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International Conference on Testing (of Software and) Communication Systems最新文献

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Fast Testing of Critical Properties through Passive Testing 通过被动测试快速测试关键性能
International Conference on Testing (of Software and) Communication Systems Pub Date : 2003-05-26 DOI: 10.1007/3-540-44830-6_22
José Antonio Arnedo, A. Cavalli, M. Núñez
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引用次数: 42
Interoperabolity Events Complementing Conformance Testing Activities 互操作性事件补充一致性测试活动
International Conference on Testing (of Software and) Communication Systems Pub Date : 2003-05-26 DOI: 10.1007/3-540-44830-6_10
Philip R. Cousin
{"title":"Interoperabolity Events Complementing Conformance Testing Activities","authors":"Philip R. Cousin","doi":"10.1007/3-540-44830-6_10","DOIUrl":"https://doi.org/10.1007/3-540-44830-6_10","url":null,"abstract":"","PeriodicalId":433439,"journal":{"name":"International Conference on Testing (of Software and) Communication Systems","volume":"55 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130539028","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An Open Framework for Managed Regression Testing 管理回归测试的开放框架
International Conference on Testing (of Software and) Communication Systems Pub Date : 2003-05-26 DOI: 10.1007/3-540-44830-6_20
Naina Mittal, Ira Acharya
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引用次数: 3
Generating Checking Sequences for a Distributed Test Architecture 为分布式测试体系结构生成检查序列
International Conference on Testing (of Software and) Communication Systems Pub Date : 2003-05-26 DOI: 10.1007/3-540-44830-6_12
H. Ural, Craig Williams
{"title":"Generating Checking Sequences for a Distributed Test Architecture","authors":"H. Ural, Craig Williams","doi":"10.1007/3-540-44830-6_12","DOIUrl":"https://doi.org/10.1007/3-540-44830-6_12","url":null,"abstract":"","PeriodicalId":433439,"journal":{"name":"International Conference on Testing (of Software and) Communication Systems","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134218556","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
T911IMED TTCN-3 Based Graphical Real-Time Test Specification 基于TTCN-3的图形实时测试规范
International Conference on Testing (of Software and) Communication Systems Pub Date : 2003-05-26 DOI: 10.1007/3-540-44830-6_9
Z. Dai, J. Grabowski, Helmut Neukirchen
{"title":"T911IMED TTCN-3 Based Graphical Real-Time Test Specification","authors":"Z. Dai, J. Grabowski, Helmut Neukirchen","doi":"10.1007/3-540-44830-6_9","DOIUrl":"https://doi.org/10.1007/3-540-44830-6_9","url":null,"abstract":"","PeriodicalId":433439,"journal":{"name":"International Conference on Testing (of Software and) Communication Systems","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121293535","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Fault Diagnosis in Extended Finite State Machines 扩展有限状态机的故障诊断
International Conference on Testing (of Software and) Communication Systems Pub Date : 2003-05-26 DOI: 10.1007/3-540-44830-6_15
K. El-Fakih, S. Prokopenko, N. Yevtushenko, G. Bochmann
{"title":"Fault Diagnosis in Extended Finite State Machines","authors":"K. El-Fakih, S. Prokopenko, N. Yevtushenko, G. Bochmann","doi":"10.1007/3-540-44830-6_15","DOIUrl":"https://doi.org/10.1007/3-540-44830-6_15","url":null,"abstract":"","PeriodicalId":433439,"journal":{"name":"International Conference on Testing (of Software and) Communication Systems","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125212921","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 22
TUB-TCI An Architecture for Dynamic Deployment of Test Components TUB-TCI测试组件动态部署的体系结构
International Conference on Testing (of Software and) Communication Systems Pub Date : 2003-05-26 DOI: 10.1007/3-540-44830-6_21
M. Lepper, B. T. Widemann, Jacob Wieland
{"title":"TUB-TCI An Architecture for Dynamic Deployment of Test Components","authors":"M. Lepper, B. T. Widemann, Jacob Wieland","doi":"10.1007/3-540-44830-6_21","DOIUrl":"https://doi.org/10.1007/3-540-44830-6_21","url":null,"abstract":"","PeriodicalId":433439,"journal":{"name":"International Conference on Testing (of Software and) Communication Systems","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130471904","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Prediction = Power 预测=力量
International Conference on Testing (of Software and) Communication Systems Pub Date : 2003-05-26 DOI: 10.1007/3-540-44830-6_1
E. Weyuker
{"title":"Prediction = Power","authors":"E. Weyuker","doi":"10.1007/3-540-44830-6_1","DOIUrl":"https://doi.org/10.1007/3-540-44830-6_1","url":null,"abstract":"","PeriodicalId":433439,"journal":{"name":"International Conference on Testing (of Software and) Communication Systems","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127440183","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Testing SIP Call Flows Using XML Protocol Templates 使用XML协议模板测试SIP呼叫流
International Conference on Testing (of Software and) Communication Systems Pub Date : 2003-05-26 DOI: 10.1007/3-540-44830-6_4
M. Ranganathan, Olivier Deruelle, D. Montgomery
{"title":"Testing SIP Call Flows Using XML Protocol Templates","authors":"M. Ranganathan, Olivier Deruelle, D. Montgomery","doi":"10.1007/3-540-44830-6_4","DOIUrl":"https://doi.org/10.1007/3-540-44830-6_4","url":null,"abstract":"","PeriodicalId":433439,"journal":{"name":"International Conference on Testing (of Software and) Communication Systems","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115403923","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
An Intuitive TTCN-3 Data Presentation Format 直观的TTCN-3数据表示格式
International Conference on Testing (of Software and) Communication Systems Pub Date : 2003-05-26 DOI: 10.1007/3-540-44830-6_6
Roland Gecse, Sarolta Dibuz
{"title":"An Intuitive TTCN-3 Data Presentation Format","authors":"Roland Gecse, Sarolta Dibuz","doi":"10.1007/3-540-44830-6_6","DOIUrl":"https://doi.org/10.1007/3-540-44830-6_6","url":null,"abstract":"","PeriodicalId":433439,"journal":{"name":"International Conference on Testing (of Software and) Communication Systems","volume":"120 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124741704","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
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