{"title":"A 20 GHz FET amplifier in an integrated finline/microstrip configuration","authors":"J. Ruxton, R. Vahldieck, W. Hoefer","doi":"10.1109/MWSYM.1988.22145","DOIUrl":"https://doi.org/10.1109/MWSYM.1988.22145","url":null,"abstract":"A description is given of the design and fabrication of an 20-GHz FET amplifier that uses an integrated combination of finline and microstrip. A broadband finline-to-microstrip transition is presented. The transition incorporates a biasing network to provide unconditional stability. The single-stage amplifier, including transitions, provides better than 6-dB gain over a 1.25-GHz bandwidth.<<ETX>>","PeriodicalId":339513,"journal":{"name":"1988., IEEE MTT-S International Microwave Symposium Digest","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124775510","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Heinrich Hertz-theorist and experimenter","authors":"J. Kraus","doi":"10.1109/MWSYM.1988.22028","DOIUrl":"https://doi.org/10.1109/MWSYM.1988.22028","url":null,"abstract":"Describes Hertz's experiments and supporting analytical work that resulted in experimental validation of Maxwell's theory. Hertz's training, studies, and experiments are recounted and measurements with a replica of his apparatus are described.<<ETX>>","PeriodicalId":339513,"journal":{"name":"1988., IEEE MTT-S International Microwave Symposium Digest","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131476275","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Numerical analysis of intermodulation distortion in microwave mixers","authors":"V. Rizzoli, C. Cecchetti, A. Lipparini","doi":"10.1109/MWSYM.1988.22223","DOIUrl":"https://doi.org/10.1109/MWSYM.1988.22223","url":null,"abstract":"A general-purpose program is introduced for intermodulation distortion analysis in microwave mixers. The program can perform full nonlinear simulations of arbitrarily defined circuits simultaneously excited by three independent sinusoidal sources. The analysis relies on a three-dimensional sampling of the signal waveforms coupled with a triple Fourier transform.<<ETX>>","PeriodicalId":339513,"journal":{"name":"1988., IEEE MTT-S International Microwave Symposium Digest","volume":"613 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124629519","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Finite difference analysis of integrated optical channel waveguides with arbitrarily graded index profile","authors":"N. Schulz, K.-H. Bierwirth, F. Arndt","doi":"10.1109/MWSYM.1988.22135","DOIUrl":"https://doi.org/10.1109/MWSYM.1988.22135","url":null,"abstract":"A finite-difference formulation is described for analyzing diffused dielectric channel waveguides with arbitrarily varying two-dimensional index profiles and arbitrary index difference levels. The method allows the calculation of the complete set of hybrid modes, without nonphysical, spurious solutions. Hybrid-mode-dispersion curves for integrated optical channel waveguides with graded index profiles of practical interest are presented.<<ETX>>","PeriodicalId":339513,"journal":{"name":"1988., IEEE MTT-S International Microwave Symposium Digest","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122324417","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A method for measuring magnitude and phase of harmonics generated in nonlinear microwave two-ports","authors":"U. Lott","doi":"10.1109/MWSYM.1988.22018","DOIUrl":"https://doi.org/10.1109/MWSYM.1988.22018","url":null,"abstract":"A method for simultaneously measuring magnitude and phase of the harmonics generated by a microwave two-port is described. The measurement system has a dynamic range superior to time-domain measurements due to its reduced noise bandwidth. Sample measurements on a GaAs MESFET under large-signal operation are presented. The system allows the measurement of harmonics with a phase accuracy of about 10 degrees at 20 GHz. All types of microwave two-ports can be characterized without knowledge of their internal structure. The system can be built for any frequency less than 40 GHz where a vector generator with multiplier is available.<<ETX>>","PeriodicalId":339513,"journal":{"name":"1988., IEEE MTT-S International Microwave Symposium Digest","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129991453","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Analysis of microstrip open-end and gap discontinuities in a substrate-superstrate configuration","authors":"H. Yang, N. Alexopoulos, D. Jackson","doi":"10.1109/MWSYM.1988.22129","DOIUrl":"https://doi.org/10.1109/MWSYM.1988.22129","url":null,"abstract":"A study of microstrip open-end and gap discontinuities in a two-layer structure is presented. The analysis is based on the method-of-moments solution of a full-wave integral equation. A combination of semi-infinite modes and subdomain modes is used. The transverse dependence of the expansion functions is obtained through a two-dimensional infinite analysis. A parametric study of the material effects on the radiation and surface-wave losses, and the fringing fields at the discontinuities is also performed. The analysis shows good agreement in the limiting case with the quasistatic method.<<ETX>>","PeriodicalId":339513,"journal":{"name":"1988., IEEE MTT-S International Microwave Symposium Digest","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128291586","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Modeling of some coplanar waveguide discontinuities","authors":"R. N. Simons, G. Ponchak","doi":"10.1109/MWSYM.1988.22035","DOIUrl":"https://doi.org/10.1109/MWSYM.1988.22035","url":null,"abstract":"Lumped equivalent-circuit models are presented for several coplanar waveguide discontinuities such as an open circuit, a series gap, and a symmetric step, and their element values as a function of the discontinuity physical dimensions. The model element values are de-embedded from measured S-parameters. The frequency dependence of the effective dielectric constant was measured and compared to computed values.<<ETX>>","PeriodicalId":339513,"journal":{"name":"1988., IEEE MTT-S International Microwave Symposium Digest","volume":"68 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127624185","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A method for obtaining dispersion characteristics of shielded microstrip lines","authors":"L. Qi, C. Gu","doi":"10.1109/MWSYM.1988.22060","DOIUrl":"https://doi.org/10.1109/MWSYM.1988.22060","url":null,"abstract":"An equivalent network representation is presented for the analysis of dispersion characteristics of shielded microstrip lines, with particular attention directed toward the effects of waveguide cross-sectional geometry. The effective dielectric constants and characteristic impedances of microstrip lines are obtained to illustrate the effects of the size of the waveguide cross section. The method is based on a building-block approach to microwave network theory, using the rigorous mode-matching technique to solve the boundary-value problem. The approach offers many advantages: the problem is formulated in a rigorous fashion, with both TE and TM modes of each constituent region included to account for the hybrid nature of the guided modes. The treatment of a complicated boundary-value problem is reduced to one of a simple junction discontinuity. The analytical results so obtained are simple in form, and clear for establishing physical concepts associated with the microstrip lines. Numerical results obtained are shown to be in good agreement with available data in the literature.<<ETX>>","PeriodicalId":339513,"journal":{"name":"1988., IEEE MTT-S International Microwave Symposium Digest","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131190479","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Ferrite tuned millimeter wave bandpass filters with high off resonance isolation","authors":"D. Nicholson","doi":"10.1109/MWSYM.1988.22169","DOIUrl":"https://doi.org/10.1109/MWSYM.1988.22169","url":null,"abstract":"By combining four hexagonal ferrite spheres under the same magnet structure, magnetically tunable bandpass filters were built in waveguide yielding increased off-resonance isolation (ORI), while keeping insertion loss (IL) to a reasonable value. Examples of these filters for the 26.5-40-GHz, 33-50-GHz, 40-60-GHz, and 50-75-GHz ranges are presented with typical ORI above 70 dB and IL less than 13 dB for full band tuning. A performance summary for these four sphere waveguide filters is given showing the similar performance obtained in the different bands.<<ETX>>","PeriodicalId":339513,"journal":{"name":"1988., IEEE MTT-S International Microwave Symposium Digest","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134439024","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A new method for measuring the properties of dielectric substrate","authors":"G. Kent","doi":"10.1109/MWSYM.1988.22140","DOIUrl":"https://doi.org/10.1109/MWSYM.1988.22140","url":null,"abstract":"The TE/sub 01/-mode in a cylindrical waveguide at a frequency below cutoff is used to probe a ceramic dielectric substrate located on the central plane between input and output coupling loops. Maximum transmission occurs at a frequency determined by the waveguide radius, the substrate thickness and the dielectric constant. The dielectric constant and loss tangent are obtained from the resonant frequency and the absorption bandwidth. The measurement is insensitive to the position of the substrate in the gap between waveguide sections, and no intimate contact is required.<<ETX>>","PeriodicalId":339513,"journal":{"name":"1988., IEEE MTT-S International Microwave Symposium Digest","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134479095","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}