NBTI参数漂移的物理机制

{"title":"NBTI参数漂移的物理机制","authors":"Souvik Mahapatra, N. Parihar, S. Mukhopadhyay, Nilesh Goel","doi":"10.1007/978-981-16-6120-4_3","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":356407,"journal":{"name":"Recent Advances in PMOS Negative Bias Temperature Instability","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-11-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Physical Mechanism of NBTI Parametric Drift\",\"authors\":\"Souvik Mahapatra, N. Parihar, S. Mukhopadhyay, Nilesh Goel\",\"doi\":\"10.1007/978-981-16-6120-4_3\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":356407,\"journal\":{\"name\":\"Recent Advances in PMOS Negative Bias Temperature Instability\",\"volume\":\"23 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-11-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Recent Advances in PMOS Negative Bias Temperature Instability\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1007/978-981-16-6120-4_3\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Recent Advances in PMOS Negative Bias Temperature Instability","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-981-16-6120-4_3","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}