Electrical Contacts - 1998. Proceedings of the Forty-Fourth IEEE Holm Conference on Electrical Contacts (Cat. No.98CB36238)最新文献

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Influence of contact geometry and current on effective erosion of Cu-Cr, Ag-WC and Ag-Cr vacuum contact materials 接触几何形状和电流对Cu-Cr、Ag-WC和Ag-Cr真空接触材料有效腐蚀的影响
M. B. Schulman, P. Slade, L. Loud, W. Li
{"title":"Influence of contact geometry and current on effective erosion of Cu-Cr, Ag-WC and Ag-Cr vacuum contact materials","authors":"M. B. Schulman, P. Slade, L. Loud, W. Li","doi":"10.1109/6144.796543","DOIUrl":"https://doi.org/10.1109/6144.796543","url":null,"abstract":"Effective ac erosion rates were measured for Cu-Cr, Ag-WC and Ag-Cr contacts in vacuum contactors. Half-cycle arc currents of 450-600 A rms were used, with the full gap set to 10%-25% of the contact diameter. The contacts parted during the rising current, and the arc stopped at the next current zero. The polarity changed for each operation to ensure uniform effects for both contacts. The effective linear volume erosion rate [cm/sup 3//C] was determined by monitoring the axial thickness of the contacts versus the number of operations. When this was converted to an effective mass erosion rate [/spl mu/g/C], it was significantly smaller than the reported absolute cathode erosion rate based on measured loss of cathode mass. Both the dependence of the effective erosion on the gap and the distribution of metal droplets on the arc shield were studied. Droplets were a significant cathode material loss which left the gap close to the plane of the cathode, while a large fraction of the ionized vapor leaving the cathode spots was deposited onto the anode. The effective erosion rate increased when spiral-slotted contacts were used.","PeriodicalId":371014,"journal":{"name":"Electrical Contacts - 1998. Proceedings of the Forty-Fourth IEEE Holm Conference on Electrical Contacts (Cat. No.98CB36238)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125572006","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 29
Shape memory alloy coil-shaped clamp for enhanced normal force in electrical connectors 用于增强电连接器法向力的形状记忆合金线圈形夹具
I. Kulisic, G. Gray, S. Mohney
{"title":"Shape memory alloy coil-shaped clamp for enhanced normal force in electrical connectors","authors":"I. Kulisic, G. Gray, S. Mohney","doi":"10.1109/HOLM.1998.722423","DOIUrl":"https://doi.org/10.1109/HOLM.1998.722423","url":null,"abstract":"Many electrical connectors experience a significant degradation in performance due to fretting corrosion, which is particularly problematic when the connector undergoes vibration. Fretting corrosion can be reduced or eliminated if the relative motion between the pin and receptacle is reduced or eliminated. One practical means of reducing the relative motion is to increase the normal force between the pin and receptacle. Unfortunately, increasing the normal force has traditionally implied increasing the insertion and removal forces required for mating and separation of the pin and receptacle. In this paper we propose a unique solution to the linked problems of fretting corrosion and insertion/removal forces. Using our approach, the normal force between the pin and receptacle is increased after the connector is mated and decreased before separation. We implement our approach for connectors that are put in service in elevated temperature environments by placing a coiled shape memory alloy (SMA) wire around the receptacle part of the connector. We will describe our concept and discuss our early experiments in which we demonstrate the effect of the SMA on the normal force under realistic conditions. In addition, we will describe future experiments designed to simulate lifetime tests on these connectors undergoing vibrations and to ascertain the effects of a large number of temperature cycles on the properties of the SMA.","PeriodicalId":371014,"journal":{"name":"Electrical Contacts - 1998. Proceedings of the Forty-Fourth IEEE Holm Conference on Electrical Contacts (Cat. No.98CB36238)","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128307435","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Study on arc moving image with high frame rate CCD for low voltage apparatus 低压仪器用高帧率CCD电弧运动图像的研究
Jiaomin Liu, Jianguo Lu
{"title":"Study on arc moving image with high frame rate CCD for low voltage apparatus","authors":"Jiaomin Liu, Jianguo Lu","doi":"10.1109/HOLM.1998.722431","DOIUrl":"https://doi.org/10.1109/HOLM.1998.722431","url":null,"abstract":"In this paper, the fiber mirrors sensor and the area scan CCD of high frame rate are developed. Using the flash memories and the TMS320c40 DSP, a special interface between computer and the CCD camera can be done. It is very important for testing system on how to increase the sampling speed of arc moving and the resolution of arc image. Meanwhile, the technology of color adjustment panel and the virtual page exchange are used to show the procedure of arc moving in software design. While using the high speed sampling system of arc moving image, a progress of striking and restriking of the low voltage apparatus is photographed. Under different gap-spacing condition, macro-dynamic image is analyzed. It is shown that the local restriking near the entrance to iron chute is the cause of arc voltage drop. This phenomenon will make the low voltage apparatus characteristics bad.","PeriodicalId":371014,"journal":{"name":"Electrical Contacts - 1998. Proceedings of the Forty-Fourth IEEE Holm Conference on Electrical Contacts (Cat. No.98CB36238)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121214179","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Optimization of the break-arc erosion performance of contact materials in switching devices 开关器件中触点材料断弧腐蚀性能的优化
P. Braumann, A. Koffler, P. Wingert
{"title":"Optimization of the break-arc erosion performance of contact materials in switching devices","authors":"P. Braumann, A. Koffler, P. Wingert","doi":"10.1109/HOLM.1998.722455","DOIUrl":"https://doi.org/10.1109/HOLM.1998.722455","url":null,"abstract":"A test system and an associated analysis method are described for analysis of the erosion behavior of contact materials in a way that minimizes the effects of the characteristics of the devices in which they are tested. The method allows multiple data points to be collected from tests of multiple phase devices rather than having only one lifetime value for each device. The characteristic contact material property of erodibility is defined as the weight loss per erosive arc energy. Applications for applying erodibility values and device break-arc characteristics include comparison of different materials, testing the consistency of lots of the same material type and comparing the behaviors of a single material in devices with different operational characteristics.","PeriodicalId":371014,"journal":{"name":"Electrical Contacts - 1998. Proceedings of the Forty-Fourth IEEE Holm Conference on Electrical Contacts (Cat. No.98CB36238)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116597985","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
A study of contact resistance model for the busbar joints lubricated by contact aid compounds 接触助剂润滑母线接头接触电阻模型的研究
G.S. Zhang, J. Lin, W. Chen
{"title":"A study of contact resistance model for the busbar joints lubricated by contact aid compounds","authors":"G.S. Zhang, J. Lin, W. Chen","doi":"10.1109/HOLM.1998.722443","DOIUrl":"https://doi.org/10.1109/HOLM.1998.722443","url":null,"abstract":"Based on previous studies about the contact resistance model and the conductive paste, the contact resistance model for the busbar joints lubricated by contact aid compounds is formed. The relation between the contact aid compound's technical parameters and the contact spot's microscopic parameters is established. Using this model, the numerical calculation and analysis of the contact spot's microscopic parameters and the electrical contact properties are made, and some results are obtained. The computer simulation of the electrical contact phenomena is realized initially under lubricated and un-lubricated case.","PeriodicalId":371014,"journal":{"name":"Electrical Contacts - 1998. Proceedings of the Forty-Fourth IEEE Holm Conference on Electrical Contacts (Cat. No.98CB36238)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125451588","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Environmental effects on the electrical performance of silver contact-substrate systems 环境对银触点-衬底系统电性能的影响
C. Dervos, P. Vassiliou
{"title":"Environmental effects on the electrical performance of silver contact-substrate systems","authors":"C. Dervos, P. Vassiliou","doi":"10.1109/HOLM.1998.722454","DOIUrl":"https://doi.org/10.1109/HOLM.1998.722454","url":null,"abstract":"In this work, commercial silver metal contacts welded on top of brass or silver plated copper substrates have been exposed to air rich in SO/sub 2/ and air rich in NaCl. Scanning Electron Microscopy (SEM) and Energy Dispersive Analysis (EDA) of the exposed contact surfaces were performed to identify the corrosion byproducts on top of the silver contacts, substrates, and welding materials. Surface corrosion products were mainly found to consist of small spherules of Cu-Zn or Ag-Cu compounds which cover the surface of the contact proper with low adhesion properties. They mainly originate from under the plating of the substrate or from the welding materials. Electrical characterization of the contacting materials was based upon DC temperature overheat tests, current switching cycle tests, and energy storage during AC current excitation. The experimental results show that the operating environment is indeed a very significant parameter determining the overall performance of the electrical contacts. New design rules as well as material selection properties may have to be systematically considered to allow for electrochemical induced degradation in heavy pollutant operating environments.","PeriodicalId":371014,"journal":{"name":"Electrical Contacts - 1998. Proceedings of the Forty-Fourth IEEE Holm Conference on Electrical Contacts (Cat. No.98CB36238)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127965568","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Environmental conditions of residential electrical connections 住宅电气连接的环境条件
J. Aronstein
{"title":"Environmental conditions of residential electrical connections","authors":"J. Aronstein","doi":"10.1109/HOLM.1998.722451","DOIUrl":"https://doi.org/10.1109/HOLM.1998.722451","url":null,"abstract":"Data is presented for temperature and humidity inside various electrical enclosures in residential structures. Conditions within the enclosures are seen to be harsh relative to the indoor ambient that is used for standard qualification tests. There are large temperature excursions and sustained periods of high humidity. Based on the long-term data, a method is presented for estimating the temperature and humidity extremes that are encountered by connections in a representative cross section of residential wiring system applications.","PeriodicalId":371014,"journal":{"name":"Electrical Contacts - 1998. Proceedings of the Forty-Fourth IEEE Holm Conference on Electrical Contacts (Cat. No.98CB36238)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130977973","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 85
Switching behavior of silver/graphite contact material in different atmospheres with regard to contact erosion 银/石墨接触材料在不同气氛下对接触侵蚀的开关行为
E. Vinaricky, V. Behrens
{"title":"Switching behavior of silver/graphite contact material in different atmospheres with regard to contact erosion","authors":"E. Vinaricky, V. Behrens","doi":"10.1109/HOLM.1998.722458","DOIUrl":"https://doi.org/10.1109/HOLM.1998.722458","url":null,"abstract":"Silver graphite contact materials with graphite contents of 3 and 5% by weight were examined with regard to contact erosion behavior. Tests have been carried out in a model switch, applying different gases as switching atmospheres: ambient air and pure gases such as oxygen, nitrogen and argon. It was found that the contact erosion is mainly influenced not only by the reaction of graphite with oxygen, but also by the reaction of graphite with nitrogen. In argon atmosphere, no reaction occurs and in consequence the contact erosion is reduced substantially.","PeriodicalId":371014,"journal":{"name":"Electrical Contacts - 1998. Proceedings of the Forty-Fourth IEEE Holm Conference on Electrical Contacts (Cat. No.98CB36238)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133130362","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 15
Mechanical modeling of fretting cycles of electrical contacts 电触点微动循环的力学建模
L. Tristani, E. M. Zindine, L. Boyer, G. Klimek
{"title":"Mechanical modeling of fretting cycles of electrical contacts","authors":"L. Tristani, E. M. Zindine, L. Boyer, G. Klimek","doi":"10.1109/HOLM.1998.722426","DOIUrl":"https://doi.org/10.1109/HOLM.1998.722426","url":null,"abstract":"Fretting-corrosion of electrical contacts is one of the main causes of failure of the electrical systems used in automobiles. The micro-motion involved in fretting is induced by the vibrations of the vehicle as well as by thermal cycling. Tin is mainly used as a low-cost plating for the contact elements which are made of copper alloys. Using gold coatings is restricted to vital functions. For a better understanding of the wear processes during a fretting cycle, fretting-corrosion tests have been carried-out and curves giving the evolution of the tangential force versus the displacement have been recorded. The particular shape of these curves as well as their evolution during the test lead us to propose a mechanical model which takes into account the profile of the wear track along the male surface, the dynamic friction coefficient and the stiffness of the set up. From the analysis of the curves, we conclude that friction does not occur during the whole cycle: for a given pair of contacts, this friction duration depends on the normal force, on the wear track profile and on the stiffness of the set up.","PeriodicalId":371014,"journal":{"name":"Electrical Contacts - 1998. Proceedings of the Forty-Fourth IEEE Holm Conference on Electrical Contacts (Cat. No.98CB36238)","volume":"193 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121101915","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Mechanical properties and fretting behavior of sulfide film 硫化膜的力学性能和微动行为
C.B. Shao, J.G. Zhang
{"title":"Mechanical properties and fretting behavior of sulfide film","authors":"C.B. Shao, J.G. Zhang","doi":"10.1109/HOLM.1998.722425","DOIUrl":"https://doi.org/10.1109/HOLM.1998.722425","url":null,"abstract":"On sliding or fretting contacts, sulfide films may cause many kinds of problems. On some conditions, sulfide films may be removed; and on other conditions, they are very sticky. These phenomena are not fully understood and the characteristics of sulfide films are not very clear. Many papers have been published on electric contact behavior of sulfide films. However, mechanical properties of them are neglected. Nevertheless, the mechanical properties may be very helpful to understand their electric contact behavior. This is the basic requirement of this paper. Wires of copper and silver, copper coupons, and silver plated coupons were exposed in H/sub 2/S gas environment. Wires and coupons after corrosion were cross-sectioned to observe the growth of sulfide films which were identified by X-ray energy dispersive spectroscopy (XES). Tensile strength and Young's modulus of the wires covered by sulfide films were studied by the specific micro-tension testing machine. A tentative calculation was made for the tensile strength of Cu/sub 2/S. The mechanical property probe-Nano Indenter II was also used to measure Young's modulus of sulfide films covered on coupon surfaces. The relationship between electric contact behavior of sulfide films and mechanical properties are discussed.","PeriodicalId":371014,"journal":{"name":"Electrical Contacts - 1998. Proceedings of the Forty-Fourth IEEE Holm Conference on Electrical Contacts (Cat. No.98CB36238)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126760880","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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