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Testing of 3G 1xEV-DV Stack - A Case Study 3G 1xEV-DV栈的测试——一个案例研究
International Conference on Testing (of Software and) Communication Systems Pub Date : 2003-05-26 DOI: 10.1007/3-540-44830-6_3
Ira Acharya, Hemendra Kumar Singh
{"title":"Testing of 3G 1xEV-DV Stack - A Case Study","authors":"Ira Acharya, Hemendra Kumar Singh","doi":"10.1007/3-540-44830-6_3","DOIUrl":"https://doi.org/10.1007/3-540-44830-6_3","url":null,"abstract":"","PeriodicalId":433439,"journal":{"name":"International Conference on Testing (of Software and) Communication Systems","volume":"110 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125568207","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Interoperability Testing Based on a Fault Model for a System of Communicating FSMs 基于故障模型的FSMs通信系统互操作性测试
International Conference on Testing (of Software and) Communication Systems Pub Date : 2003-05-26 DOI: 10.1007/3-540-44830-6_17
V. Trenkaev, Myung-Gyun Kim, Soonuk Seol
{"title":"Interoperability Testing Based on a Fault Model for a System of Communicating FSMs","authors":"V. Trenkaev, Myung-Gyun Kim, Soonuk Seol","doi":"10.1007/3-540-44830-6_17","DOIUrl":"https://doi.org/10.1007/3-540-44830-6_17","url":null,"abstract":"","PeriodicalId":433439,"journal":{"name":"International Conference on Testing (of Software and) Communication Systems","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121947117","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
UMTS Terminal Testing: A Practical Perspective UMTS终端测试:一个实用的视角
International Conference on Testing (of Software and) Communication Systems Pub Date : 2003-05-26 DOI: 10.1007/3-540-44830-6_2
O. Bergengruen
{"title":"UMTS Terminal Testing: A Practical Perspective","authors":"O. Bergengruen","doi":"10.1007/3-540-44830-6_2","DOIUrl":"https://doi.org/10.1007/3-540-44830-6_2","url":null,"abstract":"","PeriodicalId":433439,"journal":{"name":"International Conference on Testing (of Software and) Communication Systems","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132841432","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Testing Transition Systems with Input and Output Testers 用输入和输出测试仪测试过渡系统
International Conference on Testing (of Software and) Communication Systems Pub Date : 2003-05-26 DOI: 10.1007/3-540-44830-6_11
A. Petrenko, N. Yevtushenko, Jiale Huo
{"title":"Testing Transition Systems with Input and Output Testers","authors":"A. Petrenko, N. Yevtushenko, Jiale Huo","doi":"10.1007/3-540-44830-6_11","DOIUrl":"https://doi.org/10.1007/3-540-44830-6_11","url":null,"abstract":"","PeriodicalId":433439,"journal":{"name":"International Conference on Testing (of Software and) Communication Systems","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124645470","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 40
Towards Modeling and Testing of IP Routing Protocols IP路由协议建模与测试研究
International Conference on Testing (of Software and) Communication Systems Pub Date : 2003-05-26 DOI: 10.1007/3-540-44830-6_5
Jianping Wu, Zhongjie Li, Xia Yin
{"title":"Towards Modeling and Testing of IP Routing Protocols","authors":"Jianping Wu, Zhongjie Li, Xia Yin","doi":"10.1007/3-540-44830-6_5","DOIUrl":"https://doi.org/10.1007/3-540-44830-6_5","url":null,"abstract":"","PeriodicalId":433439,"journal":{"name":"International Conference on Testing (of Software and) Communication Systems","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122225822","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Conformance of Distributed Systems 分布式系统的一致性
International Conference on Testing (of Software and) Communication Systems Pub Date : 2003-05-26 DOI: 10.1007/3-540-44830-6_13
M. Frey, H. Schlingloff
{"title":"Conformance of Distributed Systems","authors":"M. Frey, H. Schlingloff","doi":"10.1007/3-540-44830-6_13","DOIUrl":"https://doi.org/10.1007/3-540-44830-6_13","url":null,"abstract":"","PeriodicalId":433439,"journal":{"name":"International Conference on Testing (of Software and) Communication Systems","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125826166","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Guided Method for Testing Timed Input Output Automata 一种定时输入输出自动机测试的指导方法
International Conference on Testing (of Software and) Communication Systems Pub Date : 2003-05-26 DOI: 10.1007/3-540-44830-6_16
A. En-Nouaary, R. Dssouli
{"title":"A Guided Method for Testing Timed Input Output Automata","authors":"A. En-Nouaary, R. Dssouli","doi":"10.1007/3-540-44830-6_16","DOIUrl":"https://doi.org/10.1007/3-540-44830-6_16","url":null,"abstract":"","PeriodicalId":433439,"journal":{"name":"International Conference on Testing (of Software and) Communication Systems","volume":"64 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132835042","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 38
An Automata-Based Approach to Property Testing in Event Traces 基于自动机的事件轨迹属性测试方法
International Conference on Testing (of Software and) Communication Systems Pub Date : 2003-05-26 DOI: 10.1007/3-540-44830-6_14
H. Hallal, S. Boroday, A. Ulrich, A. Petrenko
{"title":"An Automata-Based Approach to Property Testing in Event Traces","authors":"H. Hallal, S. Boroday, A. Ulrich, A. Petrenko","doi":"10.1007/3-540-44830-6_14","DOIUrl":"https://doi.org/10.1007/3-540-44830-6_14","url":null,"abstract":"","PeriodicalId":433439,"journal":{"name":"International Conference on Testing (of Software and) Communication Systems","volume":"2016 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114457973","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 20
TestNet: Let's Test Together! TestNet:让我们一起测试!
International Conference on Testing (of Software and) Communication Systems Pub Date : 2003-05-26 DOI: 10.1007/3-540-44830-6_19
A. Cavalli, Edgardo Montes de Oca, M. Núñez
{"title":"TestNet: Let's Test Together!","authors":"A. Cavalli, Edgardo Montes de Oca, M. Núñez","doi":"10.1007/3-540-44830-6_19","DOIUrl":"https://doi.org/10.1007/3-540-44830-6_19","url":null,"abstract":"","PeriodicalId":433439,"journal":{"name":"International Conference on Testing (of Software and) Communication Systems","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131320923","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The UML 2.0 Testing Profile and Its Relation to TTCN-3 UML 2.0测试概要及其与TTCN-3的关系
International Conference on Testing (of Software and) Communication Systems Pub Date : 2003-05-26 DOI: 10.1007/3-540-44830-6_7
I. Schieferdecker, Z. Dai, J. Grabowski, A. Rennoch
{"title":"The UML 2.0 Testing Profile and Its Relation to TTCN-3","authors":"I. Schieferdecker, Z. Dai, J. Grabowski, A. Rennoch","doi":"10.1007/3-540-44830-6_7","DOIUrl":"https://doi.org/10.1007/3-540-44830-6_7","url":null,"abstract":"","PeriodicalId":433439,"journal":{"name":"International Conference on Testing (of Software and) Communication Systems","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121595045","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 75
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