VLSI Design, Automation and Test(VLSI-DAT)最新文献

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Integrating aging aware timing analysis into a commercial STA tool 将老化感知时序分析集成到商用STA工具中

VLSI Design, Automation and Test(VLSI-DAT) Pub Date : 2015-04-01 DOI: 10.1109/VLSI-DAT.2015.7114528

S. Karapetyan, Ulf Schlichtmann

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引用次数: 12

IoT evolution — By crossing application domains 物联网进化——通过跨越应用领域

VLSI Design, Automation and Test(VLSI-DAT) Pub Date : 1900-01-01 DOI: 10.1109/VLSI-DAT.2015.7114554

P. Hsieh

引用次数: 0

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