2015 16th International Conference on Electronic Packaging Technology (ICEPT)最新文献

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A new method for reducing warpage due to reflow in IGBT module 提出了一种减少IGBT模块回流翘曲的新方法
2015 16th International Conference on Electronic Packaging Technology (ICEPT) Pub Date : 2015-09-03 DOI: 10.1109/ICEPT.2015.7236816
Yang Zhou, Ling Xu, Miaocao Wang, Z. Qian, Sheng Liu
{"title":"A new method for reducing warpage due to reflow in IGBT module","authors":"Yang Zhou, Ling Xu, Miaocao Wang, Z. Qian, Sheng Liu","doi":"10.1109/ICEPT.2015.7236816","DOIUrl":"https://doi.org/10.1109/ICEPT.2015.7236816","url":null,"abstract":"Warpage in Insulated Gate Bipolar Transistor (IGBT) module is induced by the unavoidable mismatch of materials and asymmetric structure in almost every packaging process. The high level of warpage and thermal stress is introduced during reflow processes, which can impact the IGBT reliability. Pre-warping substrate method has been used as industry practice for reducing warpage due to reflow. The method still faces challenges of low cost and process simplification. With the development of copper bonding technique, IBP (Integrate base plate) was recently developed for reducing the warpage. However, the method is not cost-effective. In this paper, a low-cost and simple method of embedding DBC plates into copper substrate has been proposed as alternative solution for the warpage reduction. A 1200V IGBT module prototype was selected for benchmarking the warpage reduction methods. Finite element method with viscoplastic solder model and large deformation theory was used to investigate the solder reflow process. Anand constitutive model available in FEM tools for modeling the viscoplastic behaviors of solder materials was used for SAC305 solder layers. The whole reflow process was simulated by advanced element “death and activation” technique. Three package assembly methods for reducing warpage were investigated by advanced finite element analyses. The FEA result shows that the proposed new method can effectively reduce the warpage of IGBT module to industry-acceptable level.","PeriodicalId":415934,"journal":{"name":"2015 16th International Conference on Electronic Packaging Technology (ICEPT)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115319220","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
The effects of Au film thickness on the reliability of Sn-Pb solder joints Au膜厚度对Sn-Pb焊点可靠性的影响
2015 16th International Conference on Electronic Packaging Technology (ICEPT) Pub Date : 2015-09-03 DOI: 10.1109/ICEPT.2015.7236822
Xiaorui Lv, P. Lin, Yingzhuo Huang, X. Jiang, B. Lian, Quanbin Yao
{"title":"The effects of Au film thickness on the reliability of Sn-Pb solder joints","authors":"Xiaorui Lv, P. Lin, Yingzhuo Huang, X. Jiang, B. Lian, Quanbin Yao","doi":"10.1109/ICEPT.2015.7236822","DOIUrl":"https://doi.org/10.1109/ICEPT.2015.7236822","url":null,"abstract":"Ceramic ball grid array (CBGA) modules are high density, high-performance surface mount (SMT) packages. With miniaturization of solder joints in electronic packaging, the intermetallic compound (IMC) which formed at the interface between the solder ball and under bump metallization (UBM) have considerable effects on the reliability of solder joints. In this paper, the effects of Au film thickness on the growth of IMC were studied, including with the type, the composition and the thickness of IMC. And the mechanical properties of IMC were studied using ball shear tests and ball pull tests. Based on the growth of IMC under different aging time, the effects of IMC on Board-Level reliability of solder joints under thermal store load conditions were researched. Finally, the effects of IMC thickness on the thermal fatigue reliability of solder joints under thermal cycling load were analyzed by the electric on-off tests of the daisy chain. The result demonstrate that, the thickness of IMC increase rapidly due to the augment of Au film thickness, which might lead to “black pad” and the strength of solder joints reduce radically, as while as the shorten of the fatigue life.","PeriodicalId":415934,"journal":{"name":"2015 16th International Conference on Electronic Packaging Technology (ICEPT)","volume":"202 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123040382","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Spot welding process research of fine pitch micro-rectangular connectors based on pu enameled wire 基于pu漆包线的细间距微矩形连接器点焊工艺研究
2015 16th International Conference on Electronic Packaging Technology (ICEPT) Pub Date : 2015-09-03 DOI: 10.1109/ICEPT.2015.7236567
Xiaole Kuang, Haibing Zhang, Wei Zhu, Xiaobai Xie
{"title":"Spot welding process research of fine pitch micro-rectangular connectors based on pu enameled wire","authors":"Xiaole Kuang, Haibing Zhang, Wei Zhu, Xiaobai Xie","doi":"10.1109/ICEPT.2015.7236567","DOIUrl":"https://doi.org/10.1109/ICEPT.2015.7236567","url":null,"abstract":"With the T/R module is developing to small, lightweight, high performance and high reliability, fine pitch micro-rectangular connector has been widely used, welding between fine pitch micro-rectangular connector and transmission line becomes a difficulty. This paper describes a spot welding process for fine pitch micro-rectangular connector based on pu enameled wire, the orthogonal design was used to analyze the impact of the welding current, welding time, current rise rate and pressure to the tension of spot welding, the statistical empirical model of spot welding process based on test results was verified by experiments, to guide the spot welding process of fine pitch micro-rectangular connectors based on pu enameled wire, then improve spot welding reliability, yield and efficiency, reduce welding difficult.","PeriodicalId":415934,"journal":{"name":"2015 16th International Conference on Electronic Packaging Technology (ICEPT)","volume":"59 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114642879","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Effect of viscoelastic behavior of EMC on predicting QFN fatigue life 电磁兼容粘弹性特性对QFN疲劳寿命预测的影响
2015 16th International Conference on Electronic Packaging Technology (ICEPT) Pub Date : 2015-09-03 DOI: 10.1109/ICEPT.2015.7236804
Shen Hui-qiang, Q. Fei, Wu Wei, Xia Guofeng
{"title":"Effect of viscoelastic behavior of EMC on predicting QFN fatigue life","authors":"Shen Hui-qiang, Q. Fei, Wu Wei, Xia Guofeng","doi":"10.1109/ICEPT.2015.7236804","DOIUrl":"https://doi.org/10.1109/ICEPT.2015.7236804","url":null,"abstract":"Epoxy molding compounds (EMCs) are widely used in encapsulation of various semiconductor devices. QFN package has been widely accepted in electronic packaging industry in recent years due to due to its smaller dimension, excellent thermal and electrical performance. In this study, the tensile tests based on Dynamic Mechanical Analyzer (DMA) experiment are employed to investigate the viscoelastic behavior a commercial EMC material. FEM is used to analyze the effect of EMC viscoelasticity by EMC constant elastic and viscoelastic model based on generalized Maxwell model and WLF equation. The results show the difference of von Mises stress for EMC elastic and viscoelastic material models is not obvious while equivalent plastic strain reveals very significant difference. The predicted fatigue life of QFN package is underestimated about 45% if EMC is assumed to be elastic instead of viscoelastic. It is necessary to perform viscoelastic analysis during the prediction of fatigue life.","PeriodicalId":415934,"journal":{"name":"2015 16th International Conference on Electronic Packaging Technology (ICEPT)","volume":"120 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120963229","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Fast single mode microwave-assisted synthesis of porous carbon aerogel for supercapacitors 超级电容器用多孔碳气凝胶的快速单模微波辅助合成
2015 16th International Conference on Electronic Packaging Technology (ICEPT) Pub Date : 2015-09-03 DOI: 10.1109/ICEPT.2015.7236578
Xueqing Cai, Dayong Gui, Jianhong Liu, Guiming Tan, Wei Chen, Weijian Xiong
{"title":"Fast single mode microwave-assisted synthesis of porous carbon aerogel for supercapacitors","authors":"Xueqing Cai, Dayong Gui, Jianhong Liu, Guiming Tan, Wei Chen, Weijian Xiong","doi":"10.1109/ICEPT.2015.7236578","DOIUrl":"https://doi.org/10.1109/ICEPT.2015.7236578","url":null,"abstract":"Carbon materials are, in general, very good absorbents of microwaves. The microwave-assisted synthesis illustrated in this work allows carbon aerogels (CA) to be synthesized in a much shorter time than by conventional methods. Resorcinol-formaldehyde xerogels were synthesized using single mode microwave synthesis system at 85°C for less than an hour. Then, carbonization was performed to obtain carbon xerogels. The effect of the microwave radiation time involved in the process on the textural and electrochemical performance of the final materials was evaluated. It can be concluded that it is possible to control their textural characteristics of carbon xerogels by modifying radiation time. The electrochemical performance of synthesized carbon xerogels as electrode materials in electric double-layer capacitors was studied by cyclic voltammetry and charge/discharge experiments in an alkali medium (6MKOH). It can be seen that single mode microwave-assisted synthesis helps the carbon xerogels display good cycle durability and the specific capacitance of the CA which was radiation for 40minutes is 96.22F/g even without any activation and doping treatments.","PeriodicalId":415934,"journal":{"name":"2015 16th International Conference on Electronic Packaging Technology (ICEPT)","volume":"63 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124842570","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Ab initio studies of the differences in the chemical reactivity and electronic properties of polyaniline and its derivatives 从头算研究聚苯胺及其衍生物的化学反应性和电子性质的差异
2015 16th International Conference on Electronic Packaging Technology (ICEPT) Pub Date : 2015-09-03 DOI: 10.1109/ICEPT.2015.7236739
Junke Jiang, Q. Liang, Chun-Jian Tan, M. Cai, Yiping Huang, Daoguo Yang, Xianping Chen, T. Ren
{"title":"Ab initio studies of the differences in the chemical reactivity and electronic properties of polyaniline and its derivatives","authors":"Junke Jiang, Q. Liang, Chun-Jian Tan, M. Cai, Yiping Huang, Daoguo Yang, Xianping Chen, T. Ren","doi":"10.1109/ICEPT.2015.7236739","DOIUrl":"https://doi.org/10.1109/ICEPT.2015.7236739","url":null,"abstract":"The chemical reactivity and electronic properties of polyaniline (PANI) and its derivatives are systematically investigated using density functional simulations (DFT). The results indicate that carbonic acid (H2CO3) doping emeraldine base polyaniline (EB-PANI) or its derivatives are unspontaneous endothermic reactions. EB-PANI shows better chemical reactivity after the modification by different functional groups -OH and -NaSO3, the energy of reaction (Er) and energy of barrier (Ebar) are both decreased. The band gap are shows dissimilar trends by introducing different functional groups which -OH decrease and -NaSO3 increase. However, the band gap of EB-PANI and its derivatives are dramatic decrease when doping by hydrochloric acid (HCl) or H2CO3 which tend to increase the conductivity at finite temperatures. Especially, the band gap of H2CO3 doped Na-SPANI is far below the EB-PANI and OH-PANI even close to the HCl doped EB-PANI. These simulation results are helpful for further study and application of PANI and its derivatives.","PeriodicalId":415934,"journal":{"name":"2015 16th International Conference on Electronic Packaging Technology (ICEPT)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114919942","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Power QFN device bump ball lift issue study 电源QFN装置撞球提升问题研究
2015 16th International Conference on Electronic Packaging Technology (ICEPT) Pub Date : 2015-09-03 DOI: 10.1109/ICEPT.2015.7236855
Hanmin Zhang, M. Hu, Ting Li, B. Yin, Q. He, D. Ye
{"title":"Power QFN device bump ball lift issue study","authors":"Hanmin Zhang, M. Hu, Ting Li, B. Yin, Q. He, D. Ye","doi":"10.1109/ICEPT.2015.7236855","DOIUrl":"https://doi.org/10.1109/ICEPT.2015.7236855","url":null,"abstract":"Power QFN device had CSR(Current Sense Ratio-Mirror cell Mosfet current to Main mosfet current Ratio. Mirror cell current is proportional to main mosfet, used for monitor main mosfet current) issue on TC500 or application. Failure analysis verified that it was caused by bump ball lift issue. XPS (X-ray Photoelectron Spectroscopy) Analysis verified the pad contamination caused the bump ball lift issue. After further analysis, the contamination was from solder paste out-gassing during Die bonding process. Finally, the contamination was reduced by die bond oven improvement and forming gas/exhaust parameters optimization and passed all reliability test.","PeriodicalId":415934,"journal":{"name":"2015 16th International Conference on Electronic Packaging Technology (ICEPT)","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116458955","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Electrical simulation of a shielding structure in 3D package 三维封装中屏蔽结构的电学模拟
2015 16th International Conference on Electronic Packaging Technology (ICEPT) Pub Date : 2015-09-03 DOI: 10.1109/ICEPT.2015.7236703
Gengxin Tian, Jun Li, Yi He, Zhihua Li, Liqiang Cao, D. Shangguan, L. Wan
{"title":"Electrical simulation of a shielding structure in 3D package","authors":"Gengxin Tian, Jun Li, Yi He, Zhihua Li, Liqiang Cao, D. Shangguan, L. Wan","doi":"10.1109/ICEPT.2015.7236703","DOIUrl":"https://doi.org/10.1109/ICEPT.2015.7236703","url":null,"abstract":"Electromagnetic interference (EMI) has become a remarkable and negligible problem in SiP module. As package tend to higher density and smaller size, the electromagnetic environment become complex and severe. The shortening distance between different devices in SiP enhances the EMI between different devices. Shielding methods in SiP, especially in 3D package, are worth researching. In this paper, a conformal shielding structure with conductive adhesive is researched. The conductive adhesive is coated on the flip-chip dies and connected to ground plane on the top of the substrate. In order to research the shielding effectiveness of this shielding structure, we construct two models in the 3D full wave electromagnetic simulator HFSS, one with shielding structure, and the other without shielding structure. After simulation, we obtain the distribution and the value of the radiation field at 1mm above the flip-chip die. After analysis and calculation, we get the shielding effectiveness of 16-36dB at 1GHz and 20-48dB at 3GHz.","PeriodicalId":415934,"journal":{"name":"2015 16th International Conference on Electronic Packaging Technology (ICEPT)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122385830","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
The modeling of DC current crowding for Through-silicon Via in 3-D IC 三维集成电路中硅通孔直流电流拥挤的建模
2015 16th International Conference on Electronic Packaging Technology (ICEPT) Pub Date : 2015-09-03 DOI: 10.1109/ICEPT.2015.7236732
Song Liu, Guangbao Shan, Chengmin Xie, Long-Sheng Wu, Lei Yi
{"title":"The modeling of DC current crowding for Through-silicon Via in 3-D IC","authors":"Song Liu, Guangbao Shan, Chengmin Xie, Long-Sheng Wu, Lei Yi","doi":"10.1109/ICEPT.2015.7236732","DOIUrl":"https://doi.org/10.1109/ICEPT.2015.7236732","url":null,"abstract":"With increased current density induced by current crowding in Through-silicon Via(TSV), the reliability problem of interconnection of 3-D IC power grid, especially the electromigration (EM), cannot be ignored. To ensure the EM current limit is not exceed and the reliability of power delivery network of 3-D IC is stable, it is essential to accurately analyze the current crowding effect of TSV before manufacturing. So in this paper, a two dimensional analytical method for DC current crowding of 3-D interconnection, which includes TSV and bump, is proposed based on Laplace equation firstly. Then, the proposed method is validated by simulation tool, and a good correlation is obtained between proposed method and simulation result. With the proposed current crowding model, the distribution of voltage and current density can be characterized in two dimensions. Based on the proposed method, some instructive physical design rules of power/ground TSV can be obtained, which is beneficial for the optimization of PDN design and the relief of EM problem induced by current crowding effect.","PeriodicalId":415934,"journal":{"name":"2015 16th International Conference on Electronic Packaging Technology (ICEPT)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122824376","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
The research of lead-free dispensing solder paste 无铅点焊锡膏的研究
2015 16th International Conference on Electronic Packaging Technology (ICEPT) Pub Date : 2015-09-03 DOI: 10.1109/ICEPT.2015.7236637
Sai Yang, Y. Lei, Jian Lin, Qin Li, Baoquan Liu, Hailong Bai, J. Qin
{"title":"The research of lead-free dispensing solder paste","authors":"Sai Yang, Y. Lei, Jian Lin, Qin Li, Baoquan Liu, Hailong Bai, J. Qin","doi":"10.1109/ICEPT.2015.7236637","DOIUrl":"https://doi.org/10.1109/ICEPT.2015.7236637","url":null,"abstract":"The process of solder paste dispensing is considered as a popular coating method in solder paste applications currently. The properties of dispensing solder paste are easily effected by the changes of proportions. The research of Sn-Ag-Cu lead-free dispensing solder paste mainly focuses on the ratios of Sn-Ag-Cu alloy powder and flux, and the ratios of components in flux. In this paper, the mass ratio of alloy powder and flux in dispensing solder paste was 86:14wt %. On the basis of multi-ingredient in flux, the study had adopted four-factor and three-level of L9 (34) orthogonal designing method to design the mass percent of four main ingredients in flux, and achieved a set of optimizing parameters quickly. The four selected factors were rosin, thixotropic agent, solvent, and surfactant. Their effects on viscosity were investigated in this study. With formula of the flux optimized by orthogonal designs and range analysis, investigations on property of the dispensing solder paste had been made. The experiments of viscosity, spreading and slump showed that the methods were effective and feasible to form parameter optimization of dispensing solder paste. The experimental results indicated that the Sn-Ag-Cu lead-free dispensing solder paste would gain moderate viscosity and excellent spreadability when the mass percent of rosin, thixotropic agent, solvent, and surfactant in the flux was 40%:5%:25%:6%.","PeriodicalId":415934,"journal":{"name":"2015 16th International Conference on Electronic Packaging Technology (ICEPT)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129844654","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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