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2020 Annual Reliability and Maintainability Symposium (RAMS)最新文献

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Probabilistic Risk Assessment for Acceptance Testing 验收测试的概率风险评估
2020 Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2020-01-01 DOI: 10.1109/RAMS48030.2020.9153709
Kevin J. Singer, Manoj Menon
{"title":"Probabilistic Risk Assessment for Acceptance Testing","authors":"Kevin J. Singer, Manoj Menon","doi":"10.1109/RAMS48030.2020.9153709","DOIUrl":"https://doi.org/10.1109/RAMS48030.2020.9153709","url":null,"abstract":"This case study discusses a situation where both the government and contractor are working towards an acceptance protocol that would increase production throughput while properly balancing risk between the two parties. There are multiple competing risk factors in this instance: the risk to the Warfighter risk of accepting underperforming weapons (consumer’s risk), the risk of turning away quality weapons (producer’s risk), and the risk associated with reduced throughput and not meeting weapon fleet requirements.","PeriodicalId":360096,"journal":{"name":"2020 Annual Reliability and Maintainability Symposium (RAMS)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115376842","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Forecast Accuracy in Weibull Analysis Based on Now Risk 基于Now风险的威布尔分析预测精度
2020 Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2020-01-01 DOI: 10.1109/RAMS48030.2020.9153608
T. Craney
{"title":"Forecast Accuracy in Weibull Analysis Based on Now Risk","authors":"T. Craney","doi":"10.1109/RAMS48030.2020.9153608","DOIUrl":"https://doi.org/10.1109/RAMS48030.2020.9153608","url":null,"abstract":"In an engineering risk analysis, where variable data are being used to measure a product’s failure time, a statistical model is often used to predict future failures. The Weibull distribution is frequently used as an appropriate model for this function. There has been considerable study in the estimation of Weibull parameters relative to the known value, but perhaps more important in this case is to assess how well we believe the model can predict for the event of interest. First, does the model predict the number of failures we see right now? Second, how do we measure this correctly and how do we know if the model is adequate or in need of adjustment, based on this assessment? If the model does not predict what we see happening right now (the Now Risk), it is assumed likely to not accurately predict future failures. This paper explains and examines the Now Risk calculation and derives some of its important properties with an emphasis on the Weibull distribution as the failure time model. The results of Monte Carlo simulations used to derive various properties of this statistic are presented. A real example is shown for demonstration of calculation and use of the statistic. Best practices for use of the Now Risk calculation are also shared with additional insight offered into what estimation methods are best to use for this type of analysis.","PeriodicalId":360096,"journal":{"name":"2020 Annual Reliability and Maintainability Symposium (RAMS)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127245631","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Risk Considerations for Autonomy Software 自治软件的风险考虑
2020 Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2020-01-01 DOI: 10.1109/RAMS48030.2020.9153722
Leila Meshka
{"title":"Risk Considerations for Autonomy Software","authors":"Leila Meshka","doi":"10.1109/RAMS48030.2020.9153722","DOIUrl":"https://doi.org/10.1109/RAMS48030.2020.9153722","url":null,"abstract":"The application of increasingly higher level of autonomy for safety critical systems is inevitable. Ensuring the reliability of such systems requires managing the uncertainties that occur due to the increased autonomy. Our research indicates the increased uncertainty in autonomous software is due to increased discontinuities in the state space and inadequate situational awareness.","PeriodicalId":360096,"journal":{"name":"2020 Annual Reliability and Maintainability Symposium (RAMS)","volume":"167 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114249471","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
High Available, Fault Tolerant and Safety Critical Subsea Actuator System 高可用性、容错性和安全性关键的水下执行器系统
2020 Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2020-01-01 DOI: 10.1109/RAMS48030.2020.9153688
Julian Popp, Markus Glaser, B. Bertsche, Sebastian Imle, Tobias Winter
{"title":"High Available, Fault Tolerant and Safety Critical Subsea Actuator System","authors":"Julian Popp, Markus Glaser, B. Bertsche, Sebastian Imle, Tobias Winter","doi":"10.1109/RAMS48030.2020.9153688","DOIUrl":"https://doi.org/10.1109/RAMS48030.2020.9153688","url":null,"abstract":"This paper describes the research and development of a mechatronic subsea actuation system, which utilizes batteries to provide the power to close the valve. The paper includes the safety and availability analyses of this novel system architecture. Key features of the new all electric system concept and its reliability- and safety effects are presented, such as the Energize-to-trip operating principle of the safety function, or system safety impacts, which are based on redundancies. The paper compares different system topology approaches regarding their safety and reliability capabilities. Different redundancy concepts for availability and safety are discussed. The interactions between the system and the environment are analyzed with respect to the component and element interactions. The resulting mitigations, which are reducing hazardous system conditions in the system architecture, are described. The paper presents a significant improvement of safety and availability characteristics due to the usage of redundancies, which are based on quantitative, and qualitative system analyzes. Furthermore, the analyses show that the installation of redundancies can result in additional fault sources, which must be prevented by architectural changes and diagnostic procedures. A further result is the investigation of first and second system faults via a system reliability model approach, based on the redundancies.","PeriodicalId":360096,"journal":{"name":"2020 Annual Reliability and Maintainability Symposium (RAMS)","volume":"56 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121561481","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
An Automotive EHPS Software Reliability and Testing 汽车EHPS软件可靠性与测试
2020 Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2020-01-01 DOI: 10.1109/RAMS48030.2020.9153725
Yanshuo Wang, J. Yang, N. M. Mbiye
{"title":"An Automotive EHPS Software Reliability and Testing","authors":"Yanshuo Wang, J. Yang, N. M. Mbiye","doi":"10.1109/RAMS48030.2020.9153725","DOIUrl":"https://doi.org/10.1109/RAMS48030.2020.9153725","url":null,"abstract":"The electronic control plays an important role in the modern automotive world. As more software is embedded in the vehicle electronics, software quality and reliability becomes essential to the vehicle reliability. This paper summarizes the embedded software reliability and testing performed at Dare Auto, Inc. for an automotive EHPS (Electro-Hydraulic Power Steering) pump. The ASPICE (Automotive Software Process Improvement and Capability Determination) process has been used during the design and development. The component, subsystem and vehicle level testing have been conducted before releasing for production. The lessons learned and the issues have been identified.","PeriodicalId":360096,"journal":{"name":"2020 Annual Reliability and Maintainability Symposium (RAMS)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122087854","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Towards the Intelligent Application of Security Controls 迈向安全控制的智能化应用
2020 Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2020-01-01 DOI: 10.1109/RAMS48030.2020.9153668
George Yee
{"title":"Towards the Intelligent Application of Security Controls","authors":"George Yee","doi":"10.1109/RAMS48030.2020.9153668","DOIUrl":"https://doi.org/10.1109/RAMS48030.2020.9153668","url":null,"abstract":"Today, attacks on sensitive data held by organizations and the resulting data breaches are unfortunately all too common. In response to these attacks the organization applies security controls (e.g., encryption) to secure its vulnerabilities. However, these controls are often applied haphazardly, without any idea of their reliability, or any guidance on how they should be applied to account for the priority of the vulnerabilities or a security control’s effect on the overall security posture of the organization. This work derives a mathematical model linking the reliability of the security controls to the overall security level of the organization. The paper then combines this model with a method to prioritize vulnerabilities, allowing the organization to more intelligently apply security controls and reach its desired security level goal within negotiated budgetary constraints. The paper illustrates this approach using an application example.","PeriodicalId":360096,"journal":{"name":"2020 Annual Reliability and Maintainability Symposium (RAMS)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115474462","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
3D RAM Modeling and Simulation in a Model Based Systems Engineering Environment 基于模型的系统工程环境中的三维RAM建模与仿真
2020 Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2020-01-01 DOI: 10.1109/RAMS48030.2020.9153644
Brent Dingle, J. Eubanks, K. Janasak
{"title":"3D RAM Modeling and Simulation in a Model Based Systems Engineering Environment","authors":"Brent Dingle, J. Eubanks, K. Janasak","doi":"10.1109/RAMS48030.2020.9153644","DOIUrl":"https://doi.org/10.1109/RAMS48030.2020.9153644","url":null,"abstract":"A critical aspect of a Model Based Systems Engineering environment is the ability to insert and interact with dimensionally accurate 3D models to support multi-disciplinary analyses. This paper provides an overview of how immersive environments are effectively used to perform platform and systems level reliability and maintainability analyses and training. It further highlights lessons learned on how to make 3D modeling and simulation a catalyst for improving Model Based Systems Engineering environments.","PeriodicalId":360096,"journal":{"name":"2020 Annual Reliability and Maintainability Symposium (RAMS)","volume":"124 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123332570","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Reliability Analysis of Complex NASA Systems with Model-Based Engineering 基于模型工程的复杂NASA系统可靠性分析
2020 Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2020-01-01 DOI: 10.1109/RAMS48030.2020.9153633
N. Lindsey, Mahdi Alimardani, L. D. Gallo
{"title":"Reliability Analysis of Complex NASA Systems with Model-Based Engineering","authors":"N. Lindsey, Mahdi Alimardani, L. D. Gallo","doi":"10.1109/RAMS48030.2020.9153633","DOIUrl":"https://doi.org/10.1109/RAMS48030.2020.9153633","url":null,"abstract":"The emergence of model-based engineering, with Model-Based Systems Engineering (MBSE) leading the way, is transforming design and analysis methodologies. [7] The recognized benefits to systems development include moving from document-centric information systems and document-centric project communication to a model-centric environment in which control of design changes in the life cycles is facilitated. In addition, a “single source of truth” about the system, that is up-to-date in all respects of the design, becomes the authoritative source of data and information about the system. This promotes consistency and efficiency in regard to integration of the system elements as the design emerges and thereby may further optimize the design. Therefore Reliability Engineers (REs) supporting NASA missions must be integrated into model-based engineering to ensure the outputs of their analyses are relevant and value-needed to the design, development, and operational processes for failure risks assessment and communication.","PeriodicalId":360096,"journal":{"name":"2020 Annual Reliability and Maintainability Symposium (RAMS)","volume":"58 16","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120942936","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
RAMS 2020 Author Index RAMS 2020作者索引
2020 Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2020-01-01 DOI: 10.1109/rams48030.2020.9153640
Andrada, Roy
{"title":"RAMS 2020 Author Index","authors":"Andrada, Roy","doi":"10.1109/rams48030.2020.9153640","DOIUrl":"https://doi.org/10.1109/rams48030.2020.9153640","url":null,"abstract":"","PeriodicalId":360096,"journal":{"name":"2020 Annual Reliability and Maintainability Symposium (RAMS)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121228141","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Electrical Overstress Estimation for Printed Circuit Board Design 印刷电路板设计中的电气超应力估计
2020 Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2020-01-01 DOI: 10.1109/RAMS48030.2020.9153638
T. Kukal, Ashish Mathur, J. Ahuja, Siddharth Mohan
{"title":"Electrical Overstress Estimation for Printed Circuit Board Design","authors":"T. Kukal, Ashish Mathur, J. Ahuja, Siddharth Mohan","doi":"10.1109/RAMS48030.2020.9153638","DOIUrl":"https://doi.org/10.1109/RAMS48030.2020.9153638","url":null,"abstract":"Electronic part failure analysis at early stages of the design reduces design re-spins and time to market. Component failure at later stage of the design costs heavier depending upon in which phase of design cycle the product is. Failure of a small electronic component can cause complete system shutdown. For examples are a quarter watt resistor operating at half watts, a 50 V capacitor suffering continuous spikes of 100 V, a 100 ohm resistor’s resistance changes to 115 ohms at 60 Degree temperature, power handling capability of 1 W BJT (Bipolar junction transistor) could go down to 0.75 W when operated at higher temperature & Transformer of 500 V dielectric breakdown is under constant stress of thousand Volts spikes. Debugging root cause of such failures on a complex design is not easy especially if done manually.","PeriodicalId":360096,"journal":{"name":"2020 Annual Reliability and Maintainability Symposium (RAMS)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121116733","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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