发布求助
文献互助 智能选刊 最新文献

2021 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)最新文献

筛选
英文 中文
Recommendations for the Usage of Design Models in Aviation Software 航空软件设计模型使用建议
2021 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW) Pub Date : 2021-10-01 DOI: 10.1109/ISSREW53611.2021.00044
Andre Sarkis, Johnny Cardoso Marques, L. Dias
{"title":"Recommendations for the Usage of Design Models in Aviation Software","authors":"Andre Sarkis, Johnny Cardoso Marques, L. Dias","doi":"10.1109/ISSREW53611.2021.00044","DOIUrl":"https://doi.org/10.1109/ISSREW53611.2021.00044","url":null,"abstract":"The usage of Model-based Development is increasing in the aviation industry. Currently, RTCA DO-178C and its supplementary document RTCA DO-331 provide specific guidance for the usage of models during aviation software development. This work presents recommendations for the usage of Design Models in aviation software, ensuring compliance with the RTCA DO-178C and RTCA DO-331. The five recommendations guide how to use models to satisfy specific objectives associated with Software Architecture and Software Low-level Requirements, using Model-driven Design. Our work also assesses the recommendations and applies a case study in a specific scenario where Design Models are developed from textual Software High-level Requirements. We also discuss and include the need for qualification of Autocode Generator Tools and provide traceability to appropriate standards.","PeriodicalId":385392,"journal":{"name":"2021 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)","volume":"150 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116343955","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
RSDA 2021 Workshop Committees RSDA 2021车间委员会
2021 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW) Pub Date : 2021-10-01 DOI: 10.1109/issrew53611.2021.00019
{"title":"RSDA 2021 Workshop Committees","authors":"","doi":"10.1109/issrew53611.2021.00019","DOIUrl":"https://doi.org/10.1109/issrew53611.2021.00019","url":null,"abstract":"","PeriodicalId":385392,"journal":{"name":"2021 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125864112","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IWSF+SHIFT 2021 Workshop Keynotes IWSF+SHIFT 2021研讨会主题演讲
2021 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW) Pub Date : 2021-10-01 DOI: 10.1109/issrew53611.2021.00022
{"title":"IWSF+SHIFT 2021 Workshop Keynotes","authors":"","doi":"10.1109/issrew53611.2021.00022","DOIUrl":"https://doi.org/10.1109/issrew53611.2021.00022","url":null,"abstract":"","PeriodicalId":385392,"journal":{"name":"2021 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121534176","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
When is Continuous Integration Useful? Empirical Study on Team Size and Reporters in Development 持续集成什么时候有用?团队规模与记者发展的实证研究
2021 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW) Pub Date : 2021-10-01 DOI: 10.1109/ISSREW53611.2021.00081
Naoko Imai, H. Washizaki, Naohiko Tsuda, Y. Fukazawa
{"title":"When is Continuous Integration Useful? Empirical Study on Team Size and Reporters in Development","authors":"Naoko Imai, H. Washizaki, Naohiko Tsuda, Y. Fukazawa","doi":"10.1109/ISSREW53611.2021.00081","DOIUrl":"https://doi.org/10.1109/ISSREW53611.2021.00081","url":null,"abstract":"Continuous Integration (CI) is a tool that automatically builds and tests code in software development. Although the benefits of CI have been reported, the situations where CI is highly effective remains unclear. This study investigates the effectiveness of CI on issue resolution duration under different conditions. The results indicate that the larger teams may control the lengthening of the issue resolution duration by using CI.","PeriodicalId":385392,"journal":{"name":"2021 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130958759","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Diktat: Lightweight Static Analysis for Kotlin 要求:Kotlin的轻量级静态分析
2021 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW) Pub Date : 2021-10-01 DOI: 10.1109/ISSREW53611.2021.00103
A. Kuleshov, Petr Trifanov, Vladislav Frolov, Guangtai Liang
{"title":"Diktat: Lightweight Static Analysis for Kotlin","authors":"A. Kuleshov, Petr Trifanov, Vladislav Frolov, Guangtai Liang","doi":"10.1109/ISSREW53611.2021.00103","DOIUrl":"https://doi.org/10.1109/ISSREW53611.2021.00103","url":null,"abstract":"Kotlin is a relatively new programming language that is becoming more and more popular year after year. As the global codebase written in Kotlin grows, developers require intelligent solutions for static analysis to prevent code issues. These tools are built on top of different Intermediate Representations (IR), provided by the Kotlin compiler: Program Structure Interface (PSI), new Intermediate Representation (new IR), and Abstract Syntax Tree (AST). However, existing code analysis tools have limitations, including complexity, low configurability, poor performance, and the small number of inspections. To address these limitations, we propose an approach of the lightweight static analysis for Kotlin, which was implemented in the Diktat project. We will also cover industrial problems of static analysis for Kotlin and will review the usage of different IRs for that purpose. Most popular open-source analyzers will be reviewed and compared by quality metrics.","PeriodicalId":385392,"journal":{"name":"2021 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127698957","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Eye Tracking Sensors as a Contactless Interfaces in Wireless Security Protocols 眼动追踪传感器作为无线安全协议中的非接触式接口
2021 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW) Pub Date : 2021-10-01 DOI: 10.1109/ISSREW53611.2021.00084
M. Ogiela, L. Ogiela
{"title":"Eye Tracking Sensors as a Contactless Interfaces in Wireless Security Protocols","authors":"M. Ogiela, L. Ogiela","doi":"10.1109/ISSREW53611.2021.00084","DOIUrl":"https://doi.org/10.1109/ISSREW53611.2021.00084","url":null,"abstract":"This paper describes new possibilities of eye tracking technology and sensors application in wireless security protocols especially visual authentication codes. A new technique, which are dedicated to deep semantic analysis based on the registration, processing and analysis of attention attractors and their perception by individual person, will be proposed. Such attractors can be detected on the basis of observation of how attention is focused on some specific features of the examined information groups. The variety of the examined information and data can enable a wide-ranging analysis of the issue discussed here; as a result, can assess the degree to which human attention focuses on the process of meaning interpretation of various cognitive features and observations.","PeriodicalId":385392,"journal":{"name":"2021 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125803300","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Test Case Generation Method of Combinatorial Testing based on τ-way Testing with Adaptive Random Testing 基于τ-way测试和自适应随机测试的组合测试用例生成方法
2021 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW) Pub Date : 2021-10-01 DOI: 10.1109/ISSREW53611.2021.00048
Jinfu Chen, Jingyi Chen, Saihua Cai, Haibo Chen, Chi Zhang, Chuangfei Huang
{"title":"A Test Case Generation Method of Combinatorial Testing based on τ-way Testing with Adaptive Random Testing","authors":"Jinfu Chen, Jingyi Chen, Saihua Cai, Haibo Chen, Chi Zhang, Chuangfei Huang","doi":"10.1109/ISSREW53611.2021.00048","DOIUrl":"https://doi.org/10.1109/ISSREW53611.2021.00048","url":null,"abstract":"Combinatorial testing is an effective software testing technique, which has gained wide attention on industry and academic. It detects faults triggered by the interactions among parameters relevant to software through selection of a reasonably sized set, which consists of the combination of the values of these parameters. However, as the complexity of software system increases, the time cost increases greatly, which leads how to efficiently generate the smallest coverage array under the given input parameter model to become the major sticking points in some scenarios. In order to address this issue, by analyzing existing generation algorithms, it is found that these algorithms are based on the complete input parameter model constructed in the first step of combinatorial testing. This paper proposes a test case generation method of combinatorial testing based on $tau$-way testing and adaptive random testing which test cases can be generated partially using $tau$-way strategy and partially using adaptive random testing by splitting the input parameter model, so as to achieve a balance between effectiveness and efficiency in a specific scenario. To this end, experimental results show that the proposed method has better faults detection ability and the computational overhead of test case generation on subject Tcas program.","PeriodicalId":385392,"journal":{"name":"2021 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127861331","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The protection of LP-WAN Endpoints via TEE: a Chemical Storage Case Study 通过TEE保护LP-WAN端点:一个化学储存案例研究
2021 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW) Pub Date : 2021-10-01 DOI: 10.1109/ISSREW53611.2021.00100
L. Coppolino, S. D'Antonio, Giovanni Mazzeo, L. Romano, Irene Bonetti, Elena Spagnuolo
{"title":"The protection of LP-WAN Endpoints via TEE: a Chemical Storage Case Study","authors":"L. Coppolino, S. D'Antonio, Giovanni Mazzeo, L. Romano, Irene Bonetti, Elena Spagnuolo","doi":"10.1109/ISSREW53611.2021.00100","DOIUrl":"https://doi.org/10.1109/ISSREW53611.2021.00100","url":null,"abstract":"Industrial IoT (IIoT) solutions typically rely on Low-Power Wide Area Network (LP-WAN) protocols to transmit data over long distances while preserving battery life. Regrettably, the distributed nature of LP-WAN deployments and the adoption of managed services make the endpoints —from the field up to the cloud— target of attacks, which could threaten the security and resilience of the infrastructure under monitoring. In this paper, we propose a solution for improving the security of LoRa-based monitoring infrastructures, which is by far the most widely used LP-WAN protocol in the IIoT landscape. We combine two different trusted execution technologies, i.e., ARM TrustZone and Intel SGX, to preserve the chain-of-trust throughout the entire data cycle, i.e. from collection to transmission and processing, and finally to storage. An experimental evaluation is conducted on a real chemical storage infrastructure, managed by Attilio Carmagnani “AC” S.p.A.. We demonstrate the practicability of the proposed approach, i.e. we prove that our solution improves security while also satisfying the performance and energy consumption requirements of a real setup. The technique can be extended to other LP-WAN deployments with minor engineering efforts.","PeriodicalId":385392,"journal":{"name":"2021 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128730010","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Methods for deep learning model failure detection and model adaption: A survey 深度学习模型故障检测与模型自适应方法综述
2021 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW) Pub Date : 2021-10-01 DOI: 10.1109/ISSREW53611.2021.00066
Xiaoyu Wu, Zheng Hu, Ke Pei, Liyan Song, Zhi Cao, Shuyi Zhang
{"title":"Methods for deep learning model failure detection and model adaption: A survey","authors":"Xiaoyu Wu, Zheng Hu, Ke Pei, Liyan Song, Zhi Cao, Shuyi Zhang","doi":"10.1109/ISSREW53611.2021.00066","DOIUrl":"https://doi.org/10.1109/ISSREW53611.2021.00066","url":null,"abstract":"In real-world applications, deep learning models may fail to predict due to service switch, system upgrade, or other environmental changes. One main reason is that the model lacks generalization ability when data distribution changes. To detect model failures in advance, a direct and effective method is to monitor the data distribution in real time. This paper provides a taxonomy of data distribution shift detection methods, which is an important issue in model failure perception, and also gives a framework on model adaption and generalization under distribution shift scenario.","PeriodicalId":385392,"journal":{"name":"2021 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)","volume":"196 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133717719","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Message from the RSDA 2021 Workshop Chairs 来自RSDA 2021工作坊主席的信息
2021 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW) Pub Date : 2021-10-01 DOI: 10.1109/issrew53611.2021.00018
{"title":"Message from the RSDA 2021 Workshop Chairs","authors":"","doi":"10.1109/issrew53611.2021.00018","DOIUrl":"https://doi.org/10.1109/issrew53611.2021.00018","url":null,"abstract":"","PeriodicalId":385392,"journal":{"name":"2021 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)","volume":"172 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133614773","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
首页 上一页 下一页 尾页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：481959085
Book学术官方微信