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Thermal Management and Communication Virtualization for Reliability Optimization in MPSoCs 用于mpsoc可靠性优化的热管理和通信虚拟化
Dependable Embedded Systems Pub Date : 2020-12-10 DOI: 10.1007/978-3-030-52017-5_8
Victor M. van Santen, H. Amrouch, Thomas Wild, J. Henkel, A. Herkersdorf
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引用次数: 0
Power-Aware Fault-Tolerance for Embedded Systems 嵌入式系统的功率感知容错
Dependable Embedded Systems Pub Date : 2020-12-10 DOI: 10.1007/978-3-030-52017-5_24
M. Salehi, F. Kriebel, Semeen Rehman, M. Shafique
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引用次数: 0
Reliability Analysis and Mitigation of Near-Threshold Voltage (NTC) Caches 近阈值电压(NTC)缓存的可靠性分析与缓解
Dependable Embedded Systems Pub Date : 2020-12-10 DOI: 10.1007/978-3-030-52017-5_13
A. Gebregiorgis, R. Bishnoi, M. Tahoori
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引用次数: 0
Lightweight Software-Defined Error Correction for Memories 轻量级软件定义的存储器纠错
Dependable Embedded Systems Pub Date : 2020-12-10 DOI: 10.1007/978-3-030-52017-5_9
Irina Alam, L. Dolecek, Puneet Gupta
{"title":"Lightweight Software-Defined Error Correction for Memories","authors":"Irina Alam, L. Dolecek, Puneet Gupta","doi":"10.1007/978-3-030-52017-5_9","DOIUrl":"https://doi.org/10.1007/978-3-030-52017-5_9","url":null,"abstract":"","PeriodicalId":372231,"journal":{"name":"Dependable Embedded Systems","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133750317","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Our Perspectives 我们的观点
Dependable Embedded Systems Pub Date : 2020-12-10 DOI: 10.1007/978-3-030-52017-5_25
Jian-Jia Chen, Joerg Henkel
{"title":"Our Perspectives","authors":"Jian-Jia Chen, Joerg Henkel","doi":"10.1007/978-3-030-52017-5_25","DOIUrl":"https://doi.org/10.1007/978-3-030-52017-5_25","url":null,"abstract":"","PeriodicalId":372231,"journal":{"name":"Dependable Embedded Systems","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131316982","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
EM Lifetime Constrained Optimization for Multi-Segment Power Grid Networks 多段电网的EM寿命约束优化
Dependable Embedded Systems Pub Date : 2020-12-10 DOI: 10.1007/978-3-030-52017-5_15
Han Zhou, Zeyu Sun, Sheriff Sadiqbatcha, S. Tan
{"title":"EM Lifetime Constrained Optimization for Multi-Segment Power Grid Networks","authors":"Han Zhou, Zeyu Sun, Sheriff Sadiqbatcha, S. Tan","doi":"10.1007/978-3-030-52017-5_15","DOIUrl":"https://doi.org/10.1007/978-3-030-52017-5_15","url":null,"abstract":"","PeriodicalId":372231,"journal":{"name":"Dependable Embedded Systems","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128005501","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Fault-Tolerant Computing with Heterogeneous Hardening Modes 异构强化模式下的容错计算
Dependable Embedded Systems Pub Date : 2020-12-10 DOI: 10.1007/978-3-030-52017-5_7
F. Kriebel, Faiq Khalid, B. Prabakaran, Semeen Rehman, M. Shafique
{"title":"Fault-Tolerant Computing with Heterogeneous Hardening Modes","authors":"F. Kriebel, Faiq Khalid, B. Prabakaran, Semeen Rehman, M. Shafique","doi":"10.1007/978-3-030-52017-5_7","DOIUrl":"https://doi.org/10.1007/978-3-030-52017-5_7","url":null,"abstract":"","PeriodicalId":372231,"journal":{"name":"Dependable Embedded Systems","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133641813","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
ASTEROID and the Replica-Aware Co-scheduling for Mixed-Criticality 混合临界的小行星与副本感知协同调度
Dependable Embedded Systems Pub Date : 2020-12-10 DOI: 10.1007/978-3-030-52017-5_3
Eberle A. Rambo, R. Ernst
{"title":"ASTEROID and the Replica-Aware Co-scheduling for Mixed-Criticality","authors":"Eberle A. Rambo, R. Ernst","doi":"10.1007/978-3-030-52017-5_3","DOIUrl":"https://doi.org/10.1007/978-3-030-52017-5_3","url":null,"abstract":"","PeriodicalId":372231,"journal":{"name":"Dependable Embedded Systems","volume":"108 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125129019","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Increasing Reliability Using Adaptive Cross-Layer Techniques in DRPs: Just-Safe-Enough Responses to Reliability Threats 在drp中使用自适应跨层技术提高可靠性:对可靠性威胁的足够安全响应
Dependable Embedded Systems Pub Date : 2020-12-10 DOI: 10.1007/978-3-030-52017-5_5
Johannes Maximilian Kühn, O. Bringmann, W. Rosenstiel
{"title":"Increasing Reliability Using Adaptive Cross-Layer Techniques in DRPs: Just-Safe-Enough Responses to Reliability Threats","authors":"Johannes Maximilian Kühn, O. Bringmann, W. Rosenstiel","doi":"10.1007/978-3-030-52017-5_5","DOIUrl":"https://doi.org/10.1007/978-3-030-52017-5_5","url":null,"abstract":"","PeriodicalId":372231,"journal":{"name":"Dependable Embedded Systems","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128888551","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Cross-Layer Resilience Against Soft Errors: Key Insights 针对软错误的跨层弹性:关键见解
Dependable Embedded Systems Pub Date : 2020-12-10 DOI: 10.1007/978-3-030-52017-5_11
Daniel Mueller-Gritschneder, E. Cheng, Uzair Sharif, V. Kleeberger, P. Bose, S. Mitra, Ulf Schlichtmann
{"title":"Cross-Layer Resilience Against Soft Errors: Key Insights","authors":"Daniel Mueller-Gritschneder, E. Cheng, Uzair Sharif, V. Kleeberger, P. Bose, S. Mitra, Ulf Schlichtmann","doi":"10.1007/978-3-030-52017-5_11","DOIUrl":"https://doi.org/10.1007/978-3-030-52017-5_11","url":null,"abstract":"","PeriodicalId":372231,"journal":{"name":"Dependable Embedded Systems","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132071438","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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