IEEE/SEMI International Symposium on Semiconductor Manufacturing Science最新文献_第3页

Using yield models to accelerate learning curve progress 使用产量模型来加快学习曲线的进度

IEEE/SEMI International Symposium on Semiconductor Manufacturing Science Pub Date : 1990-05-21 DOI: 10.1109/ISMSS.1990.66108

D. Dance, R. Jarvis

引用次数: 14

Multi site computer aided manufacturing with worldwide order book and intelligent scheduling system 多地点计算机辅助制造，全球订单和智能调度系统

IEEE/SEMI International Symposium on Semiconductor Manufacturing Science Pub Date : 1990-05-21 DOI: 10.1109/ISMSS.1990.66106

S. McIntosh

引用次数: 0

Statistical parameter control for optimum design and manufacturability of VLSI circuits VLSI电路优化设计与可制造性的统计参数控制

IEEE/SEMI International Symposium on Semiconductor Manufacturing Science Pub Date : 1990-05-21 DOI: 10.1109/ISMSS.1990.66118

M. Bolt, J. Engel, C.L.M. v.d. Klauw, M. Rocchi

引用次数: 8

Continuous flow manufacturing 连续流制造

IEEE/SEMI International Symposium on Semiconductor Manufacturing Science Pub Date : 1990-05-21 DOI: 10.1117/12.29746

G. Bowers

引用次数: 4

Determining equipment performance using analysis of variance 使用方差分析确定设备性能

IEEE/SEMI International Symposium on Semiconductor Manufacturing Science Pub Date : 1990-05-21 DOI: 10.1109/ISMSS.1990.66114

L.K. Garling, G. P. Woods

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引用次数: 7

AEMPES: an expert system for in-situ diagnostics and process monitoring AEMPES:现场诊断和过程监控专家系统

IEEE/SEMI International Symposium on Semiconductor Manufacturing Science Pub Date : 1990-02-15 DOI: 10.1117/12.963949

S.-s. Chen

引用次数: 4

IC manufacturing science in Europe 欧洲的集成电路制造科学

IEEE/SEMI International Symposium on Semiconductor Manufacturing Science Pub Date : 1900-01-01 DOI: 10.1109/ISMSS.1990.66117

J. Monnier

引用次数: 0