{"title":"软件多端口射频网络分析与大量的频率样本和应用于5端口SAW设备测量","authors":"C. Hartmann, R.T. Hartmann","doi":"10.1109/ULTSYM.1990.171337","DOIUrl":null,"url":null,"abstract":"A large project for experimentally measuring the properties of several-hundred SAW (surface acoustic wave) SPUDTs (single-phase unidirectional transducers) is discussed. To determine the desired SAW SPUDT properties, it was necessary to measure all elements of the five-port Y-matrix of each test device at a minimum of 8192 frequencies. The measurement was performed using a microwave wafer probe system in conjunction with a two-port network analyzer. Two different software packages are described. The first, the measurement software, allows the measurement of a large number of frequency samples with an HP8753 network analyzer. The second package, the data manipulation software, is more specialized in that it is only applicable to measured S-parameters from a special five-transducer test structure. Its computed results provide the equivalent of making direct experimental measurements at the two acoustic ports of the center transducer.<<ETX>>","PeriodicalId":412254,"journal":{"name":"IEEE Symposium on Ultrasonics","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"17","resultStr":"{\"title\":\"Software for multi-port RF network analysis with a large number of frequency samples and application to 5-port SAW device measurement\",\"authors\":\"C. Hartmann, R.T. Hartmann\",\"doi\":\"10.1109/ULTSYM.1990.171337\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A large project for experimentally measuring the properties of several-hundred SAW (surface acoustic wave) SPUDTs (single-phase unidirectional transducers) is discussed. To determine the desired SAW SPUDT properties, it was necessary to measure all elements of the five-port Y-matrix of each test device at a minimum of 8192 frequencies. The measurement was performed using a microwave wafer probe system in conjunction with a two-port network analyzer. Two different software packages are described. The first, the measurement software, allows the measurement of a large number of frequency samples with an HP8753 network analyzer. The second package, the data manipulation software, is more specialized in that it is only applicable to measured S-parameters from a special five-transducer test structure. Its computed results provide the equivalent of making direct experimental measurements at the two acoustic ports of the center transducer.<<ETX>>\",\"PeriodicalId\":412254,\"journal\":{\"name\":\"IEEE Symposium on Ultrasonics\",\"volume\":\"34 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-12-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"17\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Symposium on Ultrasonics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ULTSYM.1990.171337\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Symposium on Ultrasonics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ULTSYM.1990.171337","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Software for multi-port RF network analysis with a large number of frequency samples and application to 5-port SAW device measurement
A large project for experimentally measuring the properties of several-hundred SAW (surface acoustic wave) SPUDTs (single-phase unidirectional transducers) is discussed. To determine the desired SAW SPUDT properties, it was necessary to measure all elements of the five-port Y-matrix of each test device at a minimum of 8192 frequencies. The measurement was performed using a microwave wafer probe system in conjunction with a two-port network analyzer. Two different software packages are described. The first, the measurement software, allows the measurement of a large number of frequency samples with an HP8753 network analyzer. The second package, the data manipulation software, is more specialized in that it is only applicable to measured S-parameters from a special five-transducer test structure. Its computed results provide the equivalent of making direct experimental measurements at the two acoustic ports of the center transducer.<>