Records of the 2003 International Workshop on Memory Technology, Design and Testing最新文献_第2页

Optimal spare utilization in repairable and reliable memory cores 在可修复和可靠的内存核心中实现最佳的备用利用率

Records of the 2003 International Workshop on Memory Technology, Design and Testing Pub Date : 2003-07-28 DOI: 10.1109/MTDT.2003.1222363

Minsu Choi, N. Park, F. Lombardi, Yong-Bin Kim, V. Piuri

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引用次数: 17

Application specific DRAMs Today 今天的特定应用dram

Records of the 2003 International Workshop on Memory Technology, Design and Testing Pub Date : 2003-07-28 DOI: 10.1109/MTDT.2003.1222354

B. Prince

引用次数: 9

Applying defect-based test to embedded memories in a COT model 对COT模型中的嵌入式记忆应用基于缺陷的测试

Records of the 2003 International Workshop on Memory Technology, Design and Testing Pub Date : 2003-07-28 DOI: 10.1109/MTDT.2003.1222364

R. Aitken

引用次数: 7

Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing 2003年IEEE存储器技术、设计和测试国际研讨会记录

Records of the 2003 International Workshop on Memory Technology, Design and Testing Pub Date : 1900-01-01 DOI: 10.1109/MTDT.2003.1222353

引用次数: 0