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Device Architecture, Material and Process Dependencies of NBTI Parametric Drift NBTI参数漂移的器件结构、材料和工艺依赖关系
Recent Advances in PMOS Negative Bias Temperature Instability Pub Date : 2021-11-26 DOI: 10.1007/978-981-16-6120-4_2
Souvik Mahapatra, N. Parihar
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引用次数: 1
Physical Mechanism of NBTI Parametric Drift NBTI参数漂移的物理机制
Recent Advances in PMOS Negative Bias Temperature Instability Pub Date : 2021-11-26 DOI: 10.1007/978-981-16-6120-4_3
Souvik Mahapatra, N. Parihar, S. Mukhopadhyay, Nilesh Goel
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引用次数: 0
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