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An optimal method for retrieving useful frequency information from a noisy sinusoidal signal 从有噪声的正弦信号中检索有用频率信息的最佳方法
7th IEEE Conference on Instrumentation and Measurement Technology Pub Date : 1990-02-13 DOI: 10.1109/IMTC.1990.65993
G. Hancke
{"title":"An optimal method for retrieving useful frequency information from a noisy sinusoidal signal","authors":"G. Hancke","doi":"10.1109/IMTC.1990.65993","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65993","url":null,"abstract":"The author proposes a signal processing method whereby the frequency of a noisy sinusoidal signal can be estimated optimally. The criterion for optimum performance is the minimum measurement time for given error or the minimum error for a given measurement time when the same signal-to-noise condition prevails. Three methods of analyzing the instants of the transition of the signal through a selected level in a given direction can be used to determine the frequency. The first method measures the time between two consecutive positive zero crossings. The second method calculates the average period of the signal. With the third method every instant of transition through the same level is noted, thereby obtaining a sequence of equally spaced points, which can be approximated with least square error by a sequence of unequally spaced points, the interval of which can then be used to calculate an estimate of the frequency. These methods have been simulated, and the results give a comparison of the measurement errors for the various methods when different signal-to-noise ratios and measurement times are used.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123970459","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
On the in situ probe method for measuring the permittivity of materials at microwave frequencies 微波频率下测量材料介电常数的原位探针法研究
7th IEEE Conference on Instrumentation and Measurement Technology Pub Date : 1990-02-13 DOI: 10.1109/IMTC.1990.65953
K. Staebell, M. Noffke, D. Misra
{"title":"On the in situ probe method for measuring the permittivity of materials at microwave frequencies","authors":"K. Staebell, M. Noffke, D. Misra","doi":"10.1109/IMTC.1990.65953","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65953","url":null,"abstract":"A technique to be used for determining in-vivo dielectric properties of materials at microwave frequencies is examined. The technique involves the use of an open-ended coaxial line as a sensor and models the coaxial aperture on the basis of a quasi-static analysis. This theory is discussed along with a correction method to account for system imperfections. With the proper choice of calibration standards and the use of the formulated admittance model, the complex permittivities of various unknowns can be determined over a wide range of frequencies. Experimental results are compared with data available in the literature. The technique limitations are also presented.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124212452","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
A standardized instrument programming language based on IEEE Std 488.2 基于IEEE标准488.2的标准化仪器编程语言
7th IEEE Conference on Instrumentation and Measurement Technology Pub Date : 1990-02-13 DOI: 10.1109/IMTC.1990.66026
J. Nemeth-Johannes
{"title":"A standardized instrument programming language based on IEEE Std 488.2","authors":"J. Nemeth-Johannes","doi":"10.1109/IMTC.1990.66026","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66026","url":null,"abstract":"The author describes the features of TMSL (Test and Measurement System Language) and how they relate to compatibility. TMSL implements a tree-structured command set, rather than a traditional flat instrument language, allowing keywords to be reusable and identifiable in context. Reusable keywords also allow for simple and regular mnemonic generation rules. TMSL also addresses parameters through the use of regular parameter forms, a say-what-you-mean philosophy for discrete switch settings, and the minimization of obscure side effects. In addition, TMSL addresses the need for horizontally compatible, signal-oriented measurements, as well as the traditional programming of instrument-specific hardware. The model of an instrument developed for TMSL and the importance of such a standardized model are discussed. The author outlines the advantages realized, including the ease of adding capabilities in the future, the ease of learning, the self-documenting features, the opportunities for reuse of instrument firmware, including increased reliability of parsers, and the ease of integrating instruments into existing test systems.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125623333","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
How good is your calibration? A post-mortem examination and recalibration 你们的校准有多好?验尸和重新校准
7th IEEE Conference on Instrumentation and Measurement Technology Pub Date : 1990-02-13 DOI: 10.1109/IMTC.1990.65995
J. Aguilera, B. Fisher
{"title":"How good is your calibration? A post-mortem examination and recalibration","authors":"J. Aguilera, B. Fisher","doi":"10.1109/IMTC.1990.65995","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65995","url":null,"abstract":"Summary form only given. It is pointed out that the standard network analyzer calibration procedure suffers from several drawbacks. The test patterns, for instance, often reside on a wafer different from that being tested. The normal procedure is to measure only a single set of calibration patterns instead of collecting a statistically significant sample spanning the wafer. Wafer thickness uniformity, for example, affects the coplanar to microstrip launch discontinuity, which impacts the quality of the calibration. The parasitic probe-to-probe capacitances also differ between the calibration and test setups. Rather than propose solutions to these and other calibration issues, the authors examine the statistical quality of measurements after calibration and test. Reciprocity and symmetry are examined for several hundred passive components from a special test wafer. The frequency-dependent deviations from perfect reciprocity and symmetry are used to evaluate the quality of the original calibration. It is shown how this information can be used to recenter the calibration and quantify the intrinsic frequency degradation.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129358215","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Bridging the gap between design and testing of analog integrated circuits 弥合模拟集成电路设计和测试之间的差距
7th IEEE Conference on Instrumentation and Measurement Technology Pub Date : 1990-02-13 DOI: 10.1109/IMTC.1990.66005
E. Soenen, P. Vanpeteghem, H. Liu, S. Narayan, J. Cummings
{"title":"Bridging the gap between design and testing of analog integrated circuits","authors":"E. Soenen, P. Vanpeteghem, H. Liu, S. Narayan, J. Cummings","doi":"10.1109/IMTC.1990.66005","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66005","url":null,"abstract":"It is noted that an important problem associated with analog and mixed analog/digital VLSI design has been the lack of a systematic approach to the design and testing of such integrated systems. The authors describe a computer environment that brings the different design aspects closely together. It has been used successfully to analyze the performance of high-speed flash analog/digital converters. Interaction among simulations, CAD (computer-aided design) tools, measurements, and testing is provided for in this approach.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"42 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127985934","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Microprocessor-controlled automatic clutter-cancellation circuits for microwave systems to sense physiological movements remotely through the rubble 微处理器控制的自动杂波消除电路，用于微波系统，通过废墟远程感知生理运动
7th IEEE Conference on Instrumentation and Measurement Technology Pub Date : 1990-02-13 DOI: 10.1109/IMTC.1990.65992
H. Chuang, Y. F. Chen, K. Chen
{"title":"Microprocessor-controlled automatic clutter-cancellation circuits for microwave systems to sense physiological movements remotely through the rubble","authors":"H. Chuang, Y. F. Chen, K. Chen","doi":"10.1109/IMTC.1990.65992","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65992","url":null,"abstract":"A novel microprocessor-controlled automatic clutter-cancellation subsystem, consisting of a programmable microwave attenuator and a programmable microwave phase shifter controlled by a microprocessor-based control unit, has been developed for a microwave life-detection system (L-band 2 GHz or X-band 10 GHz) which can remotely sense breathing and heartbeat movements of living subjects. This automatic clutter-cancellation subsystem is a drastic improvement over the very slow process of adjusting clutter-cancellation manually in the old microwave system; this is very important for some potential applications, which include locating earthquake- or avalanche-trapped victims through rubble. A series of experiments have been conducted to demonstrate the applicability of this microwave life-detection system. The 2-GHz system performs well for remotely detecting human breathing and heartbeat signals through a pile of rubble of up to about 3 ft. thick. The automatic clutter canceler may also have a potential application in some CW (continuous wave) radars.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131351855","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 16
The grammar of metrology 计量学语法
7th IEEE Conference on Instrumentation and Measurement Technology Pub Date : 1990-02-13 DOI: 10.1109/IMTC.1990.65967
P. M. Clifford
{"title":"The grammar of metrology","authors":"P. M. Clifford","doi":"10.1109/IMTC.1990.65967","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65967","url":null,"abstract":"The author notes that the technical grammar of metrology is given in the ISO (International Organization for Standardization) publications ISO 1000 and ISO 31/0. A related document is 'The International System of Units (SI)/Le Systeme International d'Unites (SI)' currently in its fifth (1985) edition. Some of the highlights of 'SI' and some of the common mistakes made by users of these documents are presented.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129886806","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Experience with the IEEE pulse standards at Wavetek 在Wavetek有IEEE脉冲标准的经验
7th IEEE Conference on Instrumentation and Measurement Technology Pub Date : 1990-02-13 DOI: 10.1109/IMTC.1990.66024
K. Lo
{"title":"Experience with the IEEE pulse standards at Wavetek","authors":"K. Lo","doi":"10.1109/IMTC.1990.66024","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66024","url":null,"abstract":"IEEE Std 194 is a standard for pulse terms and definitions, and IEEE Std 181 is a standard for pulse measurement and analysis. The author presents his observations about the experience with and importance of the IEEE pulse standards at Wavetek. He considers why the standards are not being widely used.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"74 4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130923846","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A venous occlusion plethysmography using a load cell as the sensing element 一种使用称重传感器作为感应元件的静脉闭塞容积描记仪
7th IEEE Conference on Instrumentation and Measurement Technology Pub Date : 1990-02-13 DOI: 10.1109/IMTC.1990.65955
Y. Yamamoto, T. Yamamoto, P. Oberg, A. Yoshida
{"title":"A venous occlusion plethysmography using a load cell as the sensing element","authors":"Y. Yamamoto, T. Yamamoto, P. Oberg, A. Yoshida","doi":"10.1109/IMTC.1990.65955","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65955","url":null,"abstract":"An application of the load cell as a sensor in venous occlusion plethysmography is presented. In this method the limb volume changes that follow venous occlusion are converted into water volume changes using a water tank for volume change detection. The hydrostatic pressure, as well as the water surface level, is measured and used for the calculation of the volume change. By using this method the influence of water pressure on limb blood flow, as well as drift and leakage of the sensing element, is avoided. The load cell has the advantage of measuring the weight of the displaced water volume, which simplifies the design principles of the plethysmography. The plethysmography is found to be sensitive, highly linear, and easy to handle. It has been evaluated in several subjects, and the results of these studies are in agreement with earlier results.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130268007","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Electrodynamics of materials for dielectric measurement standardization 介质测量标准化用材料电动力学
7th IEEE Conference on Instrumentation and Measurement Technology Pub Date : 1990-02-13 DOI: 10.1109/IMTC.1990.65947
R. Geyer
{"title":"Electrodynamics of materials for dielectric measurement standardization","authors":"R. Geyer","doi":"10.1109/IMTC.1990.65947","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65947","url":null,"abstract":"Dielectric reference materials are analyzed in light of the fundamental requirements of linearity, homogeneity, and isotropy. The author presents generalized frequency- and temperature-dependent dispersion relations which allow the prediction of broadband dielectric behavior from limited measurement data, determination of valid modal field structure in cavity or waveguide fixtures, and identification of discrepancies and errors in measurement data. An approach to examining the influence of deviations of sample homogeneity on a precisely specified electromagnetic field structure is outlined, and sufficient conditions for isotropic, uniaxial, or biaxial anisotropic dielectric behavior are examined in terms of a material's chemical lattice physics. These characteristics direct the choice of suitable reference materials useful in dielectric metrology. Advances at the National Institute of Standards and Technology in both transmission/reflection and cavity resonator measurements incorporating dielectric reference materials are noted.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"170 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133906570","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
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