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Proceedings of 1996 Annual Reliability and Maintainability Symposium最新文献

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A physical approach for determining the optimum random-vibration screening duration 确定最佳随机振动筛分持续时间的物理方法
Proceedings of 1996 Annual Reliability and Maintainability Symposium Pub Date : 1996-01-22 DOI: 10.1109/RAMS.1996.500660
Fengbin Sun, D. Kececioglu
{"title":"A physical approach for determining the optimum random-vibration screening duration","authors":"Fengbin Sun, D. Kececioglu","doi":"10.1109/RAMS.1996.500660","DOIUrl":"https://doi.org/10.1109/RAMS.1996.500660","url":null,"abstract":"The authors propose a physical approach for the determination of the optimum random-vibration screening duration. This approach is based on a newly-proposed bimodally-distributed P-S-N diagram, for the fatigue strength of nonscreened units, and its corresponding threshold S-N curve for fatigue defect precipitation. Equations, for mean and variance of the cumulative damage and fatigue-defect precipitation time distributions, and for the optimum random-vibration screening duration, under both stationary narrow-band and stationary wide-band random stressing, are derived in terms of the parameters of the structure-inherent bimodally-distributed P-S-N diagram and of the stress response spectrum which corresponds to the applied acceleration power spectral density (PSD) function. A numerical example is given to illustrate the application of the proposed approach.","PeriodicalId":393833,"journal":{"name":"Proceedings of 1996 Annual Reliability and Maintainability Symposium","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1996-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128052677","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Worst case circuit analysis-an overview (electronic parts/circuits tolerance analysis) 最坏情况电路分析-概述(电子零件/电路公差分析)
Proceedings of 1996 Annual Reliability and Maintainability Symposium Pub Date : 1996-01-22 DOI: 10.1109/RAMS.1996.500682
W. M. Smith
{"title":"Worst case circuit analysis-an overview (electronic parts/circuits tolerance analysis)","authors":"W. M. Smith","doi":"10.1109/RAMS.1996.500682","DOIUrl":"https://doi.org/10.1109/RAMS.1996.500682","url":null,"abstract":"This paper has been prepared utilizing material from Design and Evaluation, Inc.'s (D&E) training course and engineering handbooks on worst case circuit analysis (WCCA). The WCCA training course was developed by D&E and upgraded under contract to NASA's Jet Propulsion Laboratory to standardize an approach to performing worst case circuit analysis and to exemplify the methodologies and tools for completing a customer acceptable worst case circuit analysis final report. The WCCA methodologies discussed herein for the development of a worst case parts variation database, sensitivity analysis and the mathematical approaches of the extreme value analysis (EVA), root-sum-square (RSS) and Monte Carlo analysis for solving circuit equations and combining variables have become an accepted industry standard over the last eight years.","PeriodicalId":393833,"journal":{"name":"Proceedings of 1996 Annual Reliability and Maintainability Symposium","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1996-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123515145","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Facilitating fault tree preparation and review by applying complementary event logic 通过应用互补的事件逻辑，简化故障树的准备和审查
Proceedings of 1996 Annual Reliability and Maintainability Symposium Pub Date : 1996-01-22 DOI: 10.1109/RAMS.1996.500666
M. A. Burkett
{"title":"Facilitating fault tree preparation and review by applying complementary event logic","authors":"M. A. Burkett","doi":"10.1109/RAMS.1996.500666","DOIUrl":"https://doi.org/10.1109/RAMS.1996.500666","url":null,"abstract":"This paper describes a simple analysis and documentation procedure which can help ensure the completeness and accuracy of fault tree analysis, and thus help assure the safety of the corresponding product or system. With this procedure, each layer of the fault tree which feeds into an OR gate is structured to comprise a complete theoretical set. This is done, generally, by first including the most significant or most obvious failure contributor, and then using complementary event logic to define a second failure contributor which includes all possibilities except the one already covered. A simple example of using complementary event logic in this way would be an OR gate with the contributors: (1) \"valve commanded closed\"; and (2) \"valve closes even though not commanded\". Another example would be an OR gate with the contributors: (1) \"software logic satisfied to generate a valve close command\"; and (2) \"a valve close command is generated even though the software logic is not satisfied\". Fault trees prepared in this way are inherently complete, and are more amenable for review.","PeriodicalId":393833,"journal":{"name":"Proceedings of 1996 Annual Reliability and Maintainability Symposium","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1996-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116463098","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Simultaneous allocation of reliability & redundancy using simplex search 基于单纯形搜索的可靠性和冗余度同步分配
Proceedings of 1996 Annual Reliability and Maintainability Symposium Pub Date : 1996-01-22 DOI: 10.1109/RAMS.1996.500669
David, Jacobson, Rochester, Sane Ram Arora
{"title":"Simultaneous allocation of reliability & redundancy using simplex search","authors":"David, Jacobson, Rochester, Sane Ram Arora","doi":"10.1109/RAMS.1996.500669","DOIUrl":"https://doi.org/10.1109/RAMS.1996.500669","url":null,"abstract":"Here, the existing work in reliability apportionment and redundancy allocation is extended by considering a solution technique to a problem which requires finding the optimal level of subsystem reliability as well as an integer solution for the number of redundant subsystems. The solution technique combines the simplex search method and a heuristic approach developed by Aggarwal (1975) for finding the optimal number of redundant subsystems. The implementation of the simplex search algorithm requires only two types of calculations: (1) generation of a regular simplex given a base point and appropriate scale factor; and (2) calculation of a reflected point. Aggarwal's heuristic approach for finding the optimal number of subsystems is based on the concept that a subsystem is added to the stage where its addition produces the greatest ratio of \"increment increases in reliability\" to the \"product of increments increase in resources\" usage. The proposed optimization procedure is demonstrated with two examples. The first example demonstrates the procedure while the second provides evidence of the flexibility of the procedure.","PeriodicalId":393833,"journal":{"name":"Proceedings of 1996 Annual Reliability and Maintainability Symposium","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1996-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129736271","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Case study: safety analysis of the NASA/Boeing fly-by-light airplane using a new reliability tool 案例研究:使用新的可靠性工具对NASA/波音轻型飞行飞机进行安全分析
Proceedings of 1996 Annual Reliability and Maintainability Symposium Pub Date : 1996-01-22 DOI: 10.1109/RAMS.1996.500681
M. Ulrey, D. Palumbo, D. Nicol
{"title":"Case study: safety analysis of the NASA/Boeing fly-by-light airplane using a new reliability tool","authors":"M. Ulrey, D. Palumbo, D. Nicol","doi":"10.1109/RAMS.1996.500681","DOIUrl":"https://doi.org/10.1109/RAMS.1996.500681","url":null,"abstract":"This paper is a follow-on to a previous paper (Nicol et al., see ibid., 1995), in which a new reliability tool called reliability performance module (RPM) was described. Since that time, RPM has been used to perform a safety analysis trade study of the primary flight control system (PFCS) architectures proposed for the joint NASA/Boeing fly-by-light/power-by-wire (FBL/PBW) airplane. The purposes of this paper are to: relate experiences and lessons learned from using RPM on the FBL/PBW safety analysis; and present the results of the safety analysis. The conclusions are that: RPM is a powerful tool for performing reliability analyses of complex systems; and the proposed FBL/PBW PFCS architectures meet all of the safety requirements except for one related to spoilers.","PeriodicalId":393833,"journal":{"name":"Proceedings of 1996 Annual Reliability and Maintainability Symposium","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1996-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127810660","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Nuclear power plant core-protection-calculator reliability analysis 核电厂堆芯保护计算器可靠性分析
Proceedings of 1996 Annual Reliability and Maintainability Symposium Pub Date : 1996-01-22 DOI: 10.1109/RAMS.1996.500651
Y. Lukic
{"title":"Nuclear power plant core-protection-calculator reliability analysis","authors":"Y. Lukic","doi":"10.1109/RAMS.1996.500651","DOIUrl":"https://doi.org/10.1109/RAMS.1996.500651","url":null,"abstract":"This paper describes a study performed in support of the decision-making process regarding possible replacement/upgrade of the core protection calculator system (CPCS) at the Pale Verde nuclear generating station. Here, the authors present the methodology and results of a CPCS reliability study performed to: (a) calculate the frequency of CPCS hardware failure induced spurious reactor trips; (b) provide a qualitative basis for assessing whether the current reliability may be reasonably expected to be maintained during the forty year design life of the system; and (c) provide recommendations to help maintain system reliability into the future.","PeriodicalId":393833,"journal":{"name":"Proceedings of 1996 Annual Reliability and Maintainability Symposium","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1996-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134072390","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Reliability evaluation: a field experience from Motorola's cellular base transceiver systems 可靠性评估:摩托罗拉蜂窝基站收发器系统的现场经验
Proceedings of 1996 Annual Reliability and Maintainability Symposium Pub Date : 1996-01-22 DOI: 10.1109/RAMS.1996.500685
R. Bothwell, R. Donthamsetty, Z. Kania, R. Wesoloski
{"title":"Reliability evaluation: a field experience from Motorola's cellular base transceiver systems","authors":"R. Bothwell, R. Donthamsetty, Z. Kania, R. Wesoloski","doi":"10.1109/RAMS.1996.500685","DOIUrl":"https://doi.org/10.1109/RAMS.1996.500685","url":null,"abstract":"The initial predicted MTBF with four hours MTTR, for a base transceiver system (BTS) is 4.0/5.65 years (MIL217/Bellcore standards). With the first 12 months of commercial operation, with actual field data, the MTBF is calculated to be 8.26 years (Bellcore), which is almost double the initial predicted reliability level. The improved manufacturing techniques with (six sigma quality), advanced system test methods, removal of all defective units in early stages of deployment resulted in tremendous reliability growth which exceeded the initial expected reliability. The downtime per year has decreased from 42 min/yr. to 29 min/yr. and the BTS availability has increased from 99.993% to 99.995%, or 5.39 sigma. Further refinement in the reliability is possible by introducing the following steps: (1) establish a minimum qualifying MTBF level for each component of each board; (2) validate the MTBF calculation methodology of vendor of each component; (3) improve MTBF of all weak FRUs by introducing redundancy schemes within each board; (4) introduce individual execution paths for each sector within a BTS; (5) continuous quality improvement techniques to eliminate escaping defects; (6) and establish BTS (HW and SW) stability level with an established release criteria.","PeriodicalId":393833,"journal":{"name":"Proceedings of 1996 Annual Reliability and Maintainability Symposium","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1996-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117142089","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
An alternative method of analyzing multi-stress multi-level life and accelerated life tests 一种分析多应力多级寿命和加速寿命试验的替代方法
Proceedings of 1996 Annual Reliability and Maintainability Symposium Pub Date : 1996-01-22 DOI: 10.1109/RAMS.1996.500647
D. Dietrich, T. Mazzuchi
{"title":"An alternative method of analyzing multi-stress multi-level life and accelerated life tests","authors":"D. Dietrich, T. Mazzuchi","doi":"10.1109/RAMS.1996.500647","DOIUrl":"https://doi.org/10.1109/RAMS.1996.500647","url":null,"abstract":"In the study of life testing, it has been shown that multiple stresses and multiple stress levels are important features to exploit for better inference. In addition, the incorporating of design of experiments concepts in multi-level, multi-stress life and accelerated life tests is more frequently being advocated in the military-industrial community. The benefits of efficient testing by fractional factorial designs and the ability to estimate the effects of the stresses and their possible interactions, provides reason to investigate the combination of design of experiment techniques with multi-stress testing. However, the need for an analysis method that requires neither the 3 or 4 replications of each test cell nor the calculation of pseudo cell MTTFs, is both necessary and obvious. In this paper, some statistical problems that occur in the use of standard ANOVA and regression analysis technique for the analysis of these type of test results are identified. In addressing these problems, an alternative Bayesian analysis procedure is proposed.","PeriodicalId":393833,"journal":{"name":"Proceedings of 1996 Annual Reliability and Maintainability Symposium","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1996-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122859265","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Relating operational software reliability and workload: results from an experimental study 相关的操作软件可靠性和工作量:实验研究的结果
Proceedings of 1996 Annual Reliability and Maintainability Symposium Pub Date : 1996-01-22 DOI: 10.1109/RAMS.1996.500658
A. Goel
{"title":"Relating operational software reliability and workload: results from an experimental study","authors":"A. Goel","doi":"10.1109/RAMS.1996.500658","DOIUrl":"https://doi.org/10.1109/RAMS.1996.500658","url":null,"abstract":"This paper presents some results from an experimental and analytical study to investigate the failure behavior of operational software for several types of workload. The authors are primarily interested in the so-called highly reliable software where enough evidence exists to indicate a lack of known faults. For purposes of this study, a \"gold\" version of a well known program was used in the experimental study. Judiciously selected errors were introduced, one at a time, and each mutated program was executed for three types of workload: constant; random; and systematically varying. Analytical analyses of the resulting failures were undertaken and are summarized here. The case when workload is random is of particular interest in this paper. An analytical model for the resulting failure phenomenon based on the Wald equation is found to give excellent results.","PeriodicalId":393833,"journal":{"name":"Proceedings of 1996 Annual Reliability and Maintainability Symposium","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1996-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128930305","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Affordability studies using probability of failure for complex aerospace systems 使用失效概率对复杂航空航天系统进行可承受性研究
Proceedings of 1996 Annual Reliability and Maintainability Symposium Pub Date : 1996-01-22 DOI: 10.1109/RAMS.1996.500674
B.L. Krabbe, H. Rolén
{"title":"Affordability studies using probability of failure for complex aerospace systems","authors":"B.L. Krabbe, H. Rolén","doi":"10.1109/RAMS.1996.500674","DOIUrl":"https://doi.org/10.1109/RAMS.1996.500674","url":null,"abstract":"The ability to apply extensive R&M analysis while a design is still plastic, has the potential to provide dramatic cost savings during new product development. Modem R&M analysis tools that are fully integrated with the other engineering analysis tools, can provide this capability. Since no new aerospace development is truly entirely new, with as much as 85% of its components having been used in other products, the process of moving R&M analysis to an earlier portion of the concept development effort is a matter of integrating extensive component libraries with existing analysis algorithms. When these ingredients are combined with a modern graphical users interface (GUI), it becomes possible to quickly characterize large complex aerospace systems with sufficient detail to identify the significant R&M drivers. Cost savings are also realized in the increased productivity of the individual analyst. Tools like the Automated Concurrent Engineering Synthesis- Advanced Reliability Modeling (ACES-ARM) are having the effect of more affordable designs. Other cost advantages in using ACES-ARM are the reduction of resources (personnel and time) to perform R&M analysis, and a significant reduction in the amount of training required to run the ACES models. Improved inter-engineering discipline communication also reduces the time and effort required to conceive and simulate a new aerospace product. The time from drawing board to ramp is therefore reduced. The paper describes the use of ACES-ARM.","PeriodicalId":393833,"journal":{"name":"Proceedings of 1996 Annual Reliability and Maintainability Symposium","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1996-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132473134","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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