发布求助
文献互助 智能选刊 最新文献

Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference最新文献

筛选
英文 中文
High-level synthesis transformations for programmable architectures 可编程体系结构的高级综合转换
Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference Pub Date : 1993-09-20 DOI: 10.1109/EURDAC.1993.410609
P. Poechmueller, M. Glesner, F. Longsen
{"title":"High-level synthesis transformations for programmable architectures","authors":"P. Poechmueller, M. Glesner, F. Longsen","doi":"10.1109/EURDAC.1993.410609","DOIUrl":"https://doi.org/10.1109/EURDAC.1993.410609","url":null,"abstract":"The application of high level synthesis techniques in connection with highly programmable VLSI (very large scale integration) architectures is presented. Very early prototype realizations of subcomponents of complex systems can be achieved for real-time test runs if automatic synthesis is applied. The efficiency and applicability of this approach will be demonstrated with realistic mechatronic applications and a rapid prototyping board based on FPGAs.<<ETX>>","PeriodicalId":339176,"journal":{"name":"Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133786166","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Next generation environment for extremely fast test pattern generation 下一代环境，用于极快的测试模式生成
Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference Pub Date : 1993-09-20 DOI: 10.1109/EURDAC.1993.410671
Gabriele Pulini, S. Hamacher
{"title":"Next generation environment for extremely fast test pattern generation","authors":"Gabriele Pulini, S. Hamacher","doi":"10.1109/EURDAC.1993.410671","DOIUrl":"https://doi.org/10.1109/EURDAC.1993.410671","url":null,"abstract":"The importance of test in ASIC and IC design is discussed, and some new design-for-test (DFT) strategies are presented. The advantages of a specific method for test vector creation and validation that tightly links two scan-test tools into the target design flow are described. These tools are a sequential, partial-scan automatic test pattern generator (ATPG) and an ATPG optimized for full-scan designs. Some customer results with these tools are presented as well.<<ETX>>","PeriodicalId":339176,"journal":{"name":"Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference","volume":"1 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134025614","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Industrial experimentation of high-level synthesis 高水平合成的工业实验
Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference Pub Date : 1993-09-20 DOI: 10.1109/EURDAC.1993.410684
P. Kission, E. Closse, L. Bergher, A. Jerraya
{"title":"Industrial experimentation of high-level synthesis","authors":"P. Kission, E. Closse, L. Bergher, A. Jerraya","doi":"10.1109/EURDAC.1993.410684","DOIUrl":"https://doi.org/10.1109/EURDAC.1993.410684","url":null,"abstract":"The use of the high-level synthesis system AMICAL for the architectural synthesis of the filter or subband synthesis described in the MPEG-AUDIO specification is described. AMICAL starts with a behavioral specification given in VHDL and generates a structural description that may feed existing silicon compilers acting at the logic and register transfer levels. AMICAL is an interactive tool, meaning that different solutions can be rapidly obtained by carrying out varied manual interventions. Several architectural solutions have been generated by means of the AMICAL system. A comparison table for the results obtained indicates that the final solution obtained by AMICAL respects the real time constraints imposed by the application.<<ETX>>","PeriodicalId":339176,"journal":{"name":"Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference","volume":"75 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133398634","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Concurrent path sensitization in timing analysis 时序分析中的并发路径敏化
Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference Pub Date : 1993-09-20 DOI: 10.1109/EURDAC.1993.410637
Joao Marques-Silva, K. Sakallah
{"title":"Concurrent path sensitization in timing analysis","authors":"Joao Marques-Silva, K. Sakallah","doi":"10.1109/EURDAC.1993.410637","DOIUrl":"https://doi.org/10.1109/EURDAC.1993.410637","url":null,"abstract":"The authors describe a new two-step approach for determining the delay of the longest statically sensitizable path(s) in a combinational circuit. In the first step, the conditions for sensitizing all paths with the same path delay, D, are derived. In the second step, these conditions are checked for consistency by a Boolean satisfiability algorithm. This approach is unique in that it enumerates paths implicitly, giving it a decided performance edge over explicit path enumeration methods. The authors describe an implementation of this approach in an experimental timing analysis program, STA, and present preliminary results of its application to a representative set of benchmarks.<<ETX>>","PeriodicalId":339176,"journal":{"name":"Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129114189","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Locally optimistic methods of concurrent simulation 并行仿真的局部乐观方法
Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference Pub Date : 1993-09-20 DOI: 10.1109/EURDAC.1993.410694
D. Arvind
{"title":"Locally optimistic methods of concurrent simulation","authors":"D. Arvind","doi":"10.1109/EURDAC.1993.410694","DOIUrl":"https://doi.org/10.1109/EURDAC.1993.410694","url":null,"abstract":"A new model is presented for the simulation of large and complex systems by exploiting concurrency. Composite ELSA is a distributed asynchronous event-driven simulation model which combines the conservative and optimistic synchronization protocols, while preserving their respective advantages. This model assigns synchronization classes to processes or a hierarchy of processes, which are based on attributes of conservatism or degree of optimism. These attributes can be dynamically updated during the course of simulation, enabling processes to switch smoothly between synchronization classes. A locally optimistic synchronization protocol is introduced, and comparisons are made with two traditional protocols for parallel logic simulation on distributed memory MIMD machines.<<ETX>>","PeriodicalId":339176,"journal":{"name":"Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference","volume":"79 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116414795","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A method for diagnosing implementation errors in synchronous sequential circuits and its implications on synthesis 同步顺序电路中实现错误的诊断方法及其对综合的影响
Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference Pub Date : 1993-09-20 DOI: 10.1109/EURDAC.1993.410646
I. Pomeranz, S. Reddy
{"title":"A method for diagnosing implementation errors in synchronous sequential circuits and its implications on synthesis","authors":"I. Pomeranz, S. Reddy","doi":"10.1109/EURDAC.1993.410646","DOIUrl":"https://doi.org/10.1109/EURDAC.1993.410646","url":null,"abstract":"The authors consider the problem of diagnosing implementation errors in synchronous sequential circuits described by state tables. The diagnosis problem is formulated so as to provide the erroneously implemented entries of the state table, which are useful for the purposes of debugging the synthesis procedure. The diagnosis procedure developed is not limited to a specific error model and no bound is set on error multiplicity. Experimental results are presented to show the effectiveness of this procedure. The experiments indicate that state tables with certain properties make their implementations more amenable to diagnosis than others. These properties are used as guidelines for synthesis.<<ETX>>","PeriodicalId":339176,"journal":{"name":"Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125837697","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Demosthenes-A technology-independent power DMOS layout generator demosthenes -一个技术独立的功率DMOS布局发生器
Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference Pub Date : 1993-09-20 DOI: 10.1109/EURDAC.1993.410634
Gilles Fourneris, N. Bekkara, J. Benkoski, L. Zullino, Dino Spatafora, G. Martino
{"title":"Demosthenes-A technology-independent power DMOS layout generator","authors":"Gilles Fourneris, N. Bekkara, J. Benkoski, L. Zullino, Dino Spatafora, G. Martino","doi":"10.1109/EURDAC.1993.410634","DOIUrl":"https://doi.org/10.1109/EURDAC.1993.410634","url":null,"abstract":"A methodology to automate DMOS layout generation starting from electrical specifications is presented. The main features of the Demosthenes technology independent layout generator that make it possible to synthesize lateral and vertical DMOS in different low and high voltage technologies are described. The built-in electrical model used by the generator to extract the device layout resistance is exposed and the accuracy of the model, ranging from 1% to 15%, is reported, according to comparisons with silicon measurements. In the future, the Demosthenes generator will be extended to support the next generation of BCD technology. In addition, electrical modeling capabilities will be improved by generating detailed electrical simulation models that make it possible to accurately simulate DMOS switching.<<ETX>>","PeriodicalId":339176,"journal":{"name":"Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference","volume":"145 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123210774","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Fast Boolean matching for field-programmable gate arrays 现场可编程门阵列的快速布尔匹配
Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference Pub Date : 1993-09-20 DOI: 10.1109/EURDAC.1993.410661
Kai Zhu, D. F. Wong
{"title":"Fast Boolean matching for field-programmable gate arrays","authors":"Kai Zhu, D. F. Wong","doi":"10.1109/EURDAC.1993.410661","DOIUrl":"https://doi.org/10.1109/EURDAC.1993.410661","url":null,"abstract":"A key step in technology mapping for non-lookup-table (such as multiplexer) based FPGAs (field programmable gate arrays) is to determine whether a given function can be implemented by the logic module. A new algorithm is presented for solving this problem. The algorithm is based on a character string representation of binary decision diagrams. Such representation leads to a matching algorithm which requires only a few string comparisons for each matching operation. When compared to the matching algorithm by searching for isomorphism on all different BDDs (binary decision diagrams), the new algorithm is much faster with a modest increase of memory requirement. For example, the experimental results showed that in matching all three-input Boolean function against Actel's ACT1 logic module, the new algorithm is 634 times faster by using 19.9% more memory.<<ETX>>","PeriodicalId":339176,"journal":{"name":"Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference","volume":"95 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132981053","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
High-level modeling using extended timing diagrams - A formalism for the behavioral specification of digital hardware 使用扩展时序图的高级建模。数字硬件行为规范的形式化方法
Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference Pub Date : 1993-09-20 DOI: 10.1109/EURDAC.1993.410682
Philippe Moeschler, H. Amann, F. Pellandini
{"title":"High-level modeling using extended timing diagrams - A formalism for the behavioral specification of digital hardware","authors":"Philippe Moeschler, H. Amann, F. Pellandini","doi":"10.1109/EURDAC.1993.410682","DOIUrl":"https://doi.org/10.1109/EURDAC.1993.410682","url":null,"abstract":"The principles of high level modeling of digital hardware circuits using the extended timing diagrams (ETD) formalism, which adds conditions, events, action expressions, and particular constraints to traditional timing diagrams, are described. Hierarchy and concurrency are also integrated so that a full top-down design becomes possible, enhancing at the same time the readability. While, for simulation purposes, the implementation of the formalism generates behavioral VHDL (VHSIC Hardware Description Language) models, a dedicated high-level translator generates VHDL code for synthesis. Both the ETD formalism and its implementation are part of MODES, a more complex modeling expert system including complementary editors.<<ETX>>","PeriodicalId":339176,"journal":{"name":"Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131262644","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 18
Multi-way FSM decomposition based on interconnect complexity 基于互连复杂度的多路FSM分解
Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference Pub Date : 1993-09-20 DOI: 10.1109/EURDAC.1993.410666
Wen-Lin Yang, R. Owens, M. J. Irwin
{"title":"Multi-way FSM decomposition based on interconnect complexity","authors":"Wen-Lin Yang, R. Owens, M. J. Irwin","doi":"10.1109/EURDAC.1993.410666","DOIUrl":"https://doi.org/10.1109/EURDAC.1993.410666","url":null,"abstract":"Various strategies for multi-way general decomposition have been investigated in the past. These strategies differ in how they reflect the cost of a logic-level implementation. The authors are concerned with the lower bound on the number of interconnecting wires which must exist when a machine is decomposed into several submachines. From a VLSI implementation point of view having a cost function based at least in part on interconnect complexity would be advantageous. The authors present a way to establish this bound for the multi-way decomposition of an arbitrary machine and tabulate the bound for a number of benchmarks. This tabulation shows that many large benchmarks are indeed highly decomposable from an interconnect point of view.<<ETX>>","PeriodicalId":339176,"journal":{"name":"Proceedings of EURO-DAC 93 and EURO-VHDL 93- European Design Automation Conference","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129831058","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
首页 上一页 下一页 尾页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：481959085
Book学术官方微信