Eichhorn, K. Gonschorek
{"title":"Numerical and metrological investigations for pacemakers with unipolar and bipolar electrodes in electric and magnetic fields","authors":"S. Hille, K. Eichhorn, K. Gonschorek","doi":"10.1109/ISEMC.2011.6038407","DOIUrl":"https://doi.org/10.1109/ISEMC.2011.6038407","url":null,"abstract":"The disturbance in active medical implants, especially heart pacemakers (PMK), in the low frequency range is still actual in spite of many studies performed in this area. In low-frequency electric fields the analytic calculation of the induced voltage at the pacemaker entrance is always based on a homogeneous electric field. In this paper a procedure is introduced which allows a conversion for inhomogeneous electric fields. Furthermore numerical simulations for unipolar and bipolar electrodes in a human torso model are compared with measurements in an electrolytic solution. These results permit to calculate the safety factor of the bipolar electrode compared with that of the unipolar electrode.","PeriodicalId":440959,"journal":{"name":"2011 IEEE International Symposium on Electromagnetic Compatibility","volume":"117 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127280042","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
High speed differential I/O overview and design challenges on Intel enterprise server platforms 英特尔企业服务器平台上的高速差分I/O概述和设计挑战
2011 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2011-10-10 DOI: 10.1109/ISEMC.2011.6038414
Beom Lee, M. Mazumder, R. Mellitz
{"title":"High speed differential I/O overview and design challenges on Intel enterprise server platforms","authors":"Beom Lee, M. Mazumder, R. Mellitz","doi":"10.1109/ISEMC.2011.6038414","DOIUrl":"https://doi.org/10.1109/ISEMC.2011.6038414","url":null,"abstract":"In this paper, the high speed differential I/O buses which are used on Intel server platforms are explored. The characteristics of channel components are examined along with channel and I/O circuit design challenges. Statistical time domain and frequency domain methods are briefly discussed as start-of-art simulation tools.","PeriodicalId":440959,"journal":{"name":"2011 IEEE International Symposium on Electromagnetic Compatibility","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122607164","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Electromagnetic radiation resulting from strip line structure driven by a feed cable 由馈电电缆驱动的带状线路结构产生的电磁辐射
2011 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2011-10-10 DOI: 10.1109/ISEMC.2011.6038303
Y. Kayano, H. Inoue
{"title":"Electromagnetic radiation resulting from strip line structure driven by a feed cable","authors":"Y. Kayano, H. Inoue","doi":"10.1109/ISEMC.2011.6038303","DOIUrl":"https://doi.org/10.1109/ISEMC.2011.6038303","url":null,"abstract":"Printed circuit boards (PCBs) driven by a connected feed cable are considered to be one of the main sources of the electromagnetic interference (EMI) from electronic devices. Effective methods for predicting and suppressing EMI over a broad band are required. In this paper, we newly focus on identifying the frequency response of EM radiation from a strip line structure driven by a connected feed cable. To provide basic considerations for the realization of methods for predicting the EM radiation from strip line structure driven by a feed cable, the characteristics of the EMI of test model PCB are investigated in this paper experimentally and by numerical modeling. Firstly, frequency responses of common-mode (CM) current and EM radiation from a PCB without the feed cable are discussed by FDTD modeling. It was demonstrated that SL and shield structures without a feed cable are effective in suppressing the EMI. Secondly, CM current on the feed cable attached to the PCB is studied experimentally and compared with FDTD modeling. Due to the additional displacement current path, “SL” structure driven by the feed cable is not effective in suppressing EMI. EMC design guideline commonly suggests that the strip line structure rather than microstrip line structure should be used in PCB structure. The results in this study indicate that “SL” and “Shield” cases yield resonances with high level peaks, due to the feed cable. This study successfully provides a basic model to effectively predict EM radiation from a stripline structure.","PeriodicalId":440959,"journal":{"name":"2011 IEEE International Symposium on Electromagnetic Compatibility","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122297299","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Efficient design optimization of complex electromagnetic systems using parametric macromodeling techniques 使用参数化宏建模技术的复杂电磁系统的高效设计优化
2011 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2011-10-10 DOI: 10.1109/ISEMC.2011.6038301
F. Ferranti, G. Antonini, T. Dhaene, L. Knockaert, A. Scogna
{"title":"Efficient design optimization of complex electromagnetic systems using parametric macromodeling techniques","authors":"F. Ferranti, G. Antonini, T. Dhaene, L. Knockaert, A. Scogna","doi":"10.1109/ISEMC.2011.6038301","DOIUrl":"https://doi.org/10.1109/ISEMC.2011.6038301","url":null,"abstract":"We propose a new parametric macromodeling technique for complex electromagnetic systems described by scattering parameters, which are parameterized by multiple design variables such as layout or substrate feature. The proposed technique is based on an efficient and reliable combination of rational identification, a procedure to find scaling and frequency shifting system coefficients, and positive interpolation schemes. Parametric macromodels can be used for efficient and accurate design space exploration and optimization. A design optimization example for a complex electromagnetic system is used to validate the proposed parametric macromodeling technique in a practical design process flow.","PeriodicalId":440959,"journal":{"name":"2011 IEEE International Symposium on Electromagnetic Compatibility","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129856108","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Industrial environment characterization for future M2M applications 未来M2M应用的工业环境表征
2011 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2011-10-10 DOI: 10.1109/ISEMC.2011.6038447
Javier Ferrer Coll, P. Ängskog, J. Chilo, P. Stenumgaard
{"title":"Industrial environment characterization for future M2M applications","authors":"Javier Ferrer Coll, P. Ängskog, J. Chilo, P. Stenumgaard","doi":"10.1109/ISEMC.2011.6038447","DOIUrl":"https://doi.org/10.1109/ISEMC.2011.6038447","url":null,"abstract":"Combining electronics, telecommunications, and information technology to connect devices and remote systems is perhaps the best feature of the future Machine-to-Machine (M2M) technology. Wireless communication technologies for managing future M2M applications are becoming mature, but electromagnetic interference and time dispersion in industrial environments can limit the successful functioning of these wireless systems, leading to a failure in the control of critical functions. The characterization of these environments is necessary for collecting and specifying M2M requirements. In this paper, we present the conclusions from measurements carried out in four different industrial environments during the past three years.","PeriodicalId":440959,"journal":{"name":"2011 IEEE International Symposium on Electromagnetic Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129569918","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Impact of statistical parameter options on Reverberation Chamber test environment 统计参数选项对混响室测试环境的影响
2011 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 2011-10-10 DOI: 10.1109/ISEMC.2011.6038393
V. Rajamani, G. Freyer
{"title":"Impact of statistical parameter options on Reverberation Chamber test environment","authors":"V. Rajamani, G. Freyer","doi":"10.1109/ISEMC.2011.6038393","DOIUrl":"https://doi.org/10.1109/ISEMC.2011.6038393","url":null,"abstract":"Electromagnetic compatibility immunity tests help to assure that electronic equipment will function properly in its operational electromagnetic environment. Several techniques are available to perform Standards compliance testing. All available techniques yield uncertainties in the immunity test results. The statistical isotropy of the electromagnetic environment in a Reverberation Chamber implies similar magnitude fields in any arbitrary direction providing an all aspect angle test that reduces some uncertainties in immunity testing. This paper addresses Reverberation Chamber uncertainties introduced by choices for specific statistical parameters.","PeriodicalId":440959,"journal":{"name":"2011 IEEE International Symposium on Electromagnetic Compatibility","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114218153","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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