{"title":"TIPLock: Key-Compressed Logic Locking using Through-Input-Programmable Lookup-Tables","authors":"Kaveh Shamsi, R. Datta","doi":"10.23919/DATE56975.2023.10137318","DOIUrl":"https://doi.org/10.23919/DATE56975.2023.10137318","url":null,"abstract":"Herein we explore using logic elements that can be programmed through their inputs for logic locking. For this purpose, we design a novel through-input-programmable (TIP) lookup-table (LUT) element and develop algorithms to find cuts in the circuit that can be mapped to such elements while maintaining programmability. Our proposed TIPLock flow achieves area savings of 50–70% compared to the traditional approach of using a key-vector-long scan-chain.","PeriodicalId":340349,"journal":{"name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125122325","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
J. Youn, L. Ramini, Zeqin Lu, Ahsan Alam, J. Pond, Marco Fiorentino, R. Beausoleil
{"title":"Multiphysics Design and Simulation Methodology for Dense WDM Silicon Photonics","authors":"J. Youn, L. Ramini, Zeqin Lu, Ahsan Alam, J. Pond, Marco Fiorentino, R. Beausoleil","doi":"10.23919/DATE56975.2023.10137107","DOIUrl":"https://doi.org/10.23919/DATE56975.2023.10137107","url":null,"abstract":"We present a novel design methodology covering multiphysics simulation workflows for microring-based dense wavelength division multiplexing (DWDM) Silicon Photonics (SiPh) circuits used for high-performance computing systems and data centers. The main workflow is an electronics-photonics co-simulation comprising various optical devices from a SiPh process design kit (PDK), electronic circuits designed with a commercial CMOS foundry's PDK, and channel S-parameter models, such as interposers and packages, generated by using a full-wave electromagnetic (EM) solver. With the co-simulation, electrical and optical as well as electro-optical behaviors can be analyzed at the same time because best-in-class electronics and photonic integrated circuit simulators interact with each other. As a result, not only optical spectrum and eye diagrams but also electrical eye diagrams can be evaluated on the same simulation platform. In addition, the proposed methodology includes a statistical- and thermal-aware photonic circuit simulation workflow to evaluate process and temperature variations as well as estimate the required thermal tuning power as those non-idealities can lead to microring's resonance wavelengths shifting. For this, thermal simulation is conducted with a 3D EM model which is also used for such signal and power integrity analysis as a channel link simulation and IR drop. Also, photonic circuit simulations are performed where a design exploration and optimization of such microring's design parameters as Q-factor, and bias voltages are required to select the most promising designs, for example, to satisfy a specific bit-error rate. With the proposed design methodology having those multiphysics simulation workflows, DWDM SiPh can be fully optimized to have reliable system performance.","PeriodicalId":340349,"journal":{"name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125191122","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Jianan Xu, Wenjie Fan, J. Madsen, Georgi Tanev, Luca Pezzarossa
{"title":"AI-Based Detection of Droplets and Bubbles in Digital Microfluidic Biochips","authors":"Jianan Xu, Wenjie Fan, J. Madsen, Georgi Tanev, Luca Pezzarossa","doi":"10.23919/DATE56975.2023.10136887","DOIUrl":"https://doi.org/10.23919/DATE56975.2023.10136887","url":null,"abstract":"Digital microfluidic biochips exploit the electrowet-ting on dielectric effect to move and manipulate microliter-sized liquid droplets on a planar surface. This technology has the potential to automate and miniaturize biochemical processes, but reliability is often an issue. The droplets may get temporarily stuck or gas bubbles may impede their movement leading to a disruption of the process being executed. However, if the position and size of the droplets and bubbles are known at run-time, these undesired effects can be easily mitigated by the biochip control system. This paper presents an AI-based computer vision solution for real-time detection of droplets and bubbles in DMF biochips and its implementation that supports cloud-based deployment. The detection is based on the YOLOv5 framework in combination with custom pre and post-processing techniques. The YOLOv5 neural network is trained using our own data set consisting of 5115 images. The solution is able to detect droplets and bubbles with real-time speed and high accuracy and to differentiate between them even in the extreme case where bubbles coexist with transparent droplets.","PeriodicalId":340349,"journal":{"name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126456141","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Attacking ReRAM-based Architectures using Repeated Writes","authors":"Biresh Kumar Joardar, K. Chakrabarty","doi":"10.23919/DATE56975.2023.10136903","DOIUrl":"https://doi.org/10.23919/DATE56975.2023.10136903","url":null,"abstract":"Resistive random-access memory (ReRAM) is a promising technology for both memory and for in-memory computing. However, these devices have security vulnerabilities that are yet to be adequately investigated. In this work, we identify one such vulnerability that arises from the write mechanism in ReRAMs. Whenever a cell/row is written, a constant bias is automatically applied to the remaining cells/rows to reduce sneak current. We develop a new attack (referred as WriteHammer) that exploits this process. By repeatedly exposing a subset of cells to this bias, WriteHammer can cause noticeable resistance drift in the victim ReRAM cells. Experimental results indicate that WriteHammer can cause up to 3.5X change in cell resistance by repeatedly writing to the ReRAM cells for a duration of 4 ms.","PeriodicalId":340349,"journal":{"name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129564369","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. Burrello, Matteo Risso, Noemi Tomasello, Yukai Chen, L. Benini, E. Macii, M. Poncino, D. J. Pagliari
{"title":"Energy-efficient Wearable-to-Mobile Offload of ML Inference for PPG-based Heart-Rate Estimation","authors":"A. Burrello, Matteo Risso, Noemi Tomasello, Yukai Chen, L. Benini, E. Macii, M. Poncino, D. J. Pagliari","doi":"10.23919/DATE56975.2023.10137129","DOIUrl":"https://doi.org/10.23919/DATE56975.2023.10137129","url":null,"abstract":"Modern smartwatches often include photoplethysmographic (PPG) sensors to measure heartbeats or blood pressure through complex algorithms that fuse PPG data with other signals. In this work, we propose a collaborative inference approach that uses both a smartwatch and a connected smartphone to maximize the performance of heart rate (HR) tracking while also maximizing the smartwatch's battery life. In particular, we first analyze the trade-offs between running on-device HR tracking or offloading the work to the mobile. Then, thanks to an additional step to evaluate the difficulty of the upcoming HR prediction, we demonstrate that we can smartly manage the workload between smartwatch and smartphone, maintaining a low mean absolute error (MAE) while reducing energy consumption. We benchmark our approach on a custom smartwatch prototype, including the STM32WB55 MCU and Bluetooth Low-Energy (BLE) communication, and a Raspberry Pi3 as a proxy for the smartphone. With our Collaborative Heart Rate Inference System (CHRIS), we obtain a set of Pareto-optimal configurations demonstrating the same MAE as State-of-Art (SoA) algorithms while consuming less energy. For instance, we can achieve approximately the same MAE of TimePPG-Small [1] (5.54 BPM MAE vs. 5.60 BPM MAE) while reducing the energy by 2.03×, with a configuration that offloads 80% of the predictions to the phone. Furthermore, accepting a performance degradation to 7.16 BPM of MAE, we can achieve an energy consumption of 179 uJ per prediction, 3.03× less than running TimePPG-Small on the smartwatch, and 1.82× less than streaming all the input data to the phone.","PeriodicalId":340349,"journal":{"name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128260558","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Eunji Kwon, Haena Song, Jihye Park, Seokhyeong Kang
{"title":"Mobile Accelerator Exploiting Sparsity of Multi-Heads, Lines, and Blocks in Transformers in Computer Vision","authors":"Eunji Kwon, Haena Song, Jihye Park, Seokhyeong Kang","doi":"10.23919/DATE56975.2023.10137099","DOIUrl":"https://doi.org/10.23919/DATE56975.2023.10137099","url":null,"abstract":"It is difficult to employ transformer models for computer vision in mobile devices due to their memory- and computation-intensive properties. Accordingly, there is ongoing research on various methods for compressing transformer models, such as pruning. However, general computing platforms such as central processing units (CPUs) and graphics processing units (GPUs) are not energy-efficient to accelerate the pruned model due to their structured sparsity. This paper proposes a low-power accelerator for transformers with various sizes of structured sparsity induced by pruning with different granularity. In this study, we can accelerate a transformer that has been pruned in a head-wise, line-wise, or block-wise manner. We developed a head scheduling algorithm to support head-wise skip operations and resolve the processing engine (PE) load imbalance problem caused by different number of operations in one head. Moreover, we implemented a sparse general matrix-to-matrix multiplication (sparse GEMM) module that supports line-wise and block-wise skipping. As a result, when compared with a mobile GPU and mobile CPU respectively, our proposed accelerator achieved $6.1times$ and $13.6times$ improvements in energy efficiency for the detection transformer (DETR) model and achieved approximately $2.6times$ and $7.9times$ improvements in the energy efficiency on average for the vision transformer (ViT) models.","PeriodicalId":340349,"journal":{"name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"806 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126955623","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Two-stage PCB Routing Using Polygon-based Dynamic Partitioning and MCTS","authors":"Youbiao He, Hebi Li, Ge Luo, F. S. Bao","doi":"10.23919/DATE56975.2023.10137062","DOIUrl":"https://doi.org/10.23919/DATE56975.2023.10137062","url":null,"abstract":"We propose a pad-focused, net-by-net, two-stage printed circuit board (PCB) routing approach comprising the global routing using Monte Carlo tree search (MCTS) and the detailed routing using $mathrm{A}^{*}$:. Compared with conventional PCB routing algorithms, our approach can route PCB components in both BGA and non-BGA packages. To minimize the gap between the global and detailed routing stages, a polygon-based dynamic routable region partitioning mechanism is introduced. Experimental results show that our approach outperforms state-of-the-art routers such as DeepPCB and FreeRouting in terms of success rate or wirelength.","PeriodicalId":340349,"journal":{"name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126962128","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Tao Yang, Hui Ma, Yilong Zhao, Fangxin Liu, Zhezhi He, Xiaoli Sun, Li Jiang
{"title":"PIMPR: PIM-based Personalized Recommendation with Heterogeneous Memory Hierarchy","authors":"Tao Yang, Hui Ma, Yilong Zhao, Fangxin Liu, Zhezhi He, Xiaoli Sun, Li Jiang","doi":"10.23919/DATE56975.2023.10137249","DOIUrl":"https://doi.org/10.23919/DATE56975.2023.10137249","url":null,"abstract":"Deep learning-based personalized recommendation models (DLRMs) are dominating AI tasks in data centers. The performance bottleneck of typical DLRMs mainly lies in the memory-bounded embedding layers. Resistive Random Access Memory (ReRAM)-based Processing-in-memory (PIM) architecture is a natural fit for DLRMs thanks to its in-situ computation and high computational density. However, it remains two challenges before DLRMs fully embrace ReRAM-based PIM architectures: 1) The size of DLRM's embedding tables can reach tens of GBs, far beyond the memory capacity of typical ReRAM chips. 2) The irregular sparsity conveyed in the embedding layers is difficult to exploit in ReRAM crossbars architecture. In this paper, we present a PIM-based DLRM accelerator named PIMPR. PIMPR has a heterogeneous memory hierarchy-ReRAM crossbar-based PIM modules serve as the computing caches with high computing parallelism, while DIMM modules are able to hold the entire embedding table-leveraging the data locality of DLRM's embedding layers. Moreover, we propose a runtime strategy to skip the useless calculation induced by the sparsity and an offline strategy to balance the workload of each ReRAM crossbar. Compared to the state-of-the-art DLRM accelerator SPACE and TRiM, PIMPR achieves on average 2.02×and 1.79× speedup, 5.6 ×, and 5.1 × energy reduction, respectively.","PeriodicalId":340349,"journal":{"name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121162717","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
S. Rajendran, Shams Tarek, Benjamin M Hicks, H. M. Kamali, Farimah Farahmandi, M. Tehranipoor
{"title":"HUnTer: Hardware Underneath Trigger for Exploiting SoC-level Vulnerabilities","authors":"S. Rajendran, Shams Tarek, Benjamin M Hicks, H. M. Kamali, Farimah Farahmandi, M. Tehranipoor","doi":"10.23919/DATE56975.2023.10137139","DOIUrl":"https://doi.org/10.23919/DATE56975.2023.10137139","url":null,"abstract":"Systems-on-chip (SoCs) have become increasingly large and complex, resulting in new threats and vulnerabilities, mainly related to system-level flaws. However, the system-level verification process, whose violation may lead to exploiting a hardware vulnerability, is not studied comprehensively due to the lack of decisive (security) requirements and properties from the SoC designer's perspective. To enable a more comprehensive verification for system-level properties, this paper presents HUnTer (Hardware Underneath Trigger), a framework for identifying sets (sequences) of instructions at the processor unit (PU) that unveils the underneath hardware vulnerabilities. The HUnTer framework automates (i) threat modeling, (ii) threat-based formal verification, (iii) generation of counterexamples, and (iv) generation of snippet code for exploiting the vulnerability. The HUnTer framework also defines a security coverage metric (HUnT_Coverage) to measure the performance and efficacy of the proposed approach. Using the HUnTer framework on a RISC-V-based open-source SoC architecture, we conduct a wide variety of case studies of Trust-HUB vulnerabilities to demonstrate the high effectiveness of the proposed framework.","PeriodicalId":340349,"journal":{"name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"113 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126025265","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"UVMMU: Hardware-Offloaded Page Migration for Heterogeneous Computing","authors":"Jihun Park, Donghun Jeong, Jungrae Kim","doi":"10.23919/DATE56975.2023.10137307","DOIUrl":"https://doi.org/10.23919/DATE56975.2023.10137307","url":null,"abstract":"In a heterogeneous computing system with multiple memories, placing data near its current processing unit and migrating data over time can significantly improve performance. GPU vendors have introduced Unified Memory (UM) to automate data migrations between CPU and GPU memories and support memory over-subscription. Although UM improves software programmability, it can incur high costs due to its software-based migration. We propose a novel architecture to offload the migration to hardware and minimize UM overheads. Unified Virtual Memory Management Unit (UVMMU) detects access to remote memories and migrates pages without software intervention. By replacing page faults and software handling with hardware offloading, UVMMU can reduce the page migration latency to a few $mu s$. Our evaluation shows that UVMMU can achieve 1.59× and 2.40× speed-ups over the state-of-the-art UM solutions for no over-subscription and 150% over-subscription, respectively.","PeriodicalId":340349,"journal":{"name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125231603","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}