{"title":"愿景、进展与讨论:测量信息基础设施","authors":"M. Kuster","doi":"10.51843/wsproceedings.2017.13","DOIUrl":null,"url":null,"abstract":"What if your organization’s measurement, analysis and management computing systems spoke a shared language with other world-wide measurement-related systems? How would that affect your business? How would it ease your compliance challenges for ISO/IEC 17025 and other quality and technical documents? Imagine a set of normative standards that define data structures, taxonomies, service protocols and security for locating, communicating and sharing measurement information. Those standards comprise what we call a measurement information infrastructure, or MII. Imagine MII-aware software that would create and automatically exchange and use accreditation scopes, instrument specifications and test &calibration certificates. This open discussion panel session follows up on the \"Toward a Measurement Information Infrastructure\" NCSLI Metrologist column to highlight how you may participate in the real-world benefits such an MII will generate and the efforts underway to realize them. The session will also demonstrate some MII-aware software under development and provide panelists to answer questions and solicit input and discussion from the audience.","PeriodicalId":432978,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2017","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Vision, Progress and Discussion: A Measurement Information Infrastructure\",\"authors\":\"M. Kuster\",\"doi\":\"10.51843/wsproceedings.2017.13\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"What if your organization’s measurement, analysis and management computing systems spoke a shared language with other world-wide measurement-related systems? How would that affect your business? How would it ease your compliance challenges for ISO/IEC 17025 and other quality and technical documents? Imagine a set of normative standards that define data structures, taxonomies, service protocols and security for locating, communicating and sharing measurement information. Those standards comprise what we call a measurement information infrastructure, or MII. Imagine MII-aware software that would create and automatically exchange and use accreditation scopes, instrument specifications and test &calibration certificates. This open discussion panel session follows up on the \\\"Toward a Measurement Information Infrastructure\\\" NCSLI Metrologist column to highlight how you may participate in the real-world benefits such an MII will generate and the efforts underway to realize them. The session will also demonstrate some MII-aware software under development and provide panelists to answer questions and solicit input and discussion from the audience.\",\"PeriodicalId\":432978,\"journal\":{\"name\":\"NCSL International Workshop & Symposium Conference Proceedings 2017\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"NCSL International Workshop & Symposium Conference Proceedings 2017\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.51843/wsproceedings.2017.13\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"NCSL International Workshop & Symposium Conference Proceedings 2017","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.51843/wsproceedings.2017.13","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Vision, Progress and Discussion: A Measurement Information Infrastructure
What if your organization’s measurement, analysis and management computing systems spoke a shared language with other world-wide measurement-related systems? How would that affect your business? How would it ease your compliance challenges for ISO/IEC 17025 and other quality and technical documents? Imagine a set of normative standards that define data structures, taxonomies, service protocols and security for locating, communicating and sharing measurement information. Those standards comprise what we call a measurement information infrastructure, or MII. Imagine MII-aware software that would create and automatically exchange and use accreditation scopes, instrument specifications and test &calibration certificates. This open discussion panel session follows up on the "Toward a Measurement Information Infrastructure" NCSLI Metrologist column to highlight how you may participate in the real-world benefits such an MII will generate and the efforts underway to realize them. The session will also demonstrate some MII-aware software under development and provide panelists to answer questions and solicit input and discussion from the audience.