Photonics West - Optoelectronic Materials and Devices最新文献_第3页

Solar cell enhancement using metallic nanoparticles embedded in titanium dioxide 利用金属纳米颗粒嵌入二氧化钛增强太阳能电池

Photonics West - Optoelectronic Materials and Devices Pub Date : 2015-04-10 DOI: 10.1117/12.2080077

Max A. Burnett, K. Allen, M. Fiddy

引用次数: 0

The area of applicability of apparatus for analyzing the spectral characteristics of reflection, albedo and color parameters of flat objects 分析平面物体反射光谱特征、反照率和颜色参数的仪器的适用范围

Photonics West - Optoelectronic Materials and Devices Pub Date : 2015-04-06 DOI: 10.1117/12.2081568

E. Gorbunova, A. Chertov, V. Peretyagin, E. A. Lastovskaia, V. Korotaev

{"title":"The area of applicability of apparatus for analyzing the spectral characteristics of reflection, albedo and color parameters of flat objects","authors":"E. Gorbunova, A. Chertov, V. Peretyagin, E. A. Lastovskaia, V. Korotaev","doi":"10.1117/12.2081568","DOIUrl":"https://doi.org/10.1117/12.2081568","url":null,"abstract":"Quality control of different coatings (colorful, paint, marker, safety, etc.) that are applied to the surface of various objects (both metallic and non-metallic) is an important problem. Also, there is a problem of dealing with counterfeit products. So it’s necessary to distinguish the fake replicas of marking from the authentic marking of producer. To solve these problems, we propose an automated apparatus for analysis and control of spectral reflection characteristics, albedo and color parameters of extended (up to 150 mm × 150 mm) flat objects. It allows constructing the color image of the object surface as well as its multispectral images in different regions of the spectrum. Herewith the color of the object surface can be calculated for various standard light sources (A, B, C, D65, E, F2, F7, F11, GE), or to any light source with a predetermined emission spectrum. The paper presents the description of working principles of the proposed apparatus as well as the results of reflection and multispectral analysis of different flat objects.","PeriodicalId":432115,"journal":{"name":"Photonics West - Optoelectronic Materials and Devices","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127260559","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

Hartmannometer versus Fizeau Interferometer: advantages and drawbacks 哈特曼干涉仪与菲索干涉仪:优缺点

Photonics West - Optoelectronic Materials and Devices Pub Date : 2015-04-06 DOI: 10.1117/12.2085263

A. Nikitin, J. Sheldakova, A. Kudryashov, D. Denisov, V. Karasik, A. Sakharov

引用次数: 17

Investigation of opportunities of the optical non-invasive diagnostics method for the blood sugar control 光学无创诊断法用于血糖控制的机会探讨

Photonics West - Optoelectronic Materials and Devices Pub Date : 2015-04-06 DOI: 10.1117/12.2081651

E. A. Lastovskaia, E. Gorbunova, A. Chertov, V. Korotaev

引用次数: 1

Silicon photonic devices based on SOI/bulk-silicon platforms for chip-level optical interconnects 基于SOI/大块硅平台的芯片级光互连硅光子器件

Photonics West - Optoelectronic Materials and Devices Pub Date : 2015-04-03 DOI: 10.1117/12.2078493

Gyungock Kim, I. Kim, Sanghoon Kim, Jiho Joo, Ki-seok Jang, Sun Ae Kim, J. Oh, Jeong Woo Park, Myung-Joon Kwack, Jaegyu Park, Hyundai Park, Gun Sik Park, Sanggi Kim

引用次数: 5

Equilibrium modal power distribution measurement of step-index hard plastic cladding and graded-index silica multimode fibers 阶跃折射率硬塑料包层和梯度折射率二氧化硅多模光纤的平衡模态功率分布测量

Photonics West - Optoelectronic Materials and Devices Pub Date : 2015-04-03 DOI: 10.1117/12.2079355

Ruichen Tao, Takehiro Hayashi, M. Kagami, S. Kobayashi, Manabu Yasukawa, Hui Yang, D. Robinson, H. Baghsiahi, F. Fernández, David R. Selviah

{"title":"Equilibrium modal power distribution measurement of step-index hard plastic cladding and graded-index silica multimode fibers","authors":"Ruichen Tao, Takehiro Hayashi, M. Kagami, S. Kobayashi, Manabu Yasukawa, Hui Yang, D. Robinson, H. Baghsiahi, F. Fernández, David R. Selviah","doi":"10.1117/12.2079355","DOIUrl":"https://doi.org/10.1117/12.2079355","url":null,"abstract":"A stable reproducible optical standard source for measuring multimode optical fiber attenuation is required as recent round robin measurements of such fibers at several international companies and national standards organizations showed significant variation when using a source having only the encircled flux in the near field emerging from it defined. The paper presents and compares the far field modal power distributions for (i) 2 km and 3 km step-index multimode Hard Plastic Cladding Fibers, HPCF, (SI-MMF) with 200 μm silica core diameter, 0.37 numerical aperture (NA) and polymer cladding, (ii) a 10 m silica graded-index multimode fiber (GI-MMF) with 50 μm core diameter and 0.2 NA, and (ii) a near field Encircled Flux Mode Convertor or “modcon”. A free space method for measuring the far field using a Lightemitting diode (LED) centered at 850 nm wavelength with 40 nm 10 dB-bandwidth and a charge-coupled device (CCD) camera is compared with a f-theta multi-element lens based far field pattern (FFP) system. Mandrels of different diameter and different numbers of turns of the fiber around them were used to achieve an equilibrium mode distribution (EMD) for the GI-MMF. The paper defines encircled angular flux (EAF) as the fraction of the total optical power radiating from a multimode optical fiber core within a certain solid angle in the far field. The paper calculates the EAF when the solid angle increases from the far field centroid.","PeriodicalId":432115,"journal":{"name":"Photonics West - Optoelectronic Materials and Devices","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-04-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124878761","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 7

Optical coupling structure made by imprinting between single-mode polymer waveguide and embedded VCSEL 单模聚合物波导与嵌入式VCSEL的压印光学耦合结构

Photonics West - Optoelectronic Materials and Devices Pub Date : 2015-04-03 DOI: 10.1117/12.2082935

M. Karppinen, N. Salminen, T. Korhonen, T. Alajoki, Jarno Petäjä, E. Bosman, G. Van Steenberge, J. Justice, U. Khan, B. Corbett, A. Boersma

{"title":"Optical coupling structure made by imprinting between single-mode polymer waveguide and embedded VCSEL","authors":"M. Karppinen, N. Salminen, T. Korhonen, T. Alajoki, Jarno Petäjä, E. Bosman, G. Van Steenberge, J. Justice, U. Khan, B. Corbett, A. Boersma","doi":"10.1117/12.2082935","DOIUrl":"https://doi.org/10.1117/12.2082935","url":null,"abstract":"Polymer-based integrated optics is attractive for inter-chip optical interconnection applications, for instance, for coupling photonic devices to fibers in high density packaging. In such a hybrid integration scheme, a key challenge is to achieve efficient optical coupling between the photonic chips and waveguides. With the single-mode polymer waveguides, the alignment tolerances become especially critical as compared to the typical accuracies of the patterning processes. We study novel techniques for such coupling requirements. In this paper, we present a waveguide-embedded micro-mirror structure, which can be aligned with high precision, even active alignment method is possible. The structure enables 90 degree bend coupling between a single-mode waveguide and a vertical-emitting/detecting chip, such as, a VCSEL or photodiode, which is embedded under the waveguide layer. Both the mirror structure and low-loss polymer waveguides are fabricated in a process based mainly on the direct-pattern UV nanoimprinting technology and on the use of UVcurable polymeric materials. Fabrication results of the coupling structure with waveguides are presented, and the critical alignment tolerances and manufacturability issues are discussed.","PeriodicalId":432115,"journal":{"name":"Photonics West - Optoelectronic Materials and Devices","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-04-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121970893","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 4

Theoretical and empirical qualification of a mechanical-optical interface for parallel optics links 平行光学链路机械-光学接口的理论和经验定性

Photonics West - Optoelectronic Materials and Devices Pub Date : 2015-04-03 DOI: 10.1117/12.2077615

S. Chuang, D. Schoellner, A. Ugolini, J. Wakjira, G. Wolf, P. Gandhi, A. Persaud

{"title":"Theoretical and empirical qualification of a mechanical-optical interface for parallel optics links","authors":"S. Chuang, D. Schoellner, A. Ugolini, J. Wakjira, G. Wolf, P. Gandhi, A. Persaud","doi":"10.1117/12.2077615","DOIUrl":"https://doi.org/10.1117/12.2077615","url":null,"abstract":"As the implementation of parallel optics continues to evolve, development of a universal coupling interface between VCSEL/PD arrays and the corresponding photonic turn connector is necessary. A newly developed monolithic mechanical-optical interface efficiently couples optical transmit/receive arrays to the accompanying fiber optic connector. This paper describes the optical model behind the coupling interface and validates the model using empirical measurements. Optical modeling will address how the interface is adaptable to the broad range of VCSEL/PD optical parameters from commercially available VCSEL hardware manufacturers; the optical model will illustrate coupling efficiencies versus launch specifications. Theoretical modeling will examine system sensitivity through Monte Carlo simulations and provide alignment tolerance requirements. Empirical results will be presented to validate the optical model predictions and subsequent system performance. Functionality will be demonstrated through optical loss and coupling efficiency measurements. System metrics will include characterizations such as eye diagram results and link loss measurements.","PeriodicalId":432115,"journal":{"name":"Photonics West - Optoelectronic Materials and Devices","volume":"2017 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-04-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127550277","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

Polymeric demultiplexer component for wavelength division multiplex communication systems using polymer fibers 用于使用聚合物光纤的波分复用通信系统的聚合物解复用器组件

Photonics West - Optoelectronic Materials and Devices Pub Date : 2015-04-03 DOI: 10.1117/12.2077471

U. Fischer, S. Höll, M. Haupt, M. Joncic

引用次数: 2

International standardisation of optical circuit board measurement and fabrication procedures 光学电路板测量和制造程序的国际标准化

Photonics West - Optoelectronic Materials and Devices Pub Date : 2015-04-03 DOI: 10.1117/12.2077654

R. Pitwon, Kai Wang, M. Immonen, Jinhua Wu, L. Zhu, H. Yan, A. Worrall

{"title":"International standardisation of optical circuit board measurement and fabrication procedures","authors":"R. Pitwon, Kai Wang, M. Immonen, Jinhua Wu, L. Zhu, H. Yan, A. Worrall","doi":"10.1117/12.2077654","DOIUrl":"https://doi.org/10.1117/12.2077654","url":null,"abstract":"Widespread adoption of optical circuit boards will herald substantial performance, environmental and cost benefits for the data communications industry. Though optical circuit board technology has advanced considerably over the past decade, commercial maturity will be gated by the availability of conformity standards to forge future quality assurance procedures. One important prerequisite to this is a reliable test and measurement definition system, which is agnostic to the type of waveguide system under test and therefore can be applied to different optical circuit board technologies as well as being adaptable to future variants. A serious and common problem with the measurement of optical waveguide systems has been lack of proper definition of the measurement conditions for a given test regime, and consequently strong inconsistencies ensue in the results of measurements by different parties on the same test sample. We report on the development of a new measurement identification standard to force testers to capture sufficient information about the measurement conditions for a given optical circuit board such as to ensure consistency of measurement results within an acceptable margin. Furthermore we demonstrate how the application of the measurement identification system can bring about a dramatic improvement in results consistency, by comparative evaluation of the results on multimode polymer waveguide based optical circuit test boards from a large selection of testing organisations.","PeriodicalId":432115,"journal":{"name":"Photonics West - Optoelectronic Materials and Devices","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-04-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116263953","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 5