41st ARFTG Conference Digest最新文献

On The Design of New Integrated Microprobes (NIMPs) for Non-Linear On-Wafer Device Characterization 用于非线性晶圆器件表征的新型集成微探针(NIMPs)的设计

41st ARFTG Conference Digest Pub Date : 1993-06-18 DOI: 10.1109/ARFTG.1993.327020

Y. Xu, D. Maurin, K. Wu, B. Huyart, D. Klemer, R. Bosisio

引用次数: 1

Lessons Learned on a Lan 局域网的经验教训

41st ARFTG Conference Digest Pub Date : 1993-06-18 DOI: 10.1109/ARFTG.1993.327026

J. Burns

引用次数: 1

Hybrid Inductor Modeling at L-Band using 1-Port Fixtured S-Parameter Measurements 混合电感在l波段建模使用1端口固定s参数测量

41st ARFTG Conference Digest Pub Date : 1993-06-01 DOI: 10.1109/ARFTG.1993.327024

W. Gaiewski, L. Dunleavy, L. Geis

{"title":"Hybrid Inductor Modeling at L-Band using 1-Port Fixtured S-Parameter Measurements","authors":"W. Gaiewski, L. Dunleavy, L. Geis","doi":"10.1109/ARFTG.1993.327024","DOIUrl":"https://doi.org/10.1109/ARFTG.1993.327024","url":null,"abstract":"Methods for deriving accurate L-band inductor models using 1-port fixtured S-parameter measurements are presented, along with examples of modeled inductor data. The modeled inductors include both surface mount \" chip\" inductors with nominal values ranging from 4.7nH to 330nH, and wire-wound \" leaded\" inductors with nominal values from 7.5nH to 470nH. The test fixture for the surface mount inductors consists of a CoilCraft 1-port coaxial fixture, whereas a modified SMA connector was used as a test fixture for the leaded inductors. In both cases, the measurements were taken using an HP8510B network analyzer, to allow for careful modeling of the fixture. The fixture models were used to de-embed the time-delay and energy storage effects of the fixtures from the coaxially calibrated HP8510 measurements of the fixtured inductors. Using EESof's Libra CAD package and de-embedded 1-port S-parameter data, models were developed for 33 samples of 21 inductance values of chip inductors, and 22 samples of leaded inductors. The models are seen to fit the measured data over a broad band, from low RF through resonance. Models for devices which self-resonate above 1 GHz maintain close tracking to measured data over the L-band (1-2 GHz). TRL calibrated 2-port microstrip measurements of the inductors were performed to verify the models obtained from the 1-port measured data. The 2-port measurement data is seen to track the 1-port measurements well, with some uncertainty caused by the effect of the microstrip mounting gap. Simple lumped/distributed filter circuits employing the inductors also were fabricated and tested.","PeriodicalId":388026,"journal":{"name":"41st ARFTG Conference Digest","volume":" 13","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120834494","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Measurement of Dielectrics and Ferrite Materials 电介质和铁氧体材料的测量

41st ARFTG Conference Digest Pub Date : 1993-06-01 DOI: 10.1109/ARFTG.1993.327016

H. Stinehelfer

引用次数: 0

A Novel Procedure for Network Analyzer Calibration and Verification 一种新的网络分析仪校准与验证程序

41st ARFTG Conference Digest Pub Date : 1993-06-01 DOI: 10.1109/ARFTG.1993.327013

V. Adamian

引用次数: 24

Automated Testing and Statistical Process Control - From Wafer to Product 自动化测试和统计过程控制-从晶圆到产品

41st ARFTG Conference Digest Pub Date : 1993-06-01 DOI: 10.1109/ARFTG.1993.327017

D. Glajchen, V. Du, Bob Goldsand, D. Manoogian, Andreas Tsafos

{"title":"Automated Testing and Statistical Process Control - From Wafer to Product","authors":"D. Glajchen, V. Du, Bob Goldsand, D. Manoogian, Andreas Tsafos","doi":"10.1109/ARFTG.1993.327017","DOIUrl":"https://doi.org/10.1109/ARFTG.1993.327017","url":null,"abstract":"In supporting both low-noise and power measurement requirements, many economies of both scale and scope can be utilized. With the increased emphasis today on low-cost products with highly repeatable performance, an integrated approach to on-wafer, packaged and module level characterization is essential. Use of a distributed network of controllers feeding a common database across a network allows the standardization of statistical calculations across products, and rapid response to performance variations in new products. At the wafer level, DC parametric data taken from the HP4142 parametric analyzer is sorted on the fly, and then stored on disk, using a systematic naming system based on the wafer and run numbers. Similarly, noise and s-parameter data taken from the noise figure Summit AutoProber, along with the site location identifiers is also stored on disk using similar naming conventions. Power on-wafer will also soon be available, and pulse power data will be added after that. At the module test level, when the devices are inserted into modules or amplifiers, each product has its data stored in a separate directory in ASCII format, for retrieval later. The module data can then be imported into a relational database such as Paradox, where multiple tables are appropriately keyed in order to link them, and to maintain maximum database integrity by automatically updating the data for retested modules. A wide range of statistics or correlation tests can then be run, comparing the wafer level performance to the module level for particular wafers, based on highly flexible criteria.","PeriodicalId":388026,"journal":{"name":"41st ARFTG Conference Digest","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129411487","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

The Acquisition and Analysis of Microwave Characterization Data for Process Control and the Development of Statistical Design Tools 过程控制微波特性数据的采集与分析及统计设计工具的开发

41st ARFTG Conference Digest Pub Date : 1993-06-01 DOI: 10.1109/ARFTG.1993.327023

E. Schirmann, M. CdeBaca, M. Golio, Monte Miller, G. Norris

引用次数: 1

An Automated W-Band On-Wafer Noise Figure Measurement System 一种自动w波段晶圆上噪声系数测量系统

41st ARFTG Conference Digest Pub Date : 1993-06-01 DOI: 10.1109/ARFTG.1993.327019

S.-I Chen, D. C. Yang, Huei Wang, K. Hayashibara, E. Godshalk, B. Allen

引用次数: 10

Calibration and Measurement Considerations for Deriving Accurate Temperature Dependent Equivalent Circuits 导出精确的温度相关等效电路的校准和测量考虑

41st ARFTG Conference Digest Pub Date : 1993-06-01 DOI: 10.1109/ARFTG.1993.327022

J. Pence, R. Anholt

引用次数: 3

Applications of multidimensional large- and small-signal impedances and S-parameters 多维大、小信号阻抗和s参数的应用

41st ARFTG Conference Digest Pub Date : 1993-06-01 DOI: 10.1109/ARFTG.1993.327021

M. Odyniec

引用次数: 1