2010 11th Latin American Test Workshop最新文献_第3页

Concurrent test of Network-on-Chip interconnects and routers 片上网络互连和路由器的并发测试

2010 11th Latin American Test Workshop Pub Date : 2010-03-28 DOI: 10.1109/LATW.2010.5550355

Marcos Herve, Pedro Almeida, F. Kastensmidt, É. Cota, M. Lubaszewski

引用次数: 35

Towards a transmission power self-optimization in reliable Wireless Sensor Networks 面向可靠无线传感器网络的传输功率自优化

2010 11th Latin American Test Workshop Pub Date : 2010-03-28 DOI: 10.1109/LATW.2010.5550356

F. Lavratti, A. R. Pinto, D. Prestes, L. Bolzani, Fabian Vargas, C. Montez

引用次数: 9

Heterogeneous integration: Beyond CMOS – coping with variability at the end of the CMOS roadmap 异构集成:超越CMOS——应对CMOS路线图末端的可变性

2010 11th Latin American Test Workshop Pub Date : 2010-03-28 DOI: 10.1109/LATW.2010.5550352

S. Bampi

{"title":"Heterogeneous integration: Beyond CMOS – coping with variability at the end of the CMOS roadmap","authors":"S. Bampi","doi":"10.1109/LATW.2010.5550352","DOIUrl":"https://doi.org/10.1109/LATW.2010.5550352","url":null,"abstract":"By 2020 it is very likely that nano-CMOS will reach the end of the scaling roadmap. Current 32nm CMOS production technology already is hampered by large variations in electrical parameters, with impacts on performance predictability, power consumption limitations and design closure for complex systems. Heterogeneous integration is the roadmap to lower cost and yet more advanced and innovative functionalities on silicon, with new and more manageable challenges. There will be no end nor a definite demise of silicon technology. While there are uncertainties as to what will be the show-stoppers for the down-scaling of nano-CMOS, there is a large number of transitional and compatible to CMOS technologies that will be more important than just 2-D scaling. This talk discusses variability among other limitations that bring the end of 2-D scaling and also proposes a likely scenario for hardware technology evolution and related challenges for integrating systems in the next 20 years. The scenario beyond the end of the roadmap is drawn, in which heterogeneous integration at the device level as well as at the system level will bring new frontiers to the ULSI era of tera-scale integration. Transitional technologies like 3-D integration by through-silicon vias, carbon-based electron devices, and even magnetic materials devices will co-exist and be built upon a basic CMOS-like technology platform.","PeriodicalId":358177,"journal":{"name":"2010 11th Latin American Test Workshop","volume":"123 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-03-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117130882","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Experiments on the analysis of phase/frequency-modulated RF signals using digital tester channels 利用数字测试通道分析相位/调频射频信号的实验

2010 11th Latin American Test Workshop Pub Date : 2010-03-28 DOI: 10.1109/LATW.2010.5550370

N. Pous, F. Azaïs, L. Latorre, P. Nouet, J. Rivoir

引用次数: 1

Dynamic power modulation in baseband OFDM signal processor using application driven metrics: Image transmission and processing 基带OFDM信号处理器动态功率调制应用驱动指标:图像传输与处理

2010 11th Latin American Test Workshop Pub Date : 2010-03-28 DOI: 10.1109/LATW.2010.5550374

Muhammad Mudassar Nisar, Jayaram Natarajan, A. Chatterjee

引用次数: 3

Diversity TMR: Proof of concept in a mixed-signal case 分集TMR:混合信号情况下的概念验证

2010 11th Latin American Test Workshop Pub Date : 2010-03-28 DOI: 10.1109/LATW.2010.5550343

G. Borges, L. Gonçalves, T. Balen, M. Lubaszewski

引用次数: 8

BICS-based March test for resistive-open defect detection in SRAMs 基于bics的sram阻性开放缺陷检测March测试

2010 11th Latin American Test Workshop Pub Date : 2010-03-28 DOI: 10.1109/LATW.2010.5550342

R. Chipana, L. Bolzani, F. Vargas

引用次数: 2

Experimental dependability assessment using a faultload specification tool 使用故障负荷规范工具进行实验可靠性评估

2010 11th Latin American Test Workshop Pub Date : 2010-03-28 DOI: 10.1109/LATW.2010.5550373

Ruthiano S. Munaretti, B. Fiss, T. Weber, S. Cechin

引用次数: 3

On Comparing and Complementing two MBT approaches 论两种MBT方法的比较与互补

2010 11th Latin American Test Workshop Pub Date : 2010-03-28 DOI: 10.1109/LATW.2010.5550339

M. Cristiá, V. A. S. Júnior, N. Vijaykumar

引用次数: 14

An algorithm for diagnostic fault simulation 一种故障诊断仿真算法

2010 11th Latin American Test Workshop Pub Date : 2010-03-28 DOI: 10.1109/LATW.2010.5550345

Yu Zhang, V. Agrawal

引用次数: 14