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37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN'07)最新文献

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The Case for FEC-Based Reliable Multicast in Wireless Mesh Networks 无线Mesh网络中基于fec的可靠组播方案
37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN'07) Pub Date : 2007-06-25 DOI: 10.1109/DSN.2007.92
Dimitrios Koutsonikolas, Y. C. Hu
{"title":"The Case for FEC-Based Reliable Multicast in Wireless Mesh Networks","authors":"Dimitrios Koutsonikolas, Y. C. Hu","doi":"10.1109/DSN.2007.92","DOIUrl":"https://doi.org/10.1109/DSN.2007.92","url":null,"abstract":"Many important applications in wireless mesh networks require reliable multicast communication. Previously, forward error correction (FEC) techniques have been proved successful for providing reliability in the Internet, as they avoid the control packet implosion and scalability problems of ARQ-based protocols. In this paper, we examine if FEC can be equally efficient wireless mesh networks. We implement four reliable schemes initially proposed for wired networks on top of ODMRP, a popular unreliable multicast routing protocol for wireless networks. We compare the performance of the four schemes using extensive simulations. Our results show that the use of pure FEC can offer significant improvements in terms of reliability, increasing PDR up to 100% in many cases, but it can be very inefficient regarding the number of redundant packets it transmits. Moreover, a carefully designed hybrid protocol, such as RMDP, can maintain the same high level of reliability while improving the efficiency by up to 38% compared to a pure FEC scheme.","PeriodicalId":405751,"journal":{"name":"37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN'07)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121126484","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 18
Greedy Receivers in IEEE 802.11 Hotspots IEEE 802.11热点中的贪婪接收器
37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN'07) Pub Date : 2007-06-25 DOI: 10.1109/DSN.2007.53
M. Han, Brian Overstreet, L. Qiu
{"title":"Greedy Receivers in IEEE 802.11 Hotspots","authors":"M. Han, Brian Overstreet, L. Qiu","doi":"10.1109/DSN.2007.53","DOIUrl":"https://doi.org/10.1109/DSN.2007.53","url":null,"abstract":"As wireless hotspot business becomes a tremendous financial success, users of these networks have increasing motives to misbehave in order to obtain more bandwidth at the expense of other users. Such misbehaviors threaten the performance and availability of hotspot networks, and have recently attracted increasing research attention. However the existing work so far focuses on sender-side misbehavior. Motivated by the observation that many hotspot users receive more traffic than they send, we study greedy receivers in this paper. We identify a range of greedy receiver misbehaviors, and quantify their damage using both simulation and testbed experiments. Our results show that even though greedy receivers do not directly control data transmission, they can still result in very serious damage, including completely shutting off the competing traffic. To address the issues, we further develop techniques to detect and mitigate greedy receiver misbehavior, and demonstrate their effectiveness.","PeriodicalId":405751,"journal":{"name":"37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN'07)","volume":"389 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121382314","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Workshop on Dependable Application Support for Self-Organizing Networks (DASSON 2007) 自组织网络可靠应用支持研讨会(DASSON 2007)
37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN'07) Pub Date : 2007-06-25 DOI: 10.1109/DSN.2007.107
P. Ezhilchelvan, M. Raynal, A. Datta
{"title":"Workshop on Dependable Application Support for Self-Organizing Networks (DASSON 2007)","authors":"P. Ezhilchelvan, M. Raynal, A. Datta","doi":"10.1109/DSN.2007.107","DOIUrl":"https://doi.org/10.1109/DSN.2007.107","url":null,"abstract":"This report gives an overview of the workshop on ¿\"Dependable Application Support for Self-Organising Networks\" held in conjunction with DSN 2007. The principal objective of the workshop is to facilitate a forum for researchers to explore, examine and address dependability related challenges in hosting distributed applications in self-organised networks such as MANETs, sensor and P2P networks.","PeriodicalId":405751,"journal":{"name":"37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN'07)","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131896390","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Experimental Risk Assessment and Comparison Using Software Fault Injection 基于软件故障注入的实验风险评估与比较
37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN'07) Pub Date : 2007-06-25 DOI: 10.1109/DSN.2007.45
Regina L. O. Moraes, J. Durães, R. Barbosa, E. Martins, H. Madeira
{"title":"Experimental Risk Assessment and Comparison Using Software Fault Injection","authors":"Regina L. O. Moraes, J. Durães, R. Barbosa, E. Martins, H. Madeira","doi":"10.1109/DSN.2007.45","DOIUrl":"https://doi.org/10.1109/DSN.2007.45","url":null,"abstract":"One important question in component-based software development is how to estimate the risk of using COTS components, as the components may have hidden faults and no source code available. This question is particularly relevant in scenarios where it is necessary to choose the most reliable COTS when several alternative components of equivalent functionality are available. This paper proposes a practical approach to assess the risk of using a given software component (COTS or non-COTS). Although we focus on comparing components, the methodology can be useful to assess the risk in individual modules. The proposed approach uses the injection of realistic software faults to assess the impact of possible component failures and uses software complexity metrics to estimate the probability of residual defects in software components. The proposed approach is demonstrated and evaluated in a comparison scenario using two real off-the-shelf components (the RTEMS and the RTLinux real-time operating system) in a realistic application of a satellite data handling application used by the European Space Agency.","PeriodicalId":405751,"journal":{"name":"37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN'07)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131022670","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 41
Third Workshop on Hot Topics in System Dependability HotDep'07 第三届系统可靠性热点专题研讨会
37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN'07) Pub Date : 2007-06-25 DOI: 10.1109/DSN.2007.94
M. Castro, J. Wilkes
{"title":"Third Workshop on Hot Topics in System Dependability HotDep'07","authors":"M. Castro, J. Wilkes","doi":"10.1109/DSN.2007.94","DOIUrl":"https://doi.org/10.1109/DSN.2007.94","url":null,"abstract":"The goals of HotDep are to bring forth cuttingedge research ideas spanning the domains of fault tolerance/ reliability and systems, and to build linkages between the two communities (e.g., between people who attend traditional \"dependability\" conferences such as DSN and ISSRE, and those who attend \"systems\" conferences such as OSDI, SOSP, and EuroSys).","PeriodicalId":405751,"journal":{"name":"37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN'07)","volume":"95 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132292631","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Fault Tolerance Connectors for Unreliable Web Services 用于不可靠Web服务的容错连接器
37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN'07) Pub Date : 2007-06-25 DOI: 10.1109/DSN.2007.48
Nicolas Salatgé, J. Fabre
{"title":"Fault Tolerance Connectors for Unreliable Web Services","authors":"Nicolas Salatgé, J. Fabre","doi":"10.1109/DSN.2007.48","DOIUrl":"https://doi.org/10.1109/DSN.2007.48","url":null,"abstract":"Web Services are commonly used to implement service oriented architectures/applications. Service-oriented applications are large-scale distributed applications, typically highly dynamic, by definition loosely coupled and often unstable due to the unreliability of Web Services, which can be moved, deleted, and are subject to various sources of failures. In this paper, we propose customizable fault-tolerance connectors to add fault-tolerance to unreliable Web Services, thus filling the gap between clients and Web Service providers. Connectors are designed by clients, providers or dependability experts using the original WSDL description of the service. These connectors insert detection actions (e.g. runtime assertions) and recovery mechanisms (based on various replications strategies). The connectors can use identical or equivalent available service replicas. The benefits of this approach are demonstrated experimentally.","PeriodicalId":405751,"journal":{"name":"37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN'07)","volume":"101 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116354867","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 89
Using Register Lifetime Predictions to Protect Register Files against Soft Errors 使用注册寿命预测保护注册文件免受软错误
37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN'07) Pub Date : 2007-06-25 DOI: 10.1109/DSN.2007.99
Pablo Montesinos, Wei Liu, J. Torrellas
{"title":"Using Register Lifetime Predictions to Protect Register Files against Soft Errors","authors":"Pablo Montesinos, Wei Liu, J. Torrellas","doi":"10.1109/DSN.2007.99","DOIUrl":"https://doi.org/10.1109/DSN.2007.99","url":null,"abstract":"To increase the resistance of register files to soft errors, this paper presents the ParShield architecture. ParShield is based on two observations: (i) the data in a register is only useful for a small fraction of the register's lifetime, and (ii) not all registers are equally vulnerable. ParShield selectively protects registers by generating, storing, and checking the ECCs of only the most vulnerable registers while they contain useful data. In addition, it stores a parity bit for all the registers, re-using the ECC circuitry for parity generation and checking. ParShield has no SDC AVF and a small average DUE AVF of 0.040 and 0.010 for the integer and floating-point register files, respectively. ParShield consumes on average only 81% and 78% of the power of a design with full ECC for the SPECint and SPECfp applications, respectively. Finally, ParShield has no performance impact and little area requirements.","PeriodicalId":405751,"journal":{"name":"37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN'07)","volume":"68 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123623969","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 88
Knowledge Connectivity vs. Synchrony Requirements for Fault-Tolerant Agreement in Unknown Networks 未知网络中容错协议的知识连通性与同步需求
37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN'07) Pub Date : 2007-06-25 DOI: 10.1109/DSN.2007.61
F. Greve, S. Tixeuil
{"title":"Knowledge Connectivity vs. Synchrony Requirements for Fault-Tolerant Agreement in Unknown Networks","authors":"F. Greve, S. Tixeuil","doi":"10.1109/DSN.2007.61","DOIUrl":"https://doi.org/10.1109/DSN.2007.61","url":null,"abstract":"In self-organizing systems, such as mobile ad-hoc and peer-to-peer networks, consensus is a fundamental building block to solve agreement problems. It contributes to coordinate actions of nodes distributed in an ad-hoc manner in order to take consistent decisions. It is well known that in classical environments, in which entities behave asynchronously and where identities are known, consensus cannot be solved in the presence of even one process crash. It appears that self-organizing systems are even less favorable because the set and identity of participants are not known. We define necessary and sufficient conditions under which fault-tolerant consensus become solvable in these environments. Those conditions are related to the synchrony requirements of the environment, as well as the connectivity of the knowledge graph constructed by the nodes in order to communicate with their peers.","PeriodicalId":405751,"journal":{"name":"37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN'07)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126615278","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 66
Fault Tolerant Approaches to Nanoelectronic Programmable Logic Arrays 纳米电子可编程逻辑阵列的容错方法
37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN'07) Pub Date : 2007-06-25 DOI: 10.1109/DSN.2007.49
Wenjing Rao, A. Orailoglu, R. Karri
{"title":"Fault Tolerant Approaches to Nanoelectronic Programmable Logic Arrays","authors":"Wenjing Rao, A. Orailoglu, R. Karri","doi":"10.1109/DSN.2007.49","DOIUrl":"https://doi.org/10.1109/DSN.2007.49","url":null,"abstract":"Programmable logic arrays (PLA), which can implement arbitrary logic functions in a two-level logic form, are promising as platforms for nanoelectronic logic due to their highly regular structure compatible with the nano crossbar architectures. Reliability is an important challenge as far as nanoelectronic devices are concerned. Consequently, it is necessary to focus on the fault tolerance aspects of nanoelectronic PLAs to ensure their viability as a foundation for nanoelectronic systems. In this paper, we investigate two types of fault tolerance techniques for nanoelectronic device based PLAs, focusing at the online faults occurring at the cross-points of nano devices. We develop a scheme to precisely locate the faults online, as this is a crucial step for efficient online reconfiguration based fault tolerance schemes. We also propose a tautology based fault masking scheme. We demonstrate that these two types of fault tolerance schemes developed for nano PLAs significantly improve at low hardware cost the reliability of the high fault occurrence nanoelectronic environment.","PeriodicalId":405751,"journal":{"name":"37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN'07)","volume":"146 3-4","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132062595","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 22
Feedback Redundancy: A Power Efficient SEU-Tolerant Latch Design for Deep Sub-Micron Technologies 反馈冗余:用于深亚微米技术的高能效容错锁存器设计
37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN'07) Pub Date : 2007-06-25 DOI: 10.1109/DSN.2007.51
M. Fazeli, A. Patooghy, S. Miremadi, A. Ejlali
{"title":"Feedback Redundancy: A Power Efficient SEU-Tolerant Latch Design for Deep Sub-Micron Technologies","authors":"M. Fazeli, A. Patooghy, S. Miremadi, A. Ejlali","doi":"10.1109/DSN.2007.51","DOIUrl":"https://doi.org/10.1109/DSN.2007.51","url":null,"abstract":"The continuous decrease in CMOS technology feature size increases the susceptibility of such circuits to single event upsets (SEU) caused by the impact of particle strikes on system flip flops. This paper presents a novel SEU-tolerant latch where redundant feedback lines are used to mask the effects of SEUs. The power dissipation, area, reliability, and propagation delay of the presented SEU-tolerant latch are analyzed by SPICE simulations. The results show that this latch consumes about 50% less power and occupies 42% less area than a TMR-latch. However, the reliability and the propagation delay of the proposed latch are still the same as the TMR-latch. the reliability of the proposed latch is also compared with other SEU-tolerant latches.","PeriodicalId":405751,"journal":{"name":"37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN'07)","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131283315","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 72
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