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Microscopy Microanalysis Microstructures最新文献

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Towards the Merging of "Microscopy, Microanalysis, Microstructures" into "The European Physical Journal Applied Physics" “显微学，显微分析，显微结构”与“欧洲物理杂志应用物理”合并的探讨
Microscopy Microanalysis Microstructures Pub Date : 1997-06-01 DOI: 10.1051/MMM:01997008030R300
C. Colliex
{"title":"Towards the Merging of \"Microscopy, Microanalysis, Microstructures\" into \"The European Physical Journal Applied Physics\"","authors":"C. Colliex","doi":"10.1051/MMM:01997008030R300","DOIUrl":"https://doi.org/10.1051/MMM:01997008030R300","url":null,"abstract":"","PeriodicalId":366013,"journal":{"name":"Microscopy Microanalysis Microstructures","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124134810","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 24
X-Ray, Electron Diffraction and HREM studies of KHTi$_4$O$_9$, xH$_2$O Thermolysis: Characterization of K$_4$Ti$_{16}$O$_{34}$ KHTi$_4$O$_9$， xH$_2$O的x射线，电子衍射和HREM研究:K$_4$Ti$_{16}$O$_{34}$的表征
Microscopy Microanalysis Microstructures Pub Date : 1997-06-01 DOI: 10.1051/MMM:1997118
M. L. Granvalet-Mancini, A. Marie, C. Roucau, M. Caldes, L. Brohan
{"title":"X-Ray, Electron Diffraction and HREM studies of KHTi$_4$O$_9$, xH$_2$O Thermolysis: Characterization of K$_4$Ti$_{16}$O$_{34}$","authors":"M. L. Granvalet-Mancini, A. Marie, C. Roucau, M. Caldes, L. Brohan","doi":"10.1051/MMM:1997118","DOIUrl":"https://doi.org/10.1051/MMM:1997118","url":null,"abstract":"The structure of the new phase K4Ti16O34 was determined from electron diffrac- tion and high resolution electron microscopy data supported by X-ray and thermogravimetric analysis. K2Ti8O17 obtained from the tetratitanate K2Ti4O9 by a soft chemistry reaction trans- forms at 750 °C into a high temperature form K4Ti16O34. The \"cut and projection\" method is used to analyze the electron diffraction patterns and to determine the stacking sequences from geometrical feature of the diffraction patterns. The structure deduced from electron diffraction patterns and direct imaging can be described as resulting from a regular intergrowth of two tun- nel titanates: the hexatitanate and an hypothetical decatitanate. As the homologous series of tunnels alkali titanates A2TimO2m+1 with m > 6, the structure is derived from the lepidocrocite archetype. The formation mechanism of the regular block sequence is discussed.","PeriodicalId":366013,"journal":{"name":"Microscopy Microanalysis Microstructures","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125013472","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Redrawn Phase-Separated Borosilicate Glasses: A TEM Investigation 重绘相分离硼硅酸盐玻璃:TEM研究
Microscopy Microanalysis Microstructures Pub Date : 1997-06-01 DOI: 10.1051/MMM:1997115
S. Polizzi, A. Armigliato, P. Riello, N. Borrelli, G. Fagherazzi
{"title":"Redrawn Phase-Separated Borosilicate Glasses: A TEM Investigation","authors":"S. Polizzi, A. Armigliato, P. Riello, N. Borrelli, G. Fagherazzi","doi":"10.1051/MMM:1997115","DOIUrl":"https://doi.org/10.1051/MMM:1997115","url":null,"abstract":"2014 Two alkali aluminoborosilicate glasses containing oriented crystalline particles have been investigated by Transmission Electron Microscopy (TEM). Both materials have been thermally treated in order to phase-separate crystalline droplets and have been then redrawn at a temperature above their softening point to elongate and orient them. In one sample the crystalline phase is a Ag(Cl, Br) solid solution, which gives the material birefringence properties, while in the other sample the particles on the surface have been chemically reduced to Ag, giving the material polarizing properties (Polarcor~). Most of the observed needle-like particles are built up by a small number of well grown crystallites often separated by voids. Both the crystallites and the voids occupy the whole width of the particles and can assume very different lengths. Crystallites inside a particle have different orientations. Microsc. Microanal. Microstruct. 8 (1997) 157-165 JUNE 1997, PAGE","PeriodicalId":366013,"journal":{"name":"Microscopy Microanalysis Microstructures","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128146088","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
HREM Image Analysis by Fourier Filtering of Reflections with Long Extinction Distances: Application to the Spinel/MgO System 长消光距离反射的傅里叶滤波HREM图像分析:在尖晶石/MgO系统中的应用
Microscopy Microanalysis Microstructures Pub Date : 1997-04-01 DOI: 10.1051/MMM:1997108
R. Hillebrand, P. Werner, H. Sieber, D. Hesse
{"title":"HREM Image Analysis by Fourier Filtering of Reflections with Long Extinction Distances: Application to the Spinel/MgO System","authors":"R. Hillebrand, P. Werner, H. Sieber, D. Hesse","doi":"10.1051/MMM:1997108","DOIUrl":"https://doi.org/10.1051/MMM:1997108","url":null,"abstract":"It is known that high resolution electron microscopy can provide quantitative information on the nature of crystalline materials. In the present paper an image processing technique is introduced that profits from long extinction distances in electron diffraction. It is applied to study the real structure of spinel films, which were grown on MgO substrates by solid state reactions. The simulation of electron diffraction and the analysis of calculated contrast tableaus revealed that the intensity of the spinel-specific {220} reflections is a monotonous function of the crystal thickness in a wide range of parameters. Making use of this relation experimental micrographs of spinel films and MgO/spinel interfaces are interpreted by Fourier filtering. First, it is the aim of the technique developed to map the local thickness of spinel films by evaluating the {220} related contrast. Second, if the specimens are sufficiently plane, the","PeriodicalId":366013,"journal":{"name":"Microscopy Microanalysis Microstructures","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134584026","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Influence of Imaging Parameters and Specimen Thinning on Strain Measurements in Au/Ni MBE Multilayers by HREM Image Processing 成像参数和试样减薄对HREM图像处理Au/Ni MBE多层膜应变测量的影响
Microscopy Microanalysis Microstructures Pub Date : 1997-04-01 DOI: 10.1051/MMM:1997111
P. Bayle-Guillemaud, J. Thibault
{"title":"Influence of Imaging Parameters and Specimen Thinning on Strain Measurements in Au/Ni MBE Multilayers by HREM Image Processing","authors":"P. Bayle-Guillemaud, J. Thibault","doi":"10.1051/MMM:1997111","DOIUrl":"https://doi.org/10.1051/MMM:1997111","url":null,"abstract":"Experimental distortion profiles have been measured in strained Au/Ni MBE multilayers using a quantitative analysis of the HREM micrographs. In order to study the reliability of these measurements, similar analysis have been made on simulated HREM images of Au/Ni interfaces. It is found that the measured profiles are reliable only on a limited range of experimental conditions i.e. microscope defocus and specimen thicknesses. Furthermore, it will be shown that the presence of a mixed layer introduced by the ion beam thinning on both sides of the cross section specimen affects considerably the shape of the strain profile recorded on thin areas.","PeriodicalId":366013,"journal":{"name":"Microscopy Microanalysis Microstructures","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133385410","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Atomic Scale Imaging and Analysis of T' Precipitates in Al-Mg-Zn Alloys Al-Mg-Zn合金中T′析出物的原子尺度成像与分析
Microscopy Microanalysis Microstructures Pub Date : 1997-04-01 DOI: 10.1051/MMM:1997109
A. Bigot, P. Auger, S. Chambreland, D. Blavette, A. Reeves
{"title":"Atomic Scale Imaging and Analysis of T' Precipitates in Al-Mg-Zn Alloys","authors":"A. Bigot, P. Auger, S. Chambreland, D. Blavette, A. Reeves","doi":"10.1051/MMM:1997109","DOIUrl":"https://doi.org/10.1051/MMM:1997109","url":null,"abstract":"La composition, la morphologie et la fraction volumique de la phase metastable T' formee par revenu d'un alliage industriel Al-4,91wt%Mg-3,20wt%Zn (24 heures a 140 °C apres mise en solution et trempe) ont ete determinees en sonde atomique tomographique. Les precipites T', de forme generalement globulaire et parfois allongee, sont rencontres avec une densite numerique de 1,8 x 10 17 cm -3 . La fraction volumique de la phase est proche de 4,5 %. La composition moyenne des precipites T' analyses est de 37,5 %at Mg, 36,5 %at Al et 26 %at Zn, ce qui correspond, aux incertitudes pres, a la stoechiometrie Mg 32 (Al, Zn) 49 de la phase stable T.","PeriodicalId":366013,"journal":{"name":"Microscopy Microanalysis Microstructures","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122033073","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 53
One Hundred Years of the Electron 电子的一百年
Microscopy Microanalysis Microstructures Pub Date : 1997-04-01 DOI: 10.1051/MMM:01997008020R500
P. Hawkes
{"title":"One Hundred Years of the Electron","authors":"P. Hawkes","doi":"10.1051/MMM:01997008020R500","DOIUrl":"https://doi.org/10.1051/MMM:01997008020R500","url":null,"abstract":"","PeriodicalId":366013,"journal":{"name":"Microscopy Microanalysis Microstructures","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126711438","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Shape Reconstruction of Partially Overlapping Objects in SEM Images: Application to Silver Halide Microcrystals 扫描电镜图像中部分重叠物体的形状重建:在卤化银微晶体中的应用
Microscopy Microanalysis Microstructures Pub Date : 1997-04-01 DOI: 10.1051/MMM:1997110
V. Kindratenko, B. Treiger, P. Espen
{"title":"Shape Reconstruction of Partially Overlapping Objects in SEM Images: Application to Silver Halide Microcrystals","authors":"V. Kindratenko, B. Treiger, P. Espen","doi":"10.1051/MMM:1997110","DOIUrl":"https://doi.org/10.1051/MMM:1997110","url":null,"abstract":"A method for shape reconstruction and extraction from objects that have a certain regularity but are observed in a scanning electron microscopy image with some degree of overlap is presented. The proposed algorithm first calculates the curvature at each contour point of the object in the digitized binary image in order to detect the vertexes. Reconstruction of the shape of overlapping objects is then based on geometrical considerations using the information from the vertex co-ordinates. The procedure is independent of the size and orientation of the objects. The method is applied to the shape reconstruction of partially overlapping tabular silver halide microcrystals.","PeriodicalId":366013,"journal":{"name":"Microscopy Microanalysis Microstructures","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114303933","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Low-loss EELS study of oxide-covered aluminum nanospheres 氧化包覆铝纳米球的低损耗EELS研究
Microscopy Microanalysis Microstructures Pub Date : 1997-04-01 DOI: 10.1051/MMM:1997113
T. Stöckli, P. Stadelmann, A. Chátelain
{"title":"Low-loss EELS study of oxide-covered aluminum nanospheres","authors":"T. Stöckli, P. Stadelmann, A. Chátelain","doi":"10.1051/MMM:1997113","DOIUrl":"https://doi.org/10.1051/MMM:1997113","url":null,"abstract":"Note: chercher Reference CIME-ARTICLE-1997-016View record in Web of Science Record created on 2007-02-15, modified on 2017-05-12","PeriodicalId":366013,"journal":{"name":"Microscopy Microanalysis Microstructures","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115095073","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Stability of interfaces in gold-silicon system regarding equilibrium segregation 考虑平衡偏析的金硅体系界面稳定性
Microscopy Microanalysis Microstructures Pub Date : 1997-04-01 DOI: 10.1051/MMM:1997112
Andrée Rolland, C. Poisson, F. d'Heurle, A. Charaï
{"title":"Stability of interfaces in gold-silicon system regarding equilibrium segregation","authors":"Andrée Rolland, C. Poisson, F. d'Heurle, A. Charaï","doi":"10.1051/MMM:1997112","DOIUrl":"https://doi.org/10.1051/MMM:1997112","url":null,"abstract":"Le systeme Si/Au a ete largement etudie a cause de ses applications dans le domaine de la microelectronique. Dans ce papier, nous rapportons sur ce systeme des resultats relatifs aux phenomenes d'interaction et de segregation a des temperatures inferieures a celle de l'eutectique (363 °C). Deux techniques complementaires d'investigation ont ete utilisees: la Spectroscopie d'Electrons Auger (SEA) et la Microscopie Electronique en Transmission (MET). Nous montrons que la microstructure influence fortement le phenomene de segregation: la force motrice de l'evolution du systeme or/silicium polycristallin est la recristallisation du silicium suivie par la segregation superficielle de ce dernier sur le melange silicium-or ainsi forme, a tres basse temperature.","PeriodicalId":366013,"journal":{"name":"Microscopy Microanalysis Microstructures","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114804266","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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