NCSL International Workshop & Symposium Conference Proceedings 2017最新文献_第5页

Balancing Cost Savings And ISO/IEC 17025 平衡成本节约和ISO/IEC 17025

NCSL International Workshop & Symposium Conference Proceedings 2017 Pub Date : 1900-01-01 DOI: 10.51843/wsproceedings.2017.24

G. Bennett

引用次数: 0

A Framework for Training Classes for Dimensional Measurement Incorporating 3D Printing Artifacts 包含3D打印工件的尺寸测量培训课程框架

NCSL International Workshop & Symposium Conference Proceedings 2017 Pub Date : 1900-01-01 DOI: 10.51843/wsproceedings.2017.01

J. Fuehne

{"title":"A Framework for Training Classes for Dimensional Measurement Incorporating 3D Printing Artifacts","authors":"J. Fuehne","doi":"10.51843/wsproceedings.2017.01","DOIUrl":"https://doi.org/10.51843/wsproceedings.2017.01","url":null,"abstract":"A partnership between industry and academia has led to developing a framework for a series of training courses for various industrial employees who have different needs and requirements based on their job function. Purdue Polytechnic Columbus is working with local employer Cummins Inc. to define several training classes that would take place at the university campus in Columbus using the environmentally-controlled metrology lab at the facility. Training classes will be outlined for new employees who have no prior experience with metrology, current employees with some metrology experience who may need to update their skills or acquire new skills in a different area, degreed engineers who likely have little metrology experience but need some metrology knowledge to better function in their jobs, and managers who might need an overview of metrology and its key role in the manufacturing environment. These training sessions will necessarily vary in length and time based on the target audience and the depth of knowledge required. The objective is to do as little lecturing as possible and focus the learning on hands-on, learn-by-doing activities. This would include using hand tools, optical measurement tools and various machines that might include surface finish testers, coordinate measuring machines, roundness testers, and torque calibration instruments. A primary aspect of the classes will be measurement artifacts manufactured using 3D printers that would allow the creation of parts with flaws and imperfections that highlight the measurement process and the value in being diligent and aware when performing measurements.","PeriodicalId":432978,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2017","volume":" 26","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120830835","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Vision, Progress and Discussion: A Measurement Information Infrastructure 愿景、进展与讨论:测量信息基础设施

NCSL International Workshop & Symposium Conference Proceedings 2017 Pub Date : 1900-01-01 DOI: 10.51843/wsproceedings.2017.13

M. Kuster

{"title":"Vision, Progress and Discussion: A Measurement Information Infrastructure","authors":"M. Kuster","doi":"10.51843/wsproceedings.2017.13","DOIUrl":"https://doi.org/10.51843/wsproceedings.2017.13","url":null,"abstract":"What if your organization’s measurement, analysis and management computing systems spoke a shared language with other world-wide measurement-related systems? How would that affect your business? How would it ease your compliance challenges for ISO/IEC 17025 and other quality and technical documents? Imagine a set of normative standards that define data structures, taxonomies, service protocols and security for locating, communicating and sharing measurement information. Those standards comprise what we call a measurement information infrastructure, or MII. Imagine MII-aware software that would create and automatically exchange and use accreditation scopes, instrument specifications and test &calibration certificates. This open discussion panel session follows up on the \"Toward a Measurement Information Infrastructure\" NCSLI Metrologist column to highlight how you may participate in the real-world benefits such an MII will generate and the efforts underway to realize them. The session will also demonstrate some MII-aware software under development and provide panelists to answer questions and solicit input and discussion from the audience.","PeriodicalId":432978,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2017","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128390217","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Early Career Professionals and Career 早期职业专业人士和职业

NCSL International Workshop & Symposium Conference Proceedings 2017 Pub Date : 1900-01-01 DOI: 10.51843/wsproceedings.2017.11

Matthew Aloisio, Jennifer Fleenor, Travis Grossman, Leah Lindstrom, Cody Luke

引用次数: 0

Best Lessons Learned from FDA Warning Letters 从FDA警告信中学到的最好的教训

NCSL International Workshop & Symposium Conference Proceedings 2017 Pub Date : 1900-01-01 DOI: 10.51843/wsproceedings.2017.42

Walter Nowocin

引用次数: 0

Using Analytics to Optimize M&TE Inventory - a Case Study 使用分析优化M&TE库存-一个案例研究

NCSL International Workshop & Symposium Conference Proceedings 2017 Pub Date : 1900-01-01 DOI: 10.51843/wsproceedings.2017.10

Dean S. Williams