{"title":"US smart grid interoperability panel (SGIP 2.0) and its testing and certification committee","authors":"D. Heirman","doi":"10.1109/ISEMC.2017.8078034","DOIUrl":"https://doi.org/10.1109/ISEMC.2017.8078034","url":null,"abstract":"This article consists of a collection of slides from the author's conference presentation.","PeriodicalId":426924,"journal":{"name":"2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)","volume":"7 4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115467386","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Immunity for power station and substation environments","authors":"W. Radasky","doi":"10.1109/ISEMC.2017.8078032","DOIUrl":"https://doi.org/10.1109/ISEMC.2017.8078032","url":null,"abstract":"","PeriodicalId":426924,"journal":{"name":"2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127051194","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Frequency-offset method to determine conversion coefficient of extremely low-frequency magnetic field detector","authors":"Junghwan Hwang, Jong Hwa Kwon, Hyung-Do Choi","doi":"10.1109/ISEMC.2017.8077832","DOIUrl":"https://doi.org/10.1109/ISEMC.2017.8077832","url":null,"abstract":"This paper proposes a frequency-offset method to determine a conversion coefficient of an extremely low-frequency magnetic field (ELF-MF) detector to measure the strength of a power-line magnetic field, which is caused by electricity operating at 60 or 50 Hz. Using the frequency-offset method, the conversion coefficient can be determined in spite of interference caused by ambient noise. The frequency-offset method in this paper can be effectively used to develop an ELF-MF detector in a ambient noise environment.","PeriodicalId":426924,"journal":{"name":"2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124916821","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Homogenization modeling of periodic magnetic composite structures","authors":"Zubiao Xiong, Zhong Chen","doi":"10.1109/ISEMC.2017.8077910","DOIUrl":"https://doi.org/10.1109/ISEMC.2017.8077910","url":null,"abstract":"Conventional closed-form homogenizing rules may be not accurate if the contrast of material properties is high, such as the case of ferrite tiles with gaps used in EMC anechoic chambers. A new homogenization method is proposed to handle such extreme cases. It uses the field solution of a single unit cell illuminated by a plane wave incident in the normal direction. By doing this, the physical interactions between adjacent inclusions can be taken into account. Numerical results demonstrate the superiority of the proposed method over conventional closed-form homogenizing rules.","PeriodicalId":426924,"journal":{"name":"2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)","volume":"86 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125023875","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Li Guan, Giorgi Maghlakelidze, Xin Yan, Satyajeet Shinde, D. Pommerenke
{"title":"Optimizing measurement SNR for weak near-field scanning applications","authors":"Li Guan, Giorgi Maghlakelidze, Xin Yan, Satyajeet Shinde, D. Pommerenke","doi":"10.1109/ISEMC.2017.8077955","DOIUrl":"https://doi.org/10.1109/ISEMC.2017.8077955","url":null,"abstract":"Conventional near-field scanning techniques often employ a general setup such as: broadband near-field probe output connected to a chain of amplifiers through a coaxial cable to a spectrum analyzer. In this paper, we investigated how the signal to noise ratio is influenced by the coaxial connection between the probe output and the first amplifier, types of probes, cooling the probes with liquid nitrogen and the amplifier's noise figure. Eliminating cabling between probe and first amplifier, and using a low noise amplifiers helped increase signal-to-noise ratio by ~10dB. Further, liquid nitrogen is used to cool down a tunable resonant probe. This increases quality factor of the resonance and improves sensitivity. Thus, SNR is further improved by 10-12dB compared to a similar broadband setup.","PeriodicalId":426924,"journal":{"name":"2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125188249","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Subgrid-based equivalent circuit for transient thermal analysis using latency insertion method","authors":"A. H. Ngo, T. Sekine, H. Asai","doi":"10.1109/ISEMC.2017.8077969","DOIUrl":"https://doi.org/10.1109/ISEMC.2017.8077969","url":null,"abstract":"In this paper, a subgrid scheme for the thermal equivalent circuit is proposed and combined with a latency insertion method to solve thermal problems in the time domain. Moreover, the feasible prospect of implementing the circuit-based method for the electrical-thermal co-simulation is also mentioned. Even though these problems can be analyzed by using the equivalent circuit, simulated objects often turn into a large-scale network which immensely increases computational cost. The subgrid-based equivalent circuit can reduce the total number of variables while retaining simulation accuracy by modeling the computational object with a coarse grid for its most parts, and a fine grid for small structure details. To evaluate the accuracy and efficiency of the proposed method, a thermal problem is simulated by using a standard uniform fine grid, the subgrid scheme, and a commercial simulator. The simulated results show a great improvement in computational time and excellent correlation with uniform fine grid's results.","PeriodicalId":426924,"journal":{"name":"2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125537967","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. Patnaik, M. Suchak, R. Seva, K. Pamidimukkala, D. Pommerenke, G. Edgington, R. Moseley, J. Feddeler, M. Stockinger, D. Beetner
{"title":"An on-chip detector of transient stress events","authors":"A. Patnaik, M. Suchak, R. Seva, K. Pamidimukkala, D. Pommerenke, G. Edgington, R. Moseley, J. Feddeler, M. Stockinger, D. Beetner","doi":"10.1109/ISEMC.2017.8077857","DOIUrl":"https://doi.org/10.1109/ISEMC.2017.8077857","url":null,"abstract":"Testing and debugging of electrostatic discharge (ESD) or electrical fast transient (EFT) issues in modern electronic systems can be challenging. The following paper describes the design of an on-chip circuit which detects and stores the occurrence of a fast transient stress event at the ESD protection structures in an I/O pad. Measurements and simulations of a test circuit in 90 nm technology show it can accurately detect and record the presence of a transient stress event with a peak current as low as 0.9 A or duration as short as 1 ns and that the detector works well across typical temperature and process variations. The small size of the detector will allow it to be used effectively even in low-cost commercial ICs.","PeriodicalId":426924,"journal":{"name":"2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116189315","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Required bandwidth for time-domain measurement of the quality factor of reverberation chambers","authors":"Neda Nourshamsi, J. West, C. Bunting","doi":"10.1109/ISEMC.2017.8077918","DOIUrl":"https://doi.org/10.1109/ISEMC.2017.8077918","url":null,"abstract":"The dependence of the quality factor (Q) of a reverberation chamber as measured using a time-domain approach on the total bandwidth included in the time-domain signal has been investigated. Time-domain measurement of the Q factor of a mechanically stirred, metal cavity has been been performed using synthesized pulses of different bandwidth with the cavity both loaded and unloaded by absorbing material. The results show that the bandwidth does not need to be sufficiently large to give an equivalent pulse duration that is shorter than the wall scattering time to give an accurate measurement of the quality factor.","PeriodicalId":426924,"journal":{"name":"2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)","volume":"66 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122428553","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Novel design with minimized far-end crosstalk on single-ended striplines","authors":"Hank Lin, B. Tseng, Jackson Yen","doi":"10.1109/ISEMC.2017.8077877","DOIUrl":"https://doi.org/10.1109/ISEMC.2017.8077877","url":null,"abstract":"As technology advances, the demand for slim size and higher performance consumer electronics also increases drastically. Stripline is one of the layout designs that is becoming more and more popular on account of the fact that its homogenous characteristics could effectively decrease the interference from both the environmental and material factors. However, far-end crosstalk (FEXT) still exists due to inhomogeneous dielectric environment in realistic board designs. In this paper, a novel layout design for single-ended stripline that could achieve minimized FEXT is proposed. The design aims at cancelling out the FEXT term by having two opposite polarities applied voltages that have the same magnitude. This method is achieved by placing the victim single-ended stripline in between two pairs of differential striplines. In particular, the closest two traces to the victim single-ended stripline are one of positive trace from one differential pair and one of negative trace from the other differential pair.","PeriodicalId":426924,"journal":{"name":"2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)","volume":"671 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122542580","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The importance of EMC standards in product design","authors":"","doi":"10.1109/ISEMC.2017.8078102","DOIUrl":"https://doi.org/10.1109/ISEMC.2017.8078102","url":null,"abstract":"This article consists of a collection of slides from the author's conference presentation.","PeriodicalId":426924,"journal":{"name":"2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114188495","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}