2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW)最新文献_第3页

Embedded Functions for Constraints and Variable Strength in Combinatorial Testing 组合测试中约束和变强度的嵌入函数

2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2016-04-11 DOI: 10.1109/ICSTW.2016.16

G. B. Sherwood

引用次数: 5

Effective Fault Localization Using Dynamic Slicing and an SMT Solver 基于动态切片和SMT求解器的有效故障定位

2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2016-04-11 DOI: 10.1109/ICSTW.2016.20

Yoshinao Ishii, Takuro Kutsuna

{"title":"Effective Fault Localization Using Dynamic Slicing and an SMT Solver","authors":"Yoshinao Ishii, Takuro Kutsuna","doi":"10.1109/ICSTW.2016.20","DOIUrl":"https://doi.org/10.1109/ICSTW.2016.20","url":null,"abstract":"Dynamic slicing and spectrum-based fault localization (SFL) are widely used as fault localization methods. While these methods are effective for localizing a faulty statement in a program, they have some practical drawbacks. One of the drawbacks with dynamic slicing is that if a program is large, the sliced program will also remain large in general. One of the drawbacks with SFL is that the suspiciousness of faulty statements may become low, even if only one fault exists in a program. To overcome these drawbacks, we propose an effective fault localization method that iteratively generates test cases that cause an error using a satisfiability modulo theories (SMT) solver such that the result of dynamic slicing for each generated failed test case is distinct. Using test cases generated by our method, the suspiciousness of a faulty statement is always maximum when a target has only one fault. Furthermore, the number of statements that have maximum suspiciousness, that is, the number of fault candidates, is smaller than that obtained by conventional dynamic slicing. In this paper, we explain our proposed method by applying it to MATLAB/Simulink models.","PeriodicalId":335145,"journal":{"name":"2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-04-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133577178","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

A Model-Based Approach for Product Testing and Certification in Digital Ecosystems 数字生态系统中基于模型的产品测试与认证方法

2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2016-04-11 DOI: 10.1109/ICSTW.2016.22

B. Lima, J. Faria

{"title":"A Model-Based Approach for Product Testing and Certification in Digital Ecosystems","authors":"B. Lima, J. Faria","doi":"10.1109/ICSTW.2016.22","DOIUrl":"https://doi.org/10.1109/ICSTW.2016.22","url":null,"abstract":"In a growing number of domains, such as ambient-assisted living (AAL) and e-health, the provisioning of end-to-end services to the users depends on the proper interoperation of multiple products from different vendors, forming a digital ecosystem. To ensure interoperability and the integrity of the ecosystem, it is important that candidate products are independently tested and certified against applicable interoperability requirements. Based on the experience acquired in the AAL4ALL project, we propose in this paper a model-based approach to systematize, automate and increase the assurance of such testing and certification activities. The approach encompasses the construction of several models: a feature model, an interface model, a product model, and unit and integration test models. The abstract syntax and consistency rules of these models are specified by means of metamodels written in UML and Alloy and automatically checked with Alloy Analyzer. Using the model finding capabilities of Alloy Analyzer, integration tests can be automatically generated from the remaining models, through the composition and instantiation of unit tests. Examples of concrete models from the AAL4ALL project are also presented.","PeriodicalId":335145,"journal":{"name":"2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-04-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123976204","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

Difference in Quality of Test Architecture between Service Providers and Subcontractors 服务提供商和分包商之间测试体系结构质量的差异

2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2016-04-11 DOI: 10.1109/ICSTW.2016.46

Y. Nishi

引用次数: 1

Industrial Evaluation of Test Suite Generation Strategies for Model-Based Testing 基于模型测试的测试套件生成策略的工业评价

2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2016-04-11 DOI: 10.1109/ICSTW.2016.42

J. Blom, B. Jonsson, S. Nyström

引用次数: 7

Analyzing Minimal Failure-Causing Schemas in Siemens Suite 分析Siemens Suite中的最小故障导致模式

2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2016-04-11 DOI: 10.1109/ICSTW.2016.33

Chiya Xu, Yuanchao Qi, Ziyuan Wang, Weifeng Zhang

引用次数: 5

Coverage, Location, Detection, and Measurement 覆盖范围、位置、检测和测量

2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2016-04-11 DOI: 10.1109/ICSTW.2016.38

C. Colbourn, V. Syrotiuk

{"title":"Coverage, Location, Detection, and Measurement","authors":"C. Colbourn, V. Syrotiuk","doi":"10.1109/ICSTW.2016.38","DOIUrl":"https://doi.org/10.1109/ICSTW.2016.38","url":null,"abstract":"Complex engineered systems arise throughout computing, communications, and networking. Many factors, each having a finite number of levels, impact the behaviour of the system either singly or in interaction with one another. Testing or evaluating such a system involves formulating a set of tests, when executed, responses or outcomes from the tests are analyzed. A single round of testing is conducted. To witness the effect of an interaction, some test must cover it, this does not suffice in general to locate the interaction or to measure its effect. When there are few factors or many tests, experimental designs can measure (and hence locate) the interactions. When there are many factors and few tests, can we locate the interaction(s)? Can we efficiently detect them?Combinatorial arrays, locating and detecting arrays, are introduced to address such location and detection in the context of combinatorial testing. Locating and detecting arrays are contrasted with covering arrays and with experimental designs. An application to a 75 factor protocol stack for file transfer is given to demonstrate their practical use. Finally, their place in the literature of combinatorial testing is discussed and some directions are outlined.","PeriodicalId":335145,"journal":{"name":"2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-04-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130125425","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 20

Relating Code Coverage, Mutation Score and Test Suite Reducibility to Defect Density 将代码覆盖率、突变分数和测试集的可还原性与缺陷密度联系起来

2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2016-04-11 DOI: 10.1109/ICSTW.2016.25

Dávid Tengeri, László Vidács, Árpád Beszédes, J. Jász, Gergõ Balogh, Béla Vancsics, T. Gyimóthy

{"title":"Relating Code Coverage, Mutation Score and Test Suite Reducibility to Defect Density","authors":"Dávid Tengeri, László Vidács, Árpád Beszédes, J. Jász, Gergõ Balogh, Béla Vancsics, T. Gyimóthy","doi":"10.1109/ICSTW.2016.25","DOIUrl":"https://doi.org/10.1109/ICSTW.2016.25","url":null,"abstract":"Assessing the overall quality (adequacy for a particular purpose) of existing test suites is a complex task. Their code coverage is a simple yet powerful attribute for this purpose, so the additional benefits of mutation analysis may not always justify the comparably much higher costs and complexity of the computation. Mutation testing methods and tools slowly start to reach a maturity level at which their use in everyday industrial practice becomes possible, yet it is still not completely clear in which situations they provide additional insights into various quality attributes of the test suites. This paper reports on an experiment conducted on four open source systems' test suites to compare them from the viewpoints of code coverage, mutation score and test suite reducibility (the amount test adequacy is degraded in a reduced test suite). The purpose of the comparison is to find out when the different attributes provide additional insights with respect to defect density, a separately computed attribute for the estimation of real faults. We demonstrate that in some situations code coverage might be a sufficient indicator of the expected defect density, but mutation and reducibility are better in most of the cases.","PeriodicalId":335145,"journal":{"name":"2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-04-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130176647","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 24

Towards Automatic Cost Model Discovery for Combinatorial Interaction Testing 面向组合交互测试的成本模型自动发现

2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2016-04-11 DOI: 10.1109/ICSTW.2016.7

G. Demiröz, Cemal Yilmaz

引用次数: 5

A Study on the Effectiveness of Test-Categories Based Test Analysis 基于测试类别的测试分析的有效性研究

2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2016-04-11 DOI: 10.1109/ICSTW.2016.26

Tsuyoshi Yumoto, T. Matsuodani, K. Tsuda

引用次数: 3