Proceedings of 1996 Annual Reliability and Maintainability Symposium最新文献_第3页

Continuous state reliability analysis 连续状态可靠性分析

Proceedings of 1996 Annual Reliability and Maintainability Symposium Pub Date : 1996-01-22 DOI: 10.1109/RAMS.1996.500670

Kai Yang, Jianan Xue

引用次数: 93

Software Reliability, Availability, and Maintainability Engineering System (SOFT-RAMES) 软件可靠性、可用性和可维护性工程系统(SOFT-RAMES)

Proceedings of 1996 Annual Reliability and Maintainability Symposium Pub Date : 1996-01-22 DOI: 10.1109/RAMS.1996.500680

B. Edson, B. Hansen, P. Larter

引用次数: 5

Reliability analysis using the ADEPT-REST interface 使用ADEPT-REST接口进行可靠性分析

Proceedings of 1996 Annual Reliability and Maintainability Symposium Pub Date : 1996-01-22 DOI: 10.1109/RAMS.1996.500645

R. Rao, A. Rahmam, B.W. Johnson

{"title":"Reliability analysis using the ADEPT-REST interface","authors":"R. Rao, A. Rahmam, B.W. Johnson","doi":"10.1109/RAMS.1996.500645","DOIUrl":"https://doi.org/10.1109/RAMS.1996.500645","url":null,"abstract":"The Advanced Design Environment Prototype Tool (ADEPT) brings dependability analysis and trade-offs into the mainstream of the design process. ADEPT models are constructed using a collection of predefined library elements, called ADEPT modules. Each ADEPT module has an unambiguous mathematical definition in the form of a colored Petri net (CPN) and a corresponding VHSIC (very high speed integrated circuit) hardware description language (VHDL) description. One of the key features of ADEPT is that the designer need deal with only one model of the system, the ADEPT model, from which alternate representations, for performance and dependability analysis, are derived using provably correct transformations. The use of a single model eliminates the problem of inconsistency between the different models used to perform system-level analysis and trade-offs. The ADEPT toolset supports several simulation and analytical based approaches to dependability analysis of ADEPT models. The focus of this paper is on describing an approach to integrating the ADEPT-VHDL simulation model and the Reliability Estimation System Testbed (REST) engine in order to estimate system reliability from ADEPT models. This paper presents an overview of the ADEPT methodology, the ADEPT-REST interface, and examples which illustrate the capabilities of the methodology.","PeriodicalId":393833,"journal":{"name":"Proceedings of 1996 Annual Reliability and Maintainability Symposium","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1996-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131581510","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

Proposed new DoD standard for product acceptance 提出新的产品验收DoD标准

Proceedings of 1996 Annual Reliability and Maintainability Symposium Pub Date : 1996-01-22 DOI: 10.1109/RAMS.1996.500637

D. Ermer, D. Kedzie

引用次数: 1

Inferring coverage probabilities by optimum 3-stage sampling 通过最优的三阶段抽样来推断覆盖概率

Proceedings of 1996 Annual Reliability and Maintainability Symposium Pub Date : 1996-01-22 DOI: 10.1109/RAMS.1996.500643

C. Constantinescu

{"title":"Inferring coverage probabilities by optimum 3-stage sampling","authors":"C. Constantinescu","doi":"10.1109/RAMS.1996.500643","DOIUrl":"https://doi.org/10.1109/RAMS.1996.500643","url":null,"abstract":"Reliability assessment is an important step in the development of fault-tolerant computing systems. Availability, MTTF, and, in general, any reliability measure is determined by the system ability to handle faults and errors and the rate of occurrence of these events. A special parameter, the coverage probability, provides information about the effectiveness of the fault tolerance mechanisms embedded into the system. Practically, physical or simulated fault injection experiments are conducted for evaluating the coverage. Unfortunately, the extremely large number of events which can perturb the operation of a computing system makes exhaustive testing intractable. As a consequence, statistical inference has been employed to derive meaningful results after performing a relatively small number of fault injection experiments. This paper presents a new method for inferring the coverage probability by means of optimum 3-stage sampling. A three-dimensional space of events is considered. It is represented by the cross product of system inputs, times of injection, and fault locations. The fault injection consists of a pilot experiment followed by the main injection experiment. The sample size of the main experiment is chosen to minimize the cost of the fault injection for a fixed value of the variance. This approach is used for estimating the coverage probability of a hypothetical fault-tolerant system. Based on our experiments, we conclude that the optimum 3-stage sampling method is especially useful when a low variance of the coverage probability is required.","PeriodicalId":393833,"journal":{"name":"Proceedings of 1996 Annual Reliability and Maintainability Symposium","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1996-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131723919","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 6

Fault tree analysis and binary decision diagrams 故障树分析和二元决策图

Proceedings of 1996 Annual Reliability and Maintainability Symposium Pub Date : 1996-01-22 DOI: 10.1109/RAMS.1996.500665

Roslyn M. Sinnamon, John Andrews

{"title":"Fault tree analysis and binary decision diagrams","authors":"Roslyn M. Sinnamon, John Andrews","doi":"10.1109/RAMS.1996.500665","DOIUrl":"https://doi.org/10.1109/RAMS.1996.500665","url":null,"abstract":"Fault tree analysis is now commonly used to assess the adequacy, in reliability terms, of industrial systems. For complex systems, an analysis may produce thousands of combinations of events which can cause system failure (minimal cut sets). The determination of these minimal cut sets can be a very time consuming process even on modern high speed digital computers. Also, if the fault tree has many minimal cut sets, calculating the exact top event probability will require extensive calculations. For many complex fault trees this requirement is beyond the capability of the available machines, thus approximation techniques need to be introduced resulting in loss of accuracy. This paper describes the use of a binary decision diagram for fault tree analysis and some ways in which it can be efficiently implemented on a computer. The work to date shows a substantial improvement in computational effort for large, complex fault trees analysed with this method in comparison to the traditional approach. The binary decision diagram method has the additional advantage that as approximations are not required, exact calculations for the top event parameters can be performed.","PeriodicalId":393833,"journal":{"name":"Proceedings of 1996 Annual Reliability and Maintainability Symposium","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1996-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115625875","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 65

Designing for fault-tolerance in the commercial environment 商业环境中的容错设计

Proceedings of 1996 Annual Reliability and Maintainability Symposium Pub Date : 1996-01-22 DOI: 10.1109/RAMS.1996.500671

M. Karyagina

{"title":"Designing for fault-tolerance in the commercial environment","authors":"M. Karyagina","doi":"10.1109/RAMS.1996.500671","DOIUrl":"https://doi.org/10.1109/RAMS.1996.500671","url":null,"abstract":"Fault-tolerant techniques have been successfully used for implementing highly reliable electronic systems. There is a range of fault-tolerant techniques to cater for any desired level of fault-tolerance. However, only cost-effective techniques can be used for commercial systems. The cost of implementing fault-tolerance can be estimated from the extra hardware required. The possible savings to the user can be estimated from the cost of \"prevented failures\". To estimate the cost of electronic failures to the user of computer numerically controlled (CNC) machines, maintenance records from several machine tools were analysed. The results of the study show that electronic failures constitute less than 10% of all failures of CNC machines. However, they top the list of average repair costs for different failure categories. Permanent electronic failures also have longest down-times and may result in substantial losses. Fault-tolerance techniques can be used to make machine controllers more reliable. The challenge is how to do it cost-effectively. Apart from the original investment, some fault-tolerant implementations increase maintenance expenses thus offsetting the benefits to the user. An example of the cost-benefit analysis for a double-redundant system shows how the major components of the life cycle cost change depending on the implementation.","PeriodicalId":393833,"journal":{"name":"Proceedings of 1996 Annual Reliability and Maintainability Symposium","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1996-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126126104","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 10

FMEA automation for the complete design process FMEA自动化完成整个设计过程

Proceedings of 1996 Annual Reliability and Maintainability Symposium Pub Date : 1996-01-22 DOI: 10.1109/RAMS.1996.500638

T. A. Montgomery, D. Pugh, S.T. Leedham, S.R. Twitchett

{"title":"FMEA automation for the complete design process","authors":"T. A. Montgomery, D. Pugh, S.T. Leedham, S.R. Twitchett","doi":"10.1109/RAMS.1996.500638","DOIUrl":"https://doi.org/10.1109/RAMS.1996.500638","url":null,"abstract":"Performing an FMEA during the design stage is a valuable technique for improving the reliability of a product. Unfortunately, the traditional brainstorming approach is also very tedious, time consuming, and error prone. Automating the process promises the generation of a more complete, consistent FMEA worksheet in a fraction of the time currently required. However, to be truly valuable, this automation must follow the product though the entire design cycle at each level of design: architecture; subsystem; and component. This paper presents an FMEA automation approach that spans the entire design cycle for electrical/electronic circuits. Brainstorming is replaced by computer simulation of failure modes and their effects. Qualitative simulation is used in the early (architectural) stages when design detail is not available. As the design progresses, the qualitative simulation gives way to quantitative simulation. Throughout, the information required to perform the FMEA is gleaned from that used to understand the nominal behavior of the circuit; thus the relief from brainstorming is not offset by a new modeling burden. Sample results from software supporting this approach are presented.","PeriodicalId":393833,"journal":{"name":"Proceedings of 1996 Annual Reliability and Maintainability Symposium","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1996-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125166587","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 43

Environmental stress screening for a massively parallel vision computer 大规模并行视觉计算机的环境应力筛选

Proceedings of 1996 Annual Reliability and Maintainability Symposium Pub Date : 1996-01-22 DOI: 10.1109/RAMS.1996.500659

A. Kostić, R. Wallace

引用次数: 1

Planning and optimizing environmental stress screening 规划和优化环境应力筛选

Proceedings of 1996 Annual Reliability and Maintainability Symposium Pub Date : 1996-01-22 DOI: 10.1109/RAMS.1996.500662

Y. Mok, M. Xie

引用次数: 4