Electrical Contacts - 1998. Proceedings of the Forty-Fourth IEEE Holm Conference on Electrical Contacts (Cat. No.98CB36238)最新文献

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The effect of microstructure on the electrical performance of Ag-WC-C contact materials 微观结构对Ag-WC-C触点材料电性能的影响
S. Allen, E. Streicher
{"title":"The effect of microstructure on the electrical performance of Ag-WC-C contact materials","authors":"S. Allen, E. Streicher","doi":"10.1109/HOLM.1998.722456","DOIUrl":"https://doi.org/10.1109/HOLM.1998.722456","url":null,"abstract":"Silver-tungsten carbide-graphite contacts of varying microstructures were investigated to determine the effect on contact erosion, sticking, resistance, and current interruption. The parameters examined were graphite particle size and silver particle size. Statistically significant results were weld strength after contact bounce at 400 amperes peak, weight loss after 10,000 operations at 141 amperes peak, and weight loss and resistance after interruption at 1,920 amperes peak. For the Ag-WC-C composition tested, the use of fine graphite and fine silver powders led to enhanced electrical performance.","PeriodicalId":371014,"journal":{"name":"Electrical Contacts - 1998. Proceedings of the Forty-Fourth IEEE Holm Conference on Electrical Contacts (Cat. No.98CB36238)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114082833","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 17
Stress relaxation of aluminum wire conductors 铝线导体的应力松弛
M. Braunovic
{"title":"Stress relaxation of aluminum wire conductors","authors":"M. Braunovic","doi":"10.1109/HOLM.1998.722452","DOIUrl":"https://doi.org/10.1109/HOLM.1998.722452","url":null,"abstract":"Published experimental evidence and various reports of trouble in service suggest that the contact stability of aluminum wire connections is sometimes inadequate. Among a number of factors affecting the contact stability is a rather rapid stress relaxation of aluminum which can significantly reduce the contact stability. Stress relaxation behaviour of EC-1350 H12 and NUAL-H12 grade wire conductors was evaluated at 100/spl deg/C and under current-cycling conditions. In addition, the contact resistance behavior of these wire conductors in a binding-head screw under the influence of electrical current was also investigated. It was shown that the stress relaxation of EC-1350 grade aluminum wire and its contact resistance behaviour in a binding-head screw configuration is inferior to that of the NUAL wire conductor. Current-cycling carried out at room temperature at was found to produce as much stress relaxation as that carried out at 100/spl deg/C and much higher initial contact loads.","PeriodicalId":371014,"journal":{"name":"Electrical Contacts - 1998. Proceedings of the Forty-Fourth IEEE Holm Conference on Electrical Contacts (Cat. No.98CB36238)","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124986345","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Concerning reliability modeling of connectors 关于连接器的可靠性建模
R. Mroczkowski
{"title":"Concerning reliability modeling of connectors","authors":"R. Mroczkowski","doi":"10.1109/HOLM.1998.722428","DOIUrl":"https://doi.org/10.1109/HOLM.1998.722428","url":null,"abstract":"A Physics of Failure approach provides a basis for modeling of connector degradation mechanisms. Such a modeling capability can be realized, with differing levels of complexity, for many important connector degradation mechanisms. However, extension of this modeling capability to modeling of connector reliability is far more complicated and, in fact, questionable. Reliability modeling of connectors requires knowledge of the relationship between degradation mechanisms and connector performance parameters such as contact resistance. The required relationships, however, are not straightforward in that some of the key parameters are design and application dependent. This dependence makes a general reliability modeling approach difficult at best. This paper highlights some of these design/application dependencies in terms of a proposed general model of contact resistance degradation and, therefore, contact reliability modeling. The conclusion reached is that, at this point, connector modeling has its major value in identifying and \"quantifying\" laboratory exposure environments and procedures directed towards assessing connector reliability empirically.","PeriodicalId":371014,"journal":{"name":"Electrical Contacts - 1998. Proceedings of the Forty-Fourth IEEE Holm Conference on Electrical Contacts (Cat. No.98CB36238)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122103878","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 18
The finite-element model and analysis of static contact resistance and thermal process for contact with film 薄膜接触的静态接触电阻和热过程的有限元模型与分析
Li Kui, Su Xiuping, L. Zhigang, Lu Jianguo, Z. Guan-sheng
{"title":"The finite-element model and analysis of static contact resistance and thermal process for contact with film","authors":"Li Kui, Su Xiuping, L. Zhigang, Lu Jianguo, Z. Guan-sheng","doi":"10.1109/HOLM.1998.722450","DOIUrl":"https://doi.org/10.1109/HOLM.1998.722450","url":null,"abstract":"Contact resistance and thermal process are very important parameters for contact. The film on contact surface has an influence on contact resistance and the thermal process. This paper has analyzed the static contact resistance and the thermal process, and then the finite-element models are proposed for contact with film. The contact boundary condition is automatically met in calculating the finite-element method for contact without film, but it will be changed when the contacts are covered with film. We have developed the finite-element program for contact with film. Our results for resistance of single-spot contact are approximate to the theoretical value. Finally we have analyzed the effect of the film on the thermal process.","PeriodicalId":371014,"journal":{"name":"Electrical Contacts - 1998. Proceedings of the Forty-Fourth IEEE Holm Conference on Electrical Contacts (Cat. No.98CB36238)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129956014","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Investigation of arcing effects during contact blow open process 接触吹开过程中电弧效应的研究
X. Zhou, P. Theisen
{"title":"Investigation of arcing effects during contact blow open process","authors":"X. Zhou, P. Theisen","doi":"10.1109/6144.846764","DOIUrl":"https://doi.org/10.1109/6144.846764","url":null,"abstract":"A theoretical model has been developed to simulate the blow open process considering contact constriction force, contact spring force, and plasma pressure. Meanwhile, monochromatic high speed imaging technique has been used to characterize arc behavior, contact vapor distribution and determine contact blow open gaps. Modeling results are in good agreement with test results. The results show that plasma pressure has a significant effect at the initial arcing stage of a blow open process, but it decreases rapidly due to the increase of arc gap and the gas pressure equilibrium around moving contacts. The plasma pressure and the contact spring force (or applied magnetic force) basically determine the arcing time during the blow open process. However, contacts can be held open by plasma pressure till current zero if piston type arc chamber is employed. Higher contact spring force results in shorter arcing time, higher arcing current and more likely leads to contact weld. Due to the fact of arc pressure decreasing rapidly during the blow open process, the blow open contact gap is less than 2.5 mm for all the contactors tested at the blow open current level. The results indicate that larger allowed arc gap does not necessarily reduce contact weld possibility, since other factors such as arc motion and heat conduction through contacts also have strong influence on contact weld.","PeriodicalId":371014,"journal":{"name":"Electrical Contacts - 1998. Proceedings of the Forty-Fourth IEEE Holm Conference on Electrical Contacts (Cat. No.98CB36238)","volume":"11 4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134620814","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 25
Contact physics of gold microcontacts for MEMS switches MEMS开关用金微触点的接触物理
D. Hyman, M. Mehregany
{"title":"Contact physics of gold microcontacts for MEMS switches","authors":"D. Hyman, M. Mehregany","doi":"10.1109/6144.796533","DOIUrl":"https://doi.org/10.1109/6144.796533","url":null,"abstract":"This work presents a tribological study of gold metallic contacts regarding contact resistance, heat dissipation, and surface damage in the normal-force regime of tens to hundreds of /spl mu/N, which is typical of the contact forces from microactuation. The purpose of this work is to present the micromechanical switch designer with practical information on gold contact phenomena in this force regime, as most work in micrometallic contacts has focused on contact forces greater than 1 mN. Results indicate actuation forces of several hundred /spl mu/N are required for reliable fully-metallic contacts, with resistance and current carrying ability primarily dependent on morphology, thermal management, and nm-depth material properties of the contact electrodes.","PeriodicalId":371014,"journal":{"name":"Electrical Contacts - 1998. Proceedings of the Forty-Fourth IEEE Holm Conference on Electrical Contacts (Cat. No.98CB36238)","volume":"75 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114848241","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 290
Arc structure, arc motion and gas pressure between laterally enclosed arc runners 电弧结构、电弧运动及横向封闭电弧流道间的气体压力
P. Zeller, W. Rieder
{"title":"Arc structure, arc motion and gas pressure between laterally enclosed arc runners","authors":"P. Zeller, W. Rieder","doi":"10.1109/6144.946476","DOIUrl":"https://doi.org/10.1109/6144.946476","url":null,"abstract":"Arc motion along parallel arc runners tightly enclosed by lateral walls was investigated experimentally, both with and without an exhaust barrier at the outlet. High speed movies (33000 frames/s) were taken and the gas pressure was measured at several locations along the path of arc motion. The measurements show how both arc shape and motion depend on the parameters arc length (5-15 mm), arc current (1-5 kA), magnetic blast field (40-100 mT), and exhaust constriction. In many cases both are shape and are motion were influenced by a plasma volume forming a \"nose\" in front of the arc next one of the electrodes. Spontaneous formation of an anode spot and/or a cathode spot in front of the arc may ignite a parallel current path and initiate a commutation process. The plasma volume in front of the arc is less significant at low electrode distance, high arc current, high blast field, and in more realistic chamber geometries with an exhaust barrier. Cold gas shock waves hitting the arc strongly influence both arc motion and shape. Simulation of arc motion may be a helpful tool in order to save expensive experiments when designing low voltage miniature circuit breakers. The high speed movies showed that the arc motion is sometimes strongly influenced by commutation processes requiring a very complex arc model.","PeriodicalId":371014,"journal":{"name":"Electrical Contacts - 1998. Proceedings of the Forty-Fourth IEEE Holm Conference on Electrical Contacts (Cat. No.98CB36238)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133724199","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 25
Adjustment state and quasisteady state of structure and composition of AgMeO contacts by breaking arcs 断弧AgMeO触点结构和组成的调整状态和准稳态
J. Wan, Ji-gao Zhang, Mingcong Rong
{"title":"Adjustment state and quasisteady state of structure and composition of AgMeO contacts by breaking arcs","authors":"J. Wan, Ji-gao Zhang, Mingcong Rong","doi":"10.1109/HOLM.1998.722446","DOIUrl":"https://doi.org/10.1109/HOLM.1998.722446","url":null,"abstract":"The experiments for erosion behavior of AgCdO, AgSnO/sub 2/ and AgZnO contacts by breaking arcs were carried out in an accelerated testing machine. The surface undergone melting temperature range was examined by SEM, and the element compositions of the surface were analyzed by EDS. The microstructure and composition of the surface after melting range were analyzed. The mechanism of hole formation is described. Finally, the arc erosion and microstructure as well as composition of the surface after melting range are discussed. With increasing operations, two stages named as adjustment state and quasi steady state are discussed.","PeriodicalId":371014,"journal":{"name":"Electrical Contacts - 1998. Proceedings of the Forty-Fourth IEEE Holm Conference on Electrical Contacts (Cat. No.98CB36238)","volume":"86 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129277826","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Nickel matrix composite electrocoatings as stationary electrical contacts 镍基复合电镀层作为固定电触点
C. Dervos, C. Kollia, S. Psarrou, P. Vassiliou, N. Spyrellis
{"title":"Nickel matrix composite electrocoatings as stationary electrical contacts","authors":"C. Dervos, C. Kollia, S. Psarrou, P. Vassiliou, N. Spyrellis","doi":"10.1109/HOLM.1998.722440","DOIUrl":"https://doi.org/10.1109/HOLM.1998.722440","url":null,"abstract":"The electrical contact characteristics are dominated by the interfacial transport processes, thermal generation and dissipation rates, mechanical fatigue during the operations, material phase transitions and migration effects as a result of transient phenomena during arcing. The work presented in this paper explores the possibility of using as electrical contacts composite nickel matrix electrodeposits prepared under direct current (DC) and pulse current (PC) conditions. The codeposition of liquid-containing microcapsules (/spl mu/caps) along with the metal matrix from electrolytic baths leads to the development of a totally new type of material, the liquid-containing metal electrocoating with prespecified properties. The incorporation of oil-containing polymeric wall /spl mu/caps in the nickel matrix ensures a self-lubrication-cooling action during fretting or transient operation. The electrical properties of composite nickel electrodeposits have been investigated for possible utilization as electrical contacts. Different preparation conditions have been employed. Their contact resistance and interfacial temperature for a great number of operation cycles have been monitored under constant axial contact force using low current excitations. SEM and XRD analysis were applied for the inter-electrode surfaces for investigating their structural characteristics.","PeriodicalId":371014,"journal":{"name":"Electrical Contacts - 1998. Proceedings of the Forty-Fourth IEEE Holm Conference on Electrical Contacts (Cat. No.98CB36238)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124442373","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Analysis of compounds in airborne dust collected in Beijing 北京地区空气中粉尘成分分析
Ji-gao Zhang, Yaqi Liang, J. Wan, Bai-Sheng Sun
{"title":"Analysis of compounds in airborne dust collected in Beijing","authors":"Ji-gao Zhang, Yaqi Liang, J. Wan, Bai-Sheng Sun","doi":"10.1109/HOLM.1998.722442","DOIUrl":"https://doi.org/10.1109/HOLM.1998.722442","url":null,"abstract":"A comprehensive analysis of the organic compounds of the airborne dust collected in Beijing University of Post and Telecommunications has been carried out by combined application of four analytic methods including infrared spectroscopy, gas chromatography-mass spectrometry (GC/MS), high performance liquid chromatography-mass spectrometry (LC/MS) and thermogravimetric analysis. The aim is to gain a better understanding of the main organic constituents in the dust and seek an efficient method for analysis of the organic compounds. The results show that weight percentage of the organic compounds and \"black\" carbon is about 20% of the dust. The main constituents of the organic compounds are a series of alkanes (C/sub 7/-C/sub 40+/) and two ortho-benzendicarboxylic acid esters. These materials probably are from the chimney of the central heating station and exhaust gas of vehicles. Evidences show that the organics in dust may also contribute to electrical contact failures of connectors and cannot be ignored.","PeriodicalId":371014,"journal":{"name":"Electrical Contacts - 1998. Proceedings of the Forty-Fourth IEEE Holm Conference on Electrical Contacts (Cat. No.98CB36238)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131393979","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
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