Analyzing Minimal Failure-Causing Schemas in Siemens Suite

Abstract

Combinatorial testing has been widely utilized in testing softwares, e.g. Siemens Suite. This paper aims to investigate the reason why combinatorial testing works in Siemens Suite. Experiments are designed to get the MFS(minimal failure-causing schema) for Siemens Suite, which has been used as a benchmark to evaluate the effectiveness of many testing techniques. The lowerbound of fault-detecting probability of T-way combinatorial test suite for each program is calculated by analyzing the strengths and the number of MFS for each faulty version. Computational results could explain the effectiveness of combinatorial testing in Siemens Suite.