Johannes Maximilian Kühn, O. Bringmann, W. Rosenstiel
{"title":"Increasing Reliability Using Adaptive Cross-Layer Techniques in DRPs: Just-Safe-Enough Responses to Reliability Threats","authors":"Johannes Maximilian Kühn, O. Bringmann, W. Rosenstiel","doi":"10.1007/978-3-030-52017-5_5","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":372231,"journal":{"name":"Dependable Embedded Systems","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Dependable Embedded Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-030-52017-5_5","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}