{"title":"计量学语法","authors":"P. M. Clifford","doi":"10.1109/IMTC.1990.65967","DOIUrl":null,"url":null,"abstract":"The author notes that the technical grammar of metrology is given in the ISO (International Organization for Standardization) publications ISO 1000 and ISO 31/0. A related document is 'The International System of Units (SI)/Le Systeme International d'Unites (SI)' currently in its fifth (1985) edition. Some of the highlights of 'SI' and some of the common mistakes made by users of these documents are presented.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"The grammar of metrology\",\"authors\":\"P. M. Clifford\",\"doi\":\"10.1109/IMTC.1990.65967\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The author notes that the technical grammar of metrology is given in the ISO (International Organization for Standardization) publications ISO 1000 and ISO 31/0. A related document is 'The International System of Units (SI)/Le Systeme International d'Unites (SI)' currently in its fifth (1985) edition. Some of the highlights of 'SI' and some of the common mistakes made by users of these documents are presented.<<ETX>>\",\"PeriodicalId\":404761,\"journal\":{\"name\":\"7th IEEE Conference on Instrumentation and Measurement Technology\",\"volume\":\"4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-02-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"7th IEEE Conference on Instrumentation and Measurement Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMTC.1990.65967\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"7th IEEE Conference on Instrumentation and Measurement Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.1990.65967","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The author notes that the technical grammar of metrology is given in the ISO (International Organization for Standardization) publications ISO 1000 and ISO 31/0. A related document is 'The International System of Units (SI)/Le Systeme International d'Unites (SI)' currently in its fifth (1985) edition. Some of the highlights of 'SI' and some of the common mistakes made by users of these documents are presented.<>
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