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1976 6th European Microwave Conference最新文献

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Antenna Patterns with Arbitrary Side Lobe Topography 具有任意旁瓣地形的天线图
1976 6th European Microwave Conference Pub Date : 1976-10-01 DOI: 10.1109/EUMA.1976.332287
R. Elliott
{"title":"Antenna Patterns with Arbitrary Side Lobe Topography","authors":"R. Elliott","doi":"10.1109/EUMA.1976.332287","DOIUrl":"https://doi.org/10.1109/EUMA.1976.332287","url":null,"abstract":"A perturbation technique which will modify Taylor-type linear and circular aperture distributions to give sum and difference patterns with arbitrary side lobe topography is described and illustrated by several practical cases. A new technique for discretizing the resulting continuous aperture distributions is presented and shown to be superior to the conventional method of sampling. Experimental support of the theory is referenced for the case of a nineteen element linear slot array. Application to the design of digital filters is indicated.","PeriodicalId":377507,"journal":{"name":"1976 6th European Microwave Conference","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1976-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115657191","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Theoretical and Experimental Analysis of Non-Uniform Microstrip Lines in the Frequency Range 2-18 GHz 2-18 GHz频段非均匀微带线的理论与实验分析
1976 6th European Microwave Conference Pub Date : 1976-10-01 DOI: 10.1109/EUMA.1976.332349
Guglielmo D'lnzeo, F. Giannini, R. Sorrentino
{"title":"Theoretical and Experimental Analysis of Non-Uniform Microstrip Lines in the Frequency Range 2-18 GHz","authors":"Guglielmo D'lnzeo, F. Giannini, R. Sorrentino","doi":"10.1109/EUMA.1976.332349","DOIUrl":"https://doi.org/10.1109/EUMA.1976.332349","url":null,"abstract":"In the field of microwave integrated devices, non-uniform microstrip lines have recently received considerable attention. Among these, with regard to band-width and losses, non-uniform microstrips with a continuously varying cross-section have better characteristics than those having only rough discontinuities. In this work a theoretical analysis of non-uniform microstrip lines, based on a magnetic walls model, is presented. The experiments performed in a wide freque, ncy range have shown a promising agreement with the theory. Both theoretical and experimental behaviour show the existence of transmission and reflection zeros characterizing the filtering properties of structures of this kind.","PeriodicalId":377507,"journal":{"name":"1976 6th European Microwave Conference","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1976-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123135013","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Numerical Solution of Transient Electromagnetic Scattering Problems 瞬变电磁散射问题的数值解
1976 6th European Microwave Conference Pub Date : 1976-10-01 DOI: 10.1109/EUMA.1976.332249
C. Bennett
{"title":"Numerical Solution of Transient Electromagnetic Scattering Problems","authors":"C. Bennett","doi":"10.1109/EUMA.1976.332249","DOIUrl":"https://doi.org/10.1109/EUMA.1976.332249","url":null,"abstract":"A novel computational technique is presented for obtaining the numerical solution of transient electromagnetic scattering problems directly in the time domain. This technique consists of numerically stepping on in time the exact space-time integral equation that represents the solution of the scattering problem. The space-time integral equation and its numerical solution are described. Recent results are presented for convex targets, wires, targets with wires attached, and flat plates. The transient scattering results are compared with direct time domain measurements carried out with sub-nanosecond techniques and shown to be in good agreement. The merits of this time domain technique over more conventional frequency domain approaches are also discussed.","PeriodicalId":377507,"journal":{"name":"1976 6th European Microwave Conference","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1976-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121208138","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Evolution of Communication Systems from Microwave to Optical Frequencies 通信系统从微波到光频率的演变
1976 6th European Microwave Conference Pub Date : 1976-10-01 DOI: 10.1109/EUMA.1976.332303
B. Catania
{"title":"Evolution of Communication Systems from Microwave to Optical Frequencies","authors":"B. Catania","doi":"10.1109/EUMA.1976.332303","DOIUrl":"https://doi.org/10.1109/EUMA.1976.332303","url":null,"abstract":"","PeriodicalId":377507,"journal":{"name":"1976 6th European Microwave Conference","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1976-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127284943","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Integrated Optical Microstructures Examination by Fluorescence 集成光学显微结构荧光检测
1976 6th European Microwave Conference Pub Date : 1976-10-01 DOI: 10.1109/EUMA.1976.332315
A. Roy
{"title":"Integrated Optical Microstructures Examination by Fluorescence","authors":"A. Roy","doi":"10.1109/EUMA.1976.332315","DOIUrl":"https://doi.org/10.1109/EUMA.1976.332315","url":null,"abstract":"In this paper we shall review a method permitting the observation of optical fields propagating in microstructures for integrated optics. This method is based on the observation of the fluorescence emitted by a thin plastic film deposited upon the structure to be examined. Some results concerning the observation of passive waveguides and LiNbO3 diffused waveguides will be presented. In particular transitions between guides of various widths and directional couplers were examined and we will present photographs and quantitative measurements made on these structures.","PeriodicalId":377507,"journal":{"name":"1976 6th European Microwave Conference","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1976-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115087705","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A `Microwave Eye' Can be Almost Human “微波眼”几乎是人类的眼睛
1976 6th European Microwave Conference Pub Date : 1976-10-01 DOI: 10.1109/EUMA.1976.332255
A. Anderson, S. Mawani
{"title":"A `Microwave Eye' Can be Almost Human","authors":"A. Anderson, S. Mawani","doi":"10.1109/EUMA.1976.332255","DOIUrl":"https://doi.org/10.1109/EUMA.1976.332255","url":null,"abstract":"Microwave imagery is commonly accepted to have inherently lower resolution than optical systems produce, and small scale microwave imaging systems should be particularly poor in this respect. Since Man is an optical imaging system, and also the ultimate recognition system, it is interesting to compare his performance with a microwave lens system which remotely images suitably reflecting targets. It is shown that the microwave system resolution can be only one order of magnitude inferior to the human eye-brain response. Given that recognition of objects is performed on their low spatial frequency components, the small scale microwave imaging system is comparable to human performance for simple target shapes.","PeriodicalId":377507,"journal":{"name":"1976 6th European Microwave Conference","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1976-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122054738","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Minimum Resistance Microwave Diodes 最小电阻微波二极管
1976 6th European Microwave Conference Pub Date : 1976-10-01 DOI: 10.1109/EUMA.1976.332237
J. Barrera, R. Curby, D. Defevere, F. Kwan, L. Nevin, R. Solomon
{"title":"Minimum Resistance Microwave Diodes","authors":"J. Barrera, R. Curby, D. Defevere, F. Kwan, L. Nevin, R. Solomon","doi":"10.1109/EUMA.1976.332237","DOIUrl":"https://doi.org/10.1109/EUMA.1976.332237","url":null,"abstract":"Silicon PIN switching diodes and GaAs varactor tuning diodes have demonstrated 100% performance improvements in quality factor Q by using straightforward optimization techniques, device processing innovations and improvements in materials. Analogous design techniques have been applied to both devices, including careful modeling to identify series resistance contributions, and directed process development to reduce these contributions. In both cases, substrate resistance was reduced to a minimum with processes that replaced semiconductor substrate with metal. Total resistance was minimized by analytical calculation to define optimum device geometries.","PeriodicalId":377507,"journal":{"name":"1976 6th European Microwave Conference","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1976-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128301162","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Integral Equation Formulation for Prediction of Far-Field Radiation Patterns from Near-Field Measurements 从近场测量预测远场辐射模式的积分方程公式
1976 6th European Microwave Conference Pub Date : 1976-10-01 DOI: 10.1109/EUMA.1976.332252
T. Birand
{"title":"Integral Equation Formulation for Prediction of Far-Field Radiation Patterns from Near-Field Measurements","authors":"T. Birand","doi":"10.1109/EUMA.1976.332252","DOIUrl":"https://doi.org/10.1109/EUMA.1976.332252","url":null,"abstract":"An integral equation formulation in which the plane wave spectrum functions of a measured aperture appear as the unknowns is presented. Solutions to this equation are obtained by expanding the unknwons into sampling series and enforcing the equation at a finite number of near-field measurement points. Considerable amount of computer time can be saved by using an aperture-synthesis-technique in the near-field measurements. The method is applied to sectoral horns and good agreement between predicted and direct measured patterns is observed.","PeriodicalId":377507,"journal":{"name":"1976 6th European Microwave Conference","volume":"75 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1976-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123843595","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Waveguides for Integrated Optics Formed by Metal Platings 金属镀层集成光学波导
1976 6th European Microwave Conference Pub Date : 1976-10-01 DOI: 10.1109/EUMA.1976.332325
A. Oliner, S. Peng
{"title":"Waveguides for Integrated Optics Formed by Metal Platings","authors":"A. Oliner, S. Peng","doi":"10.1109/EUMA.1976.332325","DOIUrl":"https://doi.org/10.1109/EUMA.1976.332325","url":null,"abstract":"Theoretical analyses and performance results are presented for two waveguides for integrated optics which are formed by metal platings, employing structures similar to those in some modulators or switches. One structure is a slot waveguide, formed by a slot or gap of unplated film on a substrate between two plated regions, for which previous analyses are incorrect for one polarization. The correct analysis shows that for that polarization the modes are leaky and that propagation occurs over a wider frequency range than expected. The other structure is a new one consisting simply of a strip of metal plated on a film on a substrate. Waveguiding with low loss is possible under appropriate conditions because metals at optical frequencies behave as overdense plasmas.","PeriodicalId":377507,"journal":{"name":"1976 6th European Microwave Conference","volume":"74 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1976-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134165796","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Non Linear Analysis of Three Terminal Avalanche Devices 三种终端雪崩装置的非线性分析
1976 6th European Microwave Conference Pub Date : 1976-10-01 DOI: 10.1109/EUMA.1976.332235
M. Lefebvre, G. Salmer, Y. Crosnier, E. Constant
{"title":"Non Linear Analysis of Three Terminal Avalanche Devices","authors":"M. Lefebvre, G. Salmer, Y. Crosnier, E. Constant","doi":"10.1109/EUMA.1976.332235","DOIUrl":"https://doi.org/10.1109/EUMA.1976.332235","url":null,"abstract":"The Influence of a thermionic type injected current on the performances of GaAs IMPATT diodes under large signal conditions is studied. This theoretical approach is developed by using the computer program previously elaborated for high efficiency IMPATT diodes. The parameters used to vary the operating conditions are the r. f. level, injection phase, d.c. current multiplication factor and base collector doping profile. Interesting results can be expected in X band with a transistor-like device in which the transistor effect, avalanche effect and transit time effect are use together.","PeriodicalId":377507,"journal":{"name":"1976 6th European Microwave Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1976-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130719340","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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