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The ARFTG Measurement Comparison Program a Status Report ARFTG测量比较程序状态报告
41st ARFTG Conference Digest Pub Date : 1993-06-01 DOI: 10.1109/ARFTG.1993.327027
J. Burns, R. Judish, K. Wong
{"title":"The ARFTG Measurement Comparison Program a Status Report","authors":"J. Burns, R. Judish, K. Wong","doi":"10.1109/ARFTG.1993.327027","DOIUrl":"https://doi.org/10.1109/ARFTG.1993.327027","url":null,"abstract":"The ARFTG Measurement Comparison Program (MCP) is a method in which a participating facility measures a set of artifacts to compare their measurement capibilities against the combined efforts of a large number of participants. Although no accuracy statements may be made about any of the measurements, the use of statistics will allow valid conclusions to be drawn. The unique features of the ARFTG MCP kit are: the first wide area comparison of a large amount of measurement data, use of 81SneakerNet81 to form a global Non-Touching Area Network (NAN), rapid analysis of measurement results (less than two week turn around time), easy to use and understand tabular and graphical information, simple and low cost to participate, plus direct applications to TQM and IS0 9000.","PeriodicalId":388026,"journal":{"name":"41st ARFTG Conference Digest","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123034753","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
The Reflection Analyzer - Architecture and Implementation 反射分析器——体系结构和实现
41st ARFTG Conference Digest Pub Date : 1993-06-01 DOI: 10.1109/ARFTG.1993.327015
G. Hjipieris, C. Potter
{"title":"The Reflection Analyzer - Architecture and Implementation","authors":"G. Hjipieris, C. Potter","doi":"10.1109/ARFTG.1993.327015","DOIUrl":"https://doi.org/10.1109/ARFTG.1993.327015","url":null,"abstract":"","PeriodicalId":388026,"journal":{"name":"41st ARFTG Conference Digest","volume":"131 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116906282","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An Automated Non-Linear Transistor Characterization System with a High-Level Language User-Interface for Easy Control, Visualization and Data Management 一个自动化的非线性晶体管特性系统，具有高级语言用户界面，易于控制，可视化和数据管理
41st ARFTG Conference Digest Pub Date : 1993-06-01 DOI: 10.1109/ARFTG.1993.327014
F. Ghannouchi, A. Kouki, F. Beauregard
{"title":"An Automated Non-Linear Transistor Characterization System with a High-Level Language User-Interface for Easy Control, Visualization and Data Management","authors":"F. Ghannouchi, A. Kouki, F. Beauregard","doi":"10.1109/ARFTG.1993.327014","DOIUrl":"https://doi.org/10.1109/ARFTG.1993.327014","url":null,"abstract":"In this paper, a system for the extensive non-linear characterization of microwave transistors is presented. The high level language user interface for its automatic control and near real time visualization and management of the measured data is highlighted. Some descriptive pictures and experimental results are presented to illustrate the versatility of the system and the efficacy of the interfacing software.","PeriodicalId":388026,"journal":{"name":"41st ARFTG Conference Digest","volume":"57 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115926447","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Design Considerations for Digital Interconnects in Lossy Dielectric Medium 损耗介质中数字互连的设计考虑
41st ARFTG Conference Digest Pub Date : 1993-06-01 DOI: 10.1109/ARFTG.1993.327025
A. Agrawal
{"title":"Design Considerations for Digital Interconnects in Lossy Dielectric Medium","authors":"A. Agrawal","doi":"10.1109/ARFTG.1993.327025","DOIUrl":"https://doi.org/10.1109/ARFTG.1993.327025","url":null,"abstract":"The design considerations for high speed digital interconnects in a printed circuit board are presented. The frequency depepndent transmission line parameters and lossy dielectric medium are considered to characterize a transmission line. A study case is considered by presenting the design considerations for microstrip printed circuit line embedded in a homogeneous dielectric medium.","PeriodicalId":388026,"journal":{"name":"41st ARFTG Conference Digest","volume":"66 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116335114","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Full characterization of low-noise HEMTs using only noise figure measurements 仅使用噪声系数测量的低噪声hemt的全面表征
41st ARFTG Conference Digest Pub Date : 1993-06-01 DOI: 10.1109/ARFTG.1993.327012
A. Caddemi, G. Martines, M. Sannino
{"title":"Full characterization of low-noise HEMTs using only noise figure measurements","authors":"A. Caddemi, G. Martines, M. Sannino","doi":"10.1109/ARFTG.1993.327012","DOIUrl":"https://doi.org/10.1109/ARFTG.1993.327012","url":null,"abstract":"A method for the complete characterization of microwave transistors in terms of noise, gain and scattering parameters using a computer-controlled noise figure measuring set-up only is presented. Selection of the optimum measuring conditions, all the steps of the experimental procedure, the data collecting and processing to derive all the parameters, are fully driven by an original (unpublished) software, even without the presence of an (unskilled) operator. Results are presented about the complete characterization of a series of ten pseudomorphicHEMTs in the 8-16 GHz range. The S-parameters are also compared with those measured by an ANA.","PeriodicalId":388026,"journal":{"name":"41st ARFTG Conference Digest","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128959393","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
ARFTG Mailing and Membership List as of 08/13/93 截至1993年8月13日的ARFTG邮件和会员名单
41st ARFTG Conference Digest Pub Date : 1900-01-01 DOI: 10.1109/arftg.1993.327029
Arftg Mailing
{"title":"ARFTG Mailing and Membership List as of 08/13/93","authors":"Arftg Mailing","doi":"10.1109/arftg.1993.327029","DOIUrl":"https://doi.org/10.1109/arftg.1993.327029","url":null,"abstract":"94928 USA COPYRIGHT 1993 ARFTG ALL RIGHTS RESERVED MEMBERSHIP STATUS: MEM=CURRENT MEMBER HON=HONORARY MEMBER INFO=HEMBERSHIP INFO REQUESTED EXH=EXHIBITOR PRES=PRESS XPIR=MEMBERSHIP UHlCH EXPIRES PRIOR TO THE NEXT MEETING NONM=MEMBERSHIP WHICH PREVIOUSLY EXPIRED RTS=MAIL RETURNED AS UNDELIVERABLE NEED A GOOD ADDRESS EXEC=EXECUTIVE COMMITTEE INFO, XPIR & NONM STATUS, PLEASE SEND $25 DUES NOU OR REGISTER AS NON-MEMBER AT THE NEXT CONFERENCE","PeriodicalId":388026,"journal":{"name":"41st ARFTG Conference Digest","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127694126","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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