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International Conference for Convergence for Technology-2014最新文献

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A hybrid feature extraction scheme for Off-line English numeral recognition 一种用于离线英语数字识别的混合特征提取方案
International Conference for Convergence for Technology-2014 Pub Date : 2014-04-06 DOI: 10.1109/I2CT.2014.7092312
B. Prasad, G. Sanyal
{"title":"A hybrid feature extraction scheme for Off-line English numeral recognition","authors":"B. Prasad, G. Sanyal","doi":"10.1109/I2CT.2014.7092312","DOIUrl":"https://doi.org/10.1109/I2CT.2014.7092312","url":null,"abstract":"This paper aims at presenting a rotation invariant feature extraction scheme to support well known result oriented recognizer HMM. Hybrid feature extraction method consists of features due to moment of inertia (FMI) and projection features. Projection features have been applied in case of digits (2 and 3) and for other numerals FMI is introduced. Any recognition system consists of two major components viz. Feature extraction method and recognizer. This paper uses Hidden Markov Model (HMM) as recognizer to recognize Off-line handwritten English numerals due to its inherent specialities and promising results in automatic speech recognition. Our data-base consists of own collected data from people of different ages and CENPARMI data. The percent recognition accuracy of self collected samples and CENPARMI samples have been found to be 91.7% and 91.2% respectively.","PeriodicalId":384966,"journal":{"name":"International Conference for Convergence for Technology-2014","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115729021","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Design aspects and optimization of a microcantilever sensor for chemical detection applications 用于化学检测应用的微悬臂传感器的设计和优化
International Conference for Convergence for Technology-2014 Pub Date : 2014-04-06 DOI: 10.1109/I2CT.2014.7092185
J. Kumar, E. Tetteh
{"title":"Design aspects and optimization of a microcantilever sensor for chemical detection applications","authors":"J. Kumar, E. Tetteh","doi":"10.1109/I2CT.2014.7092185","DOIUrl":"https://doi.org/10.1109/I2CT.2014.7092185","url":null,"abstract":"Microcantilever sensors have attracted considerable attention recently as a promising alternative sensor platform for use in chemical detection. These devices are rapidly making their way into every aspect of modern life. The future is getting smaller, more accurate and quicker. The popularity of these sensors is mostly due to the great advantages they possess. In addition to their small size, these sensors consume very little power and are capable of delivering accurate measurements which are unparalleled with micro-sized sensors. In view of this it is important to take some aspects into account while designing these sensors in order to acheive optimum sensor performance. This paper is therefore aimed at addressing some key design aspects worth considering for optimum performance of these sensors for chemical detection applications.","PeriodicalId":384966,"journal":{"name":"International Conference for Convergence for Technology-2014","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116772096","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Outlier detection based fault-detection algorithm for cloud computing 基于离群点检测的云计算故障检测算法
International Conference for Convergence for Technology-2014 Pub Date : 2014-04-06 DOI: 10.1109/I2CT.2014.7092201
M. Kumar, R. Mathur
{"title":"Outlier detection based fault-detection algorithm for cloud computing","authors":"M. Kumar, R. Mathur","doi":"10.1109/I2CT.2014.7092201","DOIUrl":"https://doi.org/10.1109/I2CT.2014.7092201","url":null,"abstract":"Outlier detection is becoming a recent area of research focus in data mining. In Cloud Computing, we use all resources as a service and these services should be very efficient, robust and corrective. Here we present FDACC (Fault Detection Algorithm for Cloud Computing) for faulty services using outlier detection method that can help to detect accurate and novel faulty services without any knowledge. FDACC implemented on this framework that has three components- cloud nodes, FDS (Fault Detection System) and End User. FDS is connected with end user and n number of nodes in cloud. FDS is able to detect all non-working services as well as detect faulty services and machines in cloud environment.","PeriodicalId":384966,"journal":{"name":"International Conference for Convergence for Technology-2014","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122641063","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
TCAD based study of a novel 24 nm quantum well symmetric IDG NMOS transistor with ultra-low Ioff 基于TCAD的新型24nm量子阱对称IDG超低关断NMOS晶体管研究
International Conference for Convergence for Technology-2014 Pub Date : 2014-04-06 DOI: 10.1109/I2CT.2014.7092215
S. Baishya, Soumen Deb
{"title":"TCAD based study of a novel 24 nm quantum well symmetric IDG NMOS transistor with ultra-low Ioff","authors":"S. Baishya, Soumen Deb","doi":"10.1109/I2CT.2014.7092215","DOIUrl":"https://doi.org/10.1109/I2CT.2014.7092215","url":null,"abstract":"This paper presents the design of a 24 nm symmetric Hetero Channel Si Independent Double Gate (IDG) NMOS transistor with Ge/Si/Ge channel structure (forming a Quantum Well in lateral direction), with elevated Si S/D Structure (also called Raised and Digged S/D Structure), n<sup>+</sup> polysilicon as front and back gate material (Buried Back Gate Structure), High-K Si<sub>3</sub>N<sub>4</sub> spacer in order to suppress SCE's. The dc parameters of the device such as I<sub>on</sub>, I<sub>off</sub>, I<sub>on</sub>/I<sub>off</sub> ratio, subthreshold swing were evaluated for different back gate biasing and I<sub>off</sub> and subthreshold swing were found to be optimum at back gate biasing of -0.6 V. The effect different front gate metals was also evaluated using TCAD simulations and it is observed that Molybdenum serves as an excellent front gate metal with extremely low I<sub>off</sub> ~ 2 pA/μm at back gate biasing of -0.6 V and subthreshold swing of ~ 135 mV/decade at back gate biasing of 0 V, with quite low I<sub>on</sub> ~ 5×10<sup>-7</sup> A/μm. To improve the on current an undoped channel structure is incorporated with the proposed QW IDG NMOS device, with a slight degradation of I<sub>off</sub> as well as subthreshold swing. The on current is further enhanced by modulating the width of Si-QW in the channel, and it is found that Si-QW of width 11 nm provides optimum dc performance with I<sub>on</sub> ~ 2.02×10<sup>-5</sup> A/μm, I<sub>off</sub> ~ 0.89243 pA/μm and a subthreshold swing of ~108 mV/decade for the back gate biasing voltage of -0.8 V.","PeriodicalId":384966,"journal":{"name":"International Conference for Convergence for Technology-2014","volume":"87 5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128369464","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Congestion detection in Wireless sensor network using neural network 基于神经网络的无线传感器网络拥塞检测
International Conference for Convergence for Technology-2014 Pub Date : 2014-04-06 DOI: 10.1109/I2CT.2014.7092259
Prakul Singhal, Anamika Yadav
{"title":"Congestion detection in Wireless sensor network using neural network","authors":"Prakul Singhal, Anamika Yadav","doi":"10.1109/I2CT.2014.7092259","DOIUrl":"https://doi.org/10.1109/I2CT.2014.7092259","url":null,"abstract":"In Wireless sensor network (WSN), sink nodes are bottleneck of network due to congestion. Congestion deteriorates the overall performance of the system. So congestion detection in a WSN is very vital issue in the present scenario. In this paper, artificial neural network based congestion detection algorithm is developed. The neural network based congestion detection system uses number of participants, buffer occupancy, and traffic rate as input parameters and gives the congestion level as output. A number of NS-2 and MATLAB simulation results show that the proposed scheme accurately detects the congestion level and represents the state of congestion in the WSN.","PeriodicalId":384966,"journal":{"name":"International Conference for Convergence for Technology-2014","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129098818","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 15
Implementation of 32 nm FinFET voltage controlled oscilllator 32纳米FinFET压控振荡器的实现
International Conference for Convergence for Technology-2014 Pub Date : 2014-04-06 DOI: 10.1109/I2CT.2014.7092337
P. Srinivas, Vijay Kumar Pulluri, Chandan Kumar, A. K. Mal
{"title":"Implementation of 32 nm FinFET voltage controlled oscilllator","authors":"P. Srinivas, Vijay Kumar Pulluri, Chandan Kumar, A. K. Mal","doi":"10.1109/I2CT.2014.7092337","DOIUrl":"https://doi.org/10.1109/I2CT.2014.7092337","url":null,"abstract":"As the present trend moving towards the fast working devices, that requires high clock speed with occupying low area and consuming low power. In this paper we discuss the Differences between the frequencies of the Ring oscillators of different stages of 32 nm high-performance of cmos and dual gate 32 nm FinFET. The tuning range of the fifteen stage VCO made up of 32 nm high performance of cmos is compared with VCO made up of dual gate 32 nm FinFET.","PeriodicalId":384966,"journal":{"name":"International Conference for Convergence for Technology-2014","volume":"49 2","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120860776","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A prototype design for microprocessor based on Verilog HDL 基于Verilog HDL的微处理器原型设计
International Conference for Convergence for Technology-2014 Pub Date : 2014-04-06 DOI: 10.1109/I2CT.2014.7092116
Nikunj Hinsu, Digvijaysinh Suryavanshi
{"title":"A prototype design for microprocessor based on Verilog HDL","authors":"Nikunj Hinsu, Digvijaysinh Suryavanshi","doi":"10.1109/I2CT.2014.7092116","DOIUrl":"https://doi.org/10.1109/I2CT.2014.7092116","url":null,"abstract":"Nowadays for developing any embedded system the microprocessor is used extensively, but they comes to any developer as an black-box in which signals are provided from one side and corresponding output is extracted out from other side. So if developer knows what is hardware present inside the processor which he/she is currently using, then it would be helpful for making his/her design simple & optimized. In this paper, we have represented the design and simulation result of basic three elementary modules of microprocessor i.e. ALU, RAM and Instruction decoder and finally combined all three modules using Structural modelling. This four bit processor has been designed as a prototype for designing advanced processors.","PeriodicalId":384966,"journal":{"name":"International Conference for Convergence for Technology-2014","volume":"73 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114797930","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Translating controlled natural language query into SQL query using pattern matching technique 使用模式匹配技术将受控的自然语言查询转换为SQL查询
International Conference for Convergence for Technology-2014 Pub Date : 2014-04-06 DOI: 10.1109/I2CT.2014.7092161
Rajender Kumar, M. Dua
{"title":"Translating controlled natural language query into SQL query using pattern matching technique","authors":"Rajender Kumar, M. Dua","doi":"10.1109/I2CT.2014.7092161","DOIUrl":"https://doi.org/10.1109/I2CT.2014.7092161","url":null,"abstract":"Database is a prime source of information. This information is accessed by a common man who is not able to write complex SQL query. Enabling common users to query databases using natural language and retrieve information from them has been a promising research area. A system is proposed to retrieve data from the database using Hindi language. Our system uses morphological analyzer and word group analyzer to extract the keyword from input Hindi query. Then it uses pattern matching technique to find the type of keyword. Also, it uses the controlled Hindi language interface and suggested query feature to reduce ambiguity and time for entering the Hindi query.","PeriodicalId":384966,"journal":{"name":"International Conference for Convergence for Technology-2014","volume":"124 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124539431","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Rice quality analysis using image processing techniques 利用图像处理技术分析稻米品质
International Conference for Convergence for Technology-2014 Pub Date : 2014-04-06 DOI: 10.1109/I2CT.2014.7092300
Bhagyashree Subhash Mahale, Sapana Korde
{"title":"Rice quality analysis using image processing techniques","authors":"Bhagyashree Subhash Mahale, Sapana Korde","doi":"10.1109/I2CT.2014.7092300","DOIUrl":"https://doi.org/10.1109/I2CT.2014.7092300","url":null,"abstract":"In agricultural industries grain quality evaluation is very big challenge. Quality control is very important in food industry because after harvesting, based on quality parameters food products are classified and graded into different grades. Grain quality evaluation is done manually but it is relative, time consuming, may be varying results and costly. To overcome these limitations and shortcoming image processing techniques is the alternative solution can be used for grain quality analysis. Rice quality is nothing but the combination of physical and chemical characteristics. Grain size and shape, chalkiness, whiteness, milling degree, bulk density and moisture content are some physical characteristics while amylose content, gelatinization temperature and gel consistency are chemical characteristics of rice. The paper presents a solution of grading and evaluation of rice grains on the basis of grain size and shape using image processing techniques. Specifically edge detection algorithm is used to find out the region of boundaries of each grain. In this technique we find the endpoints of each grain and after using caliper we can measure the length and breadth of rice. This method requires minimum time and it is low in cost.","PeriodicalId":384966,"journal":{"name":"International Conference for Convergence for Technology-2014","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126296229","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 26
Metal oxide semiconductor based thin film sensor for nitro aromatic explosive detection 用于硝基芳香炸药探测的金属氧化物半导体薄膜传感器
International Conference for Convergence for Technology-2014 Pub Date : 2014-04-06 DOI: 10.1109/I2CT.2014.7092345
M. Sagar, R. Mudhalwadkar, G. Sonar
{"title":"Metal oxide semiconductor based thin film sensor for nitro aromatic explosive detection","authors":"M. Sagar, R. Mudhalwadkar, G. Sonar","doi":"10.1109/I2CT.2014.7092345","DOIUrl":"https://doi.org/10.1109/I2CT.2014.7092345","url":null,"abstract":"In this study, a proportion of zinc oxide and tin oxide nano-powder was used to fabricate gas sensor in the form of thin film gas sensor. The effect of explosive components at room temperature on the electrical conductivity, sensitivity, response time and recovery time of thin film sensor has been studied. The study revealed that the electrical conductivity of thin film changes with exposure of explosive material. The electrical conductivity of the thin film sensor gives response differently for different explosive components. Characterization of thin film sensor for response of explosive materials is done and can be useful for detection or quantification for homeland security.","PeriodicalId":384966,"journal":{"name":"International Conference for Convergence for Technology-2014","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131593448","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
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