T. Kukal, Ashish Mathur, J. Ahuja, Siddharth Mohan
{"title":"Electrical Overstress Estimation for Printed Circuit Board Design","authors":"T. Kukal, Ashish Mathur, J. Ahuja, Siddharth Mohan","doi":"10.1109/RAMS48030.2020.9153638","DOIUrl":null,"url":null,"abstract":"Electronic part failure analysis at early stages of the design reduces design re-spins and time to market. Component failure at later stage of the design costs heavier depending upon in which phase of design cycle the product is. Failure of a small electronic component can cause complete system shutdown. For examples are a quarter watt resistor operating at half watts, a 50 V capacitor suffering continuous spikes of 100 V, a 100 ohm resistor’s resistance changes to 115 ohms at 60 Degree temperature, power handling capability of 1 W BJT (Bipolar junction transistor) could go down to 0.75 W when operated at higher temperature & Transformer of 500 V dielectric breakdown is under constant stress of thousand Volts spikes. Debugging root cause of such failures on a complex design is not easy especially if done manually.","PeriodicalId":360096,"journal":{"name":"2020 Annual Reliability and Maintainability Symposium (RAMS)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 Annual Reliability and Maintainability Symposium (RAMS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RAMS48030.2020.9153638","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Electronic part failure analysis at early stages of the design reduces design re-spins and time to market. Component failure at later stage of the design costs heavier depending upon in which phase of design cycle the product is. Failure of a small electronic component can cause complete system shutdown. For examples are a quarter watt resistor operating at half watts, a 50 V capacitor suffering continuous spikes of 100 V, a 100 ohm resistor’s resistance changes to 115 ohms at 60 Degree temperature, power handling capability of 1 W BJT (Bipolar junction transistor) could go down to 0.75 W when operated at higher temperature & Transformer of 500 V dielectric breakdown is under constant stress of thousand Volts spikes. Debugging root cause of such failures on a complex design is not easy especially if done manually.