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Dealing with Aging and Yield in Scaled Technologies 处理规模技术中的老化和成品率
Dependable Embedded Systems Pub Date : 2020-12-10 DOI: 10.1007/978-3-030-52017-5_17
Wei Ye, M. Alawieh, Che-Lun Hsu, Yibo Lin, D. Pan
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引用次数: 1
Monitor Circuits for Cross-Layer Resiliency 监测电路的跨层弹性
Dependable Embedded Systems Pub Date : 2020-12-10 DOI: 10.1007/978-3-030-52017-5_16
Mahfuzul Islam, H. Onodera
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引用次数: 0
Soft Error Handling for Embedded Systems using Compiler-OS Interaction 使用编译器-操作系统交互的嵌入式系统软错误处理
Dependable Embedded Systems Pub Date : 2020-12-10 DOI: 10.1007/978-3-030-52017-5_2
M. Engel, P. Marwedel
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引用次数: 0
Exploiting Memory Resilience for Emerging Technologies: An Energy-Aware Resilience Exemplar for STT-RAM Memories 利用新兴技术的记忆弹性:STT-RAM存储器的能量意识弹性范例
Dependable Embedded Systems Pub Date : 2020-12-10 DOI: 10.1007/978-3-030-52017-5_21
Amir Mahdi Hosseini Monazzah, A. Rahmani, A. Miele, N. Dutt
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引用次数: 0
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