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IEEE Symposium on Ultrasonics最新文献

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New nonlinear acoustic effects in pressurized superfluid /sup 4/He and acoustic microscopy 加压超流体中新的非线性声学效应/sup /He和声学显微镜
IEEE Symposium on Ultrasonics Pub Date : 1990-12-04 DOI: 10.1109/ULTSYM.1990.171494
K. Karaki, T. Saito, K. Matsumoto, Y. Okuda
{"title":"New nonlinear acoustic effects in pressurized superfluid /sup 4/He and acoustic microscopy","authors":"K. Karaki, T. Saito, K. Matsumoto, Y. Okuda","doi":"10.1109/ULTSYM.1990.171494","DOIUrl":"https://doi.org/10.1109/ULTSYM.1990.171494","url":null,"abstract":"The power dependence of the propagation of coherent focused acoustic pulses in superfluid /sup 4/He was measured under different pressures. In the lower pressure region where the dispersion relation is anomalous, simple saturation and weak depletion were observed. In the higher pressure region where the dispersion relation becomes normal, new nonlinear phenomena have been observed; that is when the input power increases, the received power increases monotonically, saturates, and rapidly depletes. As the input power is increased, the received power increases and depletes again. A resolution improvement beyond the diffraction limit via the nonlinear effect in the superfluid helium acoustic microscope has been observed.<<ETX>>","PeriodicalId":412254,"journal":{"name":"IEEE Symposium on Ultrasonics","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121830694","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Synthetic aperture sonar: a wide-band approach 合成孔径声纳:一种宽带方法
IEEE Symposium on Ultrasonics Pub Date : 1990-12-04 DOI: 10.1109/ULTSYM.1990.171539
M. Zakharia, J. Chatillon, M. E. Bouhier
{"title":"Synthetic aperture sonar: a wide-band approach","authors":"M. Zakharia, J. Chatillon, M. E. Bouhier","doi":"10.1109/ULTSYM.1990.171539","DOIUrl":"https://doi.org/10.1109/ULTSYM.1990.171539","url":null,"abstract":"The application of synthetic aperture techniques to side-scan sonar imaging systems is investigated. Wideband echoes (one octave) are processed in the time domain. The relative merits of narrowband and wideband systems are shown using numerical simulations including sonar motion perturbations such as sway. Sonar image quality is described by azimuthal resolution. Although this criterion is an objective one, it can be insufficient for a highly perturbed situation.<<ETX>>","PeriodicalId":412254,"journal":{"name":"IEEE Symposium on Ultrasonics","volume":"124 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123250295","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
The effects of non-constant epilayer doping profiles on charge injection in acoustic charge transport devices 非恒定涂层掺杂谱对声波电荷输运器件中电荷注入的影响
IEEE Symposium on Ultrasonics Pub Date : 1990-12-04 DOI: 10.1109/ULTSYM.1990.171361
S. M. Knapp, J. Liou, D. Malocha
{"title":"The effects of non-constant epilayer doping profiles on charge injection in acoustic charge transport devices","authors":"S. M. Knapp, J. Liou, D. Malocha","doi":"10.1109/ULTSYM.1990.171361","DOIUrl":"https://doi.org/10.1109/ULTSYM.1990.171361","url":null,"abstract":"The effects of spatial variations in the epilayer doping density on charge injection in ACT (acoustic charge transport) devices are investigated. The model used to perform the charge injection simulations is based on a simplification of the model proposed by E. G. Bogus (1987). Spatial variations in the epilayer doping density offer a method of increasing injected charge packet compression. Such charge packet compression is thought to increase charge transfer efficiency. Charge injection simulations are performed for the cases of linear- and Gaussian-shaped doping profiles, and the results are compared to the case of constant epilayer doping. The Gaussian profile was superior to the constant and linear profiles in terms of linearity of the channel-current-input-voltage relationship and exhibited a somewhat higher input transconductance. In terms of sampling time variations, however, the constant doping profile remained better than any of the spatial variations examined.<<ETX>>","PeriodicalId":412254,"journal":{"name":"IEEE Symposium on Ultrasonics","volume":"88 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123242499","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A compact concave array for cardiac imaging 一种用于心脏成像的紧凑凹形阵列
IEEE Symposium on Ultrasonics Pub Date : 1990-12-04 DOI: 10.1109/ULTSYM.1990.171478
R.E. McKeighen
{"title":"A compact concave array for cardiac imaging","authors":"R.E. McKeighen","doi":"10.1109/ULTSYM.1990.171478","DOIUrl":"https://doi.org/10.1109/ULTSYM.1990.171478","url":null,"abstract":"A novel prototype scanhead was developed specifically for cardiac imaging. The transducer used a concave geometry to steer and pivot the beam through a 'keyhole' acoustic window near the skin line between the ribs. A soft, compliant fluid-filled nose compartment was designed as an integral part of the probe. The array was built on a radius of curvature of 17.14 mm, a pitch of 0.422 mm, contained 80 active elements, and used an RTV lens to focus the short axis. The concave array performance is compared to that of the convex and classical phased arrays. The scanhead was judged to be superior to a convex 15-mm probe and was found to be comparable in performance to the phased array. A key technical problem that had to be resolved was the near-field clutter and reverberations encountered when doing cardiac imaging through ribs.<<ETX>>","PeriodicalId":412254,"journal":{"name":"IEEE Symposium on Ultrasonics","volume":"110 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124089808","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Imaging flaws in soldered joints of power integrated circuits using electronic scanning techniques of ultrasound 超声电子扫描技术在电力集成电路焊接接头中的成像缺陷
IEEE Symposium on Ultrasonics Pub Date : 1990-12-04 DOI: 10.1109/ULTSYM.1990.171493
J. Kubota, Y. Musha, M. Takahashi
{"title":"Imaging flaws in soldered joints of power integrated circuits using electronic scanning techniques of ultrasound","authors":"J. Kubota, Y. Musha, M. Takahashi","doi":"10.1109/ULTSYM.1990.171493","DOIUrl":"https://doi.org/10.1109/ULTSYM.1990.171493","url":null,"abstract":"An electronic scanning c-scopic 25-MHz ultrasonic imaging system has been developed for high-speed precise testing of electronic parts such as ICs. Two-dimensional scanning is performed, one axis being electronic, and the other mechanical. A focused beam is formed so as to be a longitudinal wave in solid samples. Voids equal to or larger than 0.2 mm in diameter in the solder are reliably detected and their sizing data agree well within 0.1 mm with those measured visually through an optical microscope after destruction. The imaging performance is also examined for fatigue cracks in soldered joints. In 1000 heat cycles between -55 and +150 degrees C, cracks are caused in the soldered joints of most samples, and crack growth is clearly visible. By comparing the images with those observed by a scanning electron microscope, it is confirmed that minimum cracks of 1- mu m separation are detected.<<ETX>>","PeriodicalId":412254,"journal":{"name":"IEEE Symposium on Ultrasonics","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124476962","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Ultrasonic sensor for the characterization of colloidal slurries 用于胶体浆料表征的超声波传感器
IEEE Symposium on Ultrasonics Pub Date : 1990-12-04 DOI: 10.1109/ULTSYM.1990.171371
D. Parker, R. Lec, H. Pendse, J. Vetelino
{"title":"Ultrasonic sensor for the characterization of colloidal slurries","authors":"D. Parker, R. Lec, H. Pendse, J. Vetelino","doi":"10.1109/ULTSYM.1990.171371","DOIUrl":"https://doi.org/10.1109/ULTSYM.1990.171371","url":null,"abstract":"A bulk wave acoustic sensor capable of measuring PSD (particle size distribution) for both low- and high-concentration slurries has been designed, fabricated, and tested. The principle of operation of the sensor is based on the measurement of the variation of the attenuation of the acoustic wave in the slurry as a function of frequency. The attenuation data are then incorporated into a theoretical model to predict the PSD of TiO/sub 2/ particles in the slurry. The sensor is capable of detecting the PSD of the TiO/sub 2/ particles with sizes ranging from 0.1 to 10 mu m in high-concentration slurries, up to 75 weight percent. A potential application of the sensor is in process control in the manufacture of pigments or slurries for use in paints and paper coatings.<<ETX>>","PeriodicalId":412254,"journal":{"name":"IEEE Symposium on Ultrasonics","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121623744","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Ultrasonic tomography using scanned contact transducers 使用扫描接触换能器的超声波断层扫描
IEEE Symposium on Ultrasonics Pub Date : 1990-12-04 DOI: 10.1109/ULTSYM.1990.171488
D. Jansen, D. Hutchins, R. Young
{"title":"Ultrasonic tomography using scanned contact transducers","authors":"D. Jansen, D. Hutchins, R. Young","doi":"10.1109/ULTSYM.1990.171488","DOIUrl":"https://doi.org/10.1109/ULTSYM.1990.171488","url":null,"abstract":"Tomographic images have been obtained from objects of rectangular cross section by scanning contact transducers across the sample faces. On each face, a piezoelectric transducer was set in a spring-loaded mount that forced it against the surface, and a stepper motor moved it to the desired scan position. Hemispherical brass caps were placed on each transducer to facilitate sliding along the surface. Waveforms from receiving transducers were captured on a four-channel digital oscilloscope and transferred to computer for storage and later analysis. The complete system was under the control of a microcomputer, resulting in an entirely automatic data collection system. Examples of images created from this system for objects with and without anomalies present illustrate the system's use.<<ETX>>","PeriodicalId":412254,"journal":{"name":"IEEE Symposium on Ultrasonics","volume":"77 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124199951","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 16
Software for multi-port RF network analysis with a large number of frequency samples and application to 5-port SAW device measurement 软件多端口射频网络分析与大量的频率样本和应用于5端口SAW设备测量
IEEE Symposium on Ultrasonics Pub Date : 1990-12-04 DOI: 10.1109/ULTSYM.1990.171337
C. Hartmann, R.T. Hartmann
{"title":"Software for multi-port RF network analysis with a large number of frequency samples and application to 5-port SAW device measurement","authors":"C. Hartmann, R.T. Hartmann","doi":"10.1109/ULTSYM.1990.171337","DOIUrl":"https://doi.org/10.1109/ULTSYM.1990.171337","url":null,"abstract":"A large project for experimentally measuring the properties of several-hundred SAW (surface acoustic wave) SPUDTs (single-phase unidirectional transducers) is discussed. To determine the desired SAW SPUDT properties, it was necessary to measure all elements of the five-port Y-matrix of each test device at a minimum of 8192 frequencies. The measurement was performed using a microwave wafer probe system in conjunction with a two-port network analyzer. Two different software packages are described. The first, the measurement software, allows the measurement of a large number of frequency samples with an HP8753 network analyzer. The second package, the data manipulation software, is more specialized in that it is only applicable to measured S-parameters from a special five-transducer test structure. Its computed results provide the equivalent of making direct experimental measurements at the two acoustic ports of the center transducer.<<ETX>>","PeriodicalId":412254,"journal":{"name":"IEEE Symposium on Ultrasonics","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128212842","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 17
Multiple-frequency and multiple-angle tomography with the scanning tomographic acoustic microscope 用扫描层析声显微镜进行多频率多角度断层扫描
IEEE Symposium on Ultrasonics Pub Date : 1990-12-04 DOI: 10.1109/ULTSYM.1990.171492
R. Y. Chiao, H. Lee
{"title":"Multiple-frequency and multiple-angle tomography with the scanning tomographic acoustic microscope","authors":"R. Y. Chiao, H. Lee","doi":"10.1109/ULTSYM.1990.171492","DOIUrl":"https://doi.org/10.1109/ULTSYM.1990.171492","url":null,"abstract":"Recent developments in multiple-frequency and multiple-angle tomography for the scanning tomographic acoustic microscope (STAM) are presented. The STAM extends the capabilities of the scanning laser acoustic microscope by using tomographic processing to recover the depth information. Recently, high-quality tomographic reconstructions were obtained by addressing the problems of projection phase errors and projection misalignment. In addition to discussing these implementation problems for the STAM, the authors present reconstructions using experimental data for both multiple-frequency and multiple-angle tomography. These results demonstrate the feasibility and reconstruction improvement of the STAM.<<ETX>>","PeriodicalId":412254,"journal":{"name":"IEEE Symposium on Ultrasonics","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128918034","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
SAW scattering by perfectly conducting elliptic disk on anisotropic piezoelectric halfspace 完全导电椭圆盘在各向异性压电半空间上的SAW散射
IEEE Symposium on Ultrasonics Pub Date : 1990-12-04 DOI: 10.1109/ULTSYM.1990.171335
E. Danicki
{"title":"SAW scattering by perfectly conducting elliptic disk on anisotropic piezoelectric halfspace","authors":"E. Danicki","doi":"10.1109/ULTSYM.1990.171335","DOIUrl":"https://doi.org/10.1109/ULTSYM.1990.171335","url":null,"abstract":"A surface acoustic wave (SAW) propagating in an arbitrarily anisotropic piezoelectric halfspace is considered. The wave interacts with a perfectly conducting and weightless metal disk on the substrate surface by means of the electric potential only, which is coupled to the SAW due to the substrate piezoelectricity. A perturbation theory of the scattering of the plane harmonic SAW by the disk is presented which accounts for the dielectric and elastic anisotropy of the substrate. The solution for electric charge distribution on the disk is given in the form of a fast convergent series easy for computation. The angular dependence of the scattered SAW a large distance from the disk is discussed, and it is shown that the scattering pattern main lobe lies in the shadow area.<<ETX>>","PeriodicalId":412254,"journal":{"name":"IEEE Symposium on Ultrasonics","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130997813","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
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