I. Schieferdecker, Z. Dai, J. Grabowski, A. Rennoch
{"title":"The UML 2.0 Testing Profile and Its Relation to TTCN-3","authors":"I. Schieferdecker, Z. Dai, J. Grabowski, A. Rennoch","doi":"10.1007/3-540-44830-6_7","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":433439,"journal":{"name":"International Conference on Testing (of Software and) Communication Systems","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"75","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Conference on Testing (of Software and) Communication Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/3-540-44830-6_7","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}