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Optical Measurement Systems for Industrial Inspection XIII最新文献

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Multimodal local spectral/topographic characterization of laser-induced colored stainless steel with coherence scanning interferometry 激光诱导彩色不锈钢的相干扫描干涉多模态局部光谱/形貌表征
Optical Measurement Systems for Industrial Inspection XIII Pub Date : 2023-08-16 DOI: 10.1117/12.2673958
P. Montgomery, S. Marbach, R. Claveau, Florie Ogor, C. Cordier, J. Schiffler, M. Flury
{"title":"Multimodal local spectral/topographic characterization of laser-induced colored stainless steel with coherence scanning interferometry","authors":"P. Montgomery, S. Marbach, R. Claveau, Florie Ogor, C. Cordier, J. Schiffler, M. Flury","doi":"10.1117/12.2673958","DOIUrl":"https://doi.org/10.1117/12.2673958","url":null,"abstract":"","PeriodicalId":347203,"journal":{"name":"Optical Measurement Systems for Industrial Inspection XIII","volume":"55 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-08-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127586423","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Lens-free holographic imager with ultrahigh phase sensitivity and large field-of-view 无透镜全息成像仪，具有超高相位灵敏度和大视场
Optical Measurement Systems for Industrial Inspection XIII Pub Date : 2023-08-16 DOI: 10.1117/12.2673873
Sebastian Haegele, G. Corrielli, M. Hejda, Luc Dümpelmann, Roland A. Terborg, R. Osellame, V. Pruneri
{"title":"Lens-free holographic imager with ultrahigh phase sensitivity and large field-of-view","authors":"Sebastian Haegele, G. Corrielli, M. Hejda, Luc Dümpelmann, Roland A. Terborg, R. Osellame, V. Pruneri","doi":"10.1117/12.2673873","DOIUrl":"https://doi.org/10.1117/12.2673873","url":null,"abstract":"","PeriodicalId":347203,"journal":{"name":"Optical Measurement Systems for Industrial Inspection XIII","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-08-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115473591","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Gas analyzer based on inelastic light scattering and acoustic resonance for fast and accurate Wobbe index measurement 基于非弹性光散射和声共振的气体分析仪用于快速准确的Wobbe指数测量
Optical Measurement Systems for Industrial Inspection XIII Pub Date : 2023-08-16 DOI: 10.1117/12.2673227
K. Harr, C. Heffels
{"title":"Gas analyzer based on inelastic light scattering and acoustic resonance for fast and accurate Wobbe index measurement","authors":"K. Harr, C. Heffels","doi":"10.1117/12.2673227","DOIUrl":"https://doi.org/10.1117/12.2673227","url":null,"abstract":"","PeriodicalId":347203,"journal":{"name":"Optical Measurement Systems for Industrial Inspection XIII","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-08-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125681002","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Implementation of a new algorithm for resolution enhancement in wavefront sensing-based metrology 波前传感测量中分辨率增强新算法的实现
Optical Measurement Systems for Industrial Inspection XIII Pub Date : 2023-08-16 DOI: 10.1117/12.2673705
R. Porcar, X. Levecq, Pauline Treimany
{"title":"Implementation of a new algorithm for resolution enhancement in wavefront sensing-based metrology","authors":"R. Porcar, X. Levecq, Pauline Treimany","doi":"10.1117/12.2673705","DOIUrl":"https://doi.org/10.1117/12.2673705","url":null,"abstract":"","PeriodicalId":347203,"journal":{"name":"Optical Measurement Systems for Industrial Inspection XIII","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-08-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115352674","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Optical sensor for localized damage detection and modal analysis on fast rotating fiber reinforced polymer structures 用于快速旋转纤维增强聚合物结构局部损伤检测与模态分析的光学传感器
Optical Measurement Systems for Industrial Inspection XIII Pub Date : 2023-08-16 DOI: 10.1117/12.2673813
Julian Lich, T. Wollmann, R. Kuschmierz, M. Gude, Jürgen W. Czarske
{"title":"Optical sensor for localized damage detection and modal analysis on fast rotating fiber reinforced polymer structures","authors":"Julian Lich, T. Wollmann, R. Kuschmierz, M. Gude, Jürgen W. Czarske","doi":"10.1117/12.2673813","DOIUrl":"https://doi.org/10.1117/12.2673813","url":null,"abstract":"","PeriodicalId":347203,"journal":{"name":"Optical Measurement Systems for Industrial Inspection XIII","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-08-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124662539","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Super-resolution coherence scanning interferometry with 3D printed micro-optics 3D打印微光学超分辨率相干扫描干涉测量
Optical Measurement Systems for Industrial Inspection XIII Pub Date : 2023-08-16 DOI: 10.1117/12.2673418
G. Maconi, G. Zyla, A. Nolvi, D. Ladika, V. Melissinaki, G. Barmparis, M. Farsari, E. Hæggström, I. Kassamakov
{"title":"Super-resolution coherence scanning interferometry with 3D printed micro-optics","authors":"G. Maconi, G. Zyla, A. Nolvi, D. Ladika, V. Melissinaki, G. Barmparis, M. Farsari, E. Hæggström, I. Kassamakov","doi":"10.1117/12.2673418","DOIUrl":"https://doi.org/10.1117/12.2673418","url":null,"abstract":"","PeriodicalId":347203,"journal":{"name":"Optical Measurement Systems for Industrial Inspection XIII","volume":"24 5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-08-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122823730","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Snapshot 3D profilometry using a RGB polarization camera 快照3D轮廓术使用RGB偏振相机
Optical Measurement Systems for Industrial Inspection XIII Pub Date : 2023-08-16 DOI: 10.1117/12.2681681
Y. Otani, Yuuki Maeda, N. Hagen
{"title":"Snapshot 3D profilometry using a RGB polarization camera","authors":"Y. Otani, Yuuki Maeda, N. Hagen","doi":"10.1117/12.2681681","DOIUrl":"https://doi.org/10.1117/12.2681681","url":null,"abstract":"","PeriodicalId":347203,"journal":{"name":"Optical Measurement Systems for Industrial Inspection XIII","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-08-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126875084","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Infrared thermography at low temperature 低温红外热像仪
Optical Measurement Systems for Industrial Inspection XIII Pub Date : 2023-08-10 DOI: 10.1117/12.2675598
J. Vandenrijt, S. Roose, G. Casarosa
{"title":"Infrared thermography at low temperature","authors":"J. Vandenrijt, S. Roose, G. Casarosa","doi":"10.1117/12.2675598","DOIUrl":"https://doi.org/10.1117/12.2675598","url":null,"abstract":"","PeriodicalId":347203,"journal":{"name":"Optical Measurement Systems for Industrial Inspection XIII","volume":"685 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-08-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120846936","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Scanning Phase-Calculation Formula for Surface Profiling of Optical Flat using Fizeau Interferometer 菲索干涉仪光学平面表面轮廓扫描相位计算公式
Optical Measurement Systems for Industrial Inspection XIII Pub Date : 2023-08-10 DOI: 10.1117/12.2673356
Hwan Kim, Ju-Seob Jeon, Juncheol Bae, Yangjin Kim
{"title":"Scanning Phase-Calculation Formula for Surface Profiling of Optical Flat using Fizeau Interferometer","authors":"Hwan Kim, Ju-Seob Jeon, Juncheol Bae, Yangjin Kim","doi":"10.1117/12.2673356","DOIUrl":"https://doi.org/10.1117/12.2673356","url":null,"abstract":"","PeriodicalId":347203,"journal":{"name":"Optical Measurement Systems for Industrial Inspection XIII","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-08-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132354680","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Optical reflectometry-based high-speed temperature change measurement of silicon wafer surfaces 基于光学反射法的硅片表面高速温度变化测量
Optical Measurement Systems for Industrial Inspection XIII Pub Date : 2023-08-10 DOI: 10.1117/12.2673346
J. Bae, Minji Hyun, Jin-Who Hong, Youngeun Jeon, Sanghyun Son, Y. Seo, Sang-Sun Ha, Jungwon Kim
{"title":"Optical reflectometry-based high-speed temperature change measurement of silicon wafer surfaces","authors":"J. Bae, Minji Hyun, Jin-Who Hong, Youngeun Jeon, Sanghyun Son, Y. Seo, Sang-Sun Ha, Jungwon Kim","doi":"10.1117/12.2673346","DOIUrl":"https://doi.org/10.1117/12.2673346","url":null,"abstract":"","PeriodicalId":347203,"journal":{"name":"Optical Measurement Systems for Industrial Inspection XIII","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-08-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129309028","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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