Takanori Yamaguchi, T. Kato, Y. Suzuoki, F. Komori, T. Tsuji, H. Mashima
{"title":"Influence of structural change by water-tree degradation on electrical-tree inception voltage","authors":"Takanori Yamaguchi, T. Kato, Y. Suzuoki, F. Komori, T. Tsuji, H. Mashima","doi":"10.1109/ISEIM.2011.6826274","DOIUrl":"https://doi.org/10.1109/ISEIM.2011.6826274","url":null,"abstract":"To improve accuracy of degradation diagnosis for CV power cables, it is important to clarify the mechanism of inception and propagation of electrical-tree from water-tree degradation. In our previous work, ac-electrical-tree inception voltage was measured at 303 K for the samples with water tree formed mainly at 363 K. As a result, the samples with water tree, in spite of the existence of water tree degradation, showed higher ac-electrical-tree inception voltage than those without water tree. This was attributed to electrical field relaxation. To study the effect of change in material structure itself, it is necessary to reduce the field relaxation effect. In the present work, therefore, we used the samples with dried water tree and applied impulse voltages, and discussed the effect of structural change due to water tree degradation. As a result, the impulse-tree inception voltage in the samples with dried water tree was lower than those with water tree but was slightly higher than those without water tree. In the sample with dried water tree, decrease in water molecule density which is considered to restrain the electron may lead to the lower impulse-tree inception voltage. However, the remaining degradation products and structural change may lead to the slightly higher impulse-tree inception voltage than those without water tree. The effect of prolonged ac voltage application prior to impulse voltage was also studied to discuss the effect of water tree degradation on long term deterioration of cable performance.","PeriodicalId":360527,"journal":{"name":"Proceedings of 2011 International Symposium on Electrical Insulating Materials","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125148224","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
T. Ishii, S. Kikuchi, H. Miyake, Y. Tanaka, T. Takada
{"title":"Dependence of space charge formation in polyimide film on applied voltage wave form","authors":"T. Ishii, S. Kikuchi, H. Miyake, Y. Tanaka, T. Takada","doi":"10.1109/ISEIM.2011.6826287","DOIUrl":"https://doi.org/10.1109/ISEIM.2011.6826287","url":null,"abstract":"It is found in our previous work that hetero space charges always observed before breakdown occurs in polyimide film under high DC electric field. We have also found that the time-to-breakdown and the accumulated amount of hetero space charges depend on the applied DC electric field. In this report, we have investigated whether the time-to-breakdown and the space charge accumulation depend on the applied voltage wave form or not. By measuring the space charge accumulation using PEA method, it is found that the very close space charge behavior in polyimide film is observed under rectangular voltage application to that observed under DC voltage application. Under high DC electric field, homo charges accumulate at first and they decrease. Following the decrease of homo space charges, the hetero charges appear near electrodes and finally the breakdown occurs. Such process to breakdown was also observed under the application of rectangular voltage wave form. Net voltage application time in rectangular voltage is sometimes close to the time-to-breakdown under DC electric field. However, the time-to-breakdown seems to strongly depend on the humidity of the experimental condition.","PeriodicalId":360527,"journal":{"name":"Proceedings of 2011 International Symposium on Electrical Insulating Materials","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128214196","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Mechanism and properties of piezoresistive in rubber-matrix nanocomposites","authors":"Z. Dang, J. Zha, Khurram Shehzad, J. Zhang","doi":"10.1109/ISEIM.2011.6826324","DOIUrl":"https://doi.org/10.1109/ISEIM.2011.6826324","url":null,"abstract":"Advanced materials with excellent piezoresistance sensitivity are attracting more attention due that they can be used as functional materials in pressure sensors. For the researched piezoresistance nanocomposites, we employ canbon nanotubes (CNT) with difference aspect ratios as conducting functional fillers and two kinds of polymers (silicone rubber and thermoplastic elastomer) as polymer matrix, which can produce a great strain at low stress so that finally the nancomposites show outstanding piezoresistance sensitivity. Different to the carbon black (CB)/polymer composites, the CNT/polymer nanocomposites display a positive piezoresistance effect (PPRE), namely the resistance of nanocomposites increases with an increase in pressure stress. Therefore, the mechanism of PPRE is studied in this work by employing the insulating SiO2 nanoparticles and the electrical conducting CB particles as the second kind of fillers. In addition, the effect of aspect ratio (AR) of CNT on piezoresistivity was explored. A correlation between AR of MWNCNT and piezoresistivity of the corresponding composites was established.","PeriodicalId":360527,"journal":{"name":"Proceedings of 2011 International Symposium on Electrical Insulating Materials","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131479802","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Masayuki Hayashi, H. Takada, M. Kozako, M. Hikita, S. Nakamura, T. Umemura, M. Higashiyama
{"title":"Study on time lag of void discharge in epoxy resin by considering attenuation of X-ray irradiation dose","authors":"Masayuki Hayashi, H. Takada, M. Kozako, M. Hikita, S. Nakamura, T. Umemura, M. Higashiyama","doi":"10.1109/ISEIM.2011.6826355","DOIUrl":"https://doi.org/10.1109/ISEIM.2011.6826355","url":null,"abstract":"It is crucial for proper insulation design of cast resin transformer to consider voids and delamination which might exist in cast molding process and/or under long-term operation because of several surface boundaries between resin and conductor. Should such defects in the insulation system exist, it would lead to reduction of the life of the apparatus. In this report, we investigate X-ray irradiation induced discharge of spherical void in epoxy resin. Physical consideration of the effect of X-ray irradiation on void discharges in epoxy resin was also made. Time lag of void discharges in epoxy resin was also made with attenuation of X-ray irradiation dose considered.","PeriodicalId":360527,"journal":{"name":"Proceedings of 2011 International Symposium on Electrical Insulating Materials","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134554875","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Li Shengtao, W. Hui, Lin Chun-jiang, Yang Yang, Li Jianying
{"title":"Dielectric properites of Al-doped CaCu3Ti4O12 ceramics by coprecipitation method","authors":"Li Shengtao, W. Hui, Lin Chun-jiang, Yang Yang, Li Jianying","doi":"10.1109/ISEIM.2011.6826267","DOIUrl":"https://doi.org/10.1109/ISEIM.2011.6826267","url":null,"abstract":"Undoped and Al-doped CaCu3Ti4O12 Ceramics (CCTO) ceramics were prepared by the coprecipitation method, and the electric and dielectric properties were investigated. The concentration of Al-doped in CCTO influenced the electric and dielectric properties. Through adjusting the concentration of Al-doped, we obtained polycrystalline ceramics samples with the improved properties of dielectric loss and high dielectric permittivity over the wide frequency range. The results indicated that a high dielectric constant and low dielectric loss can be achieved by Al3+ substitution for Ti4+, because the Al-doped CCTO could enhanced the grain boundary resistivity, and the optimum doping concentration is about x=0.3. With x=0.3 Al doping, the dielectric constant was 16000 at 1 kHz and the loss value was below 0.1 over the frequency range of 102 Hz to 104 Hz.","PeriodicalId":360527,"journal":{"name":"Proceedings of 2011 International Symposium on Electrical Insulating Materials","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134429609","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
F. Niu, Yewen Zhang, Z. An, F. Zheng, Peng Ma, Q. Lei
{"title":"Space charge injection in LDPE by semi-conductive electrode with different carbon black filling rates","authors":"F. Niu, Yewen Zhang, Z. An, F. Zheng, Peng Ma, Q. Lei","doi":"10.1109/ISEIM.2011.6826264","DOIUrl":"https://doi.org/10.1109/ISEIM.2011.6826264","url":null,"abstract":"Electrode materials may play an important role in space charge accumulations. Semi-conductive electrodes, carbon black (CB) with ethylene vinyl acetate copolymer (EVA) in three different filling rates, 27vol%, 32vol% and 34vol%, were studied on their space charge injection. Results show that higher CB filling rate induces lower space charge injection than the electrode with lower CB filling rate. It is in agreement with the theoretical analysis. Low CB filling rate can obviously lead to high local electric field near the surface of the CB particles and a large region of high field, which may cause more charge injection.","PeriodicalId":360527,"journal":{"name":"Proceedings of 2011 International Symposium on Electrical Insulating Materials","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131857125","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Effect of defect size on PD pulse characteristics measured with high frequency current transformer in XLPE insulation","authors":"Y. Gao, B. Du, T. Han","doi":"10.1109/ISEIM.2011.6826377","DOIUrl":"https://doi.org/10.1109/ISEIM.2011.6826377","url":null,"abstract":"This paper presents study aimed at understanding the effect of defect size on characteristics of partial discharge (PD) pulse measured with high frequency current transformer (HFCT) in XLPE insulation. Four typical defects are established to introduce internal, surface, corona and floating discharges, the dimensions of the defects are varied in a certain range. The experiment is carried out at room temperature with relative humidity of ~ 40%. PDs are generated by applying a series of AC voltages to the defects, and are measured by the HFCT. The pulse shape parameters, including rise time, pulse width, magnitude and frequency distribution, are extracted. Obtained results show that the pulse shape is changed with the defect pattern. The parameters are dependent upon the defect size and are varied as a function of the voltage applied. It is suggested that the variation of defect size leads to the change in electric field and thereby results in the alteration of both initiation and formation processes of the discharge.","PeriodicalId":360527,"journal":{"name":"Proceedings of 2011 International Symposium on Electrical Insulating Materials","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133009604","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
M. Fujii, Hiroyuki Shimose, M. Fukuma, T. Takao, M. Nagao
{"title":"Influence of space charge under non-uniform electric field to electrical treeing in epoxy resin","authors":"M. Fujii, Hiroyuki Shimose, M. Fukuma, T. Takao, M. Nagao","doi":"10.1109/ISEIM.2011.6826302","DOIUrl":"https://doi.org/10.1109/ISEIM.2011.6826302","url":null,"abstract":"It is useful for deterioration diagnosis if it is possible to clear up the relationships between space charge distribution and electrical treeing initiation under AC high voltage application. The purpose of this study is to examine the influence of space charge distribution on the electrical treeing in epoxy resin under non-uniform electric field.","PeriodicalId":360527,"journal":{"name":"Proceedings of 2011 International Symposium on Electrical Insulating Materials","volume":"82 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132814655","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Effect of nanoparticles loading on electrical tree propagation in polymer nanocomposites","authors":"D. Pitsa, G. Vardakis, M. Danikas","doi":"10.1109/ISEIM.2011.6826263","DOIUrl":"https://doi.org/10.1109/ISEIM.2011.6826263","url":null,"abstract":"The incorporation of nanoparticles into polymer materials is pivotal on electrical tree behavior, as nanoparticles seem to form barriers delaying and/or preventing tree growth. Even with a small nanoparticles loading, the polymer acquires great resistance to tree initiation and growth. In this paper, a cellular automaton model is used in order to investigate how different nanoparticles loadings affect tree growth in nanocomposites. Simulations are performed for dc voltage, which is applied to the needle of a needle-plane electrode arrangement. Epoxy/TiO2 nanocomposites with different nanoparticles loadings are used as samples. The simulation results show that tree growth is limited as nanoparticles loading increases. Moreover, the tree length depends on the nanoparticles loading and it is smaller in the epoxy/TiO2 nanocomposite with the higher nanoparticles loading.","PeriodicalId":360527,"journal":{"name":"Proceedings of 2011 International Symposium on Electrical Insulating Materials","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124118448","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Yonghong Cheng, M. Ding, Kai Wu, Yajie Wang, Debo Zhou, Hui Ding, Le Yang
{"title":"Damage effect of typical electronic device under EMP","authors":"Yonghong Cheng, M. Ding, Kai Wu, Yajie Wang, Debo Zhou, Hui Ding, Le Yang","doi":"10.1109/ISEIM.2011.6826320","DOIUrl":"https://doi.org/10.1109/ISEIM.2011.6826320","url":null,"abstract":"In the high technology condition, the weapon safety and survive capability is severely threatened by the complicated and changeable electromagnetic environment, especially for the electromagnetic field produced by HPM and ESD high rise current pulse. Electronic devices are gradually sensitive to the high electromagnetic pulse as the reducing characteristic size, increasing integrated degree, reducing power consumption, increasing working band and so on. It's significant to study the damage and failure mechanism of electronic devices under high power electromagnetic field (HPEM) either for the civilian use or for the military application. The damage effect of typical electronic devices including diode, transistor, and digital integrated circuits under lightning surge pulse and nano-second square pulse is studied in this article. The damage law of various electronic devices under different pulse width is obtained, and the damage and failure mechanism of each device under different pulse power is analyzed, and some defending suggestion is proposed in the end of the article.","PeriodicalId":360527,"journal":{"name":"Proceedings of 2011 International Symposium on Electrical Insulating Materials","volume":"720 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121457408","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}