{"title":"分析Siemens Suite中的最小故障导致模式","authors":"Chiya Xu, Yuanchao Qi, Ziyuan Wang, Weifeng Zhang","doi":"10.1109/ICSTW.2016.33","DOIUrl":null,"url":null,"abstract":"Combinatorial testing has been widely utilized in testing softwares, e.g. Siemens Suite. This paper aims to investigate the reason why combinatorial testing works in Siemens Suite. Experiments are designed to get the MFS(minimal failure-causing schema) for Siemens Suite, which has been used as a benchmark to evaluate the effectiveness of many testing techniques. The lowerbound of fault-detecting probability of T-way combinatorial test suite for each program is calculated by analyzing the strengths and the number of MFS for each faulty version. Computational results could explain the effectiveness of combinatorial testing in Siemens Suite.","PeriodicalId":335145,"journal":{"name":"2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-04-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Analyzing Minimal Failure-Causing Schemas in Siemens Suite\",\"authors\":\"Chiya Xu, Yuanchao Qi, Ziyuan Wang, Weifeng Zhang\",\"doi\":\"10.1109/ICSTW.2016.33\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Combinatorial testing has been widely utilized in testing softwares, e.g. Siemens Suite. This paper aims to investigate the reason why combinatorial testing works in Siemens Suite. Experiments are designed to get the MFS(minimal failure-causing schema) for Siemens Suite, which has been used as a benchmark to evaluate the effectiveness of many testing techniques. The lowerbound of fault-detecting probability of T-way combinatorial test suite for each program is calculated by analyzing the strengths and the number of MFS for each faulty version. Computational results could explain the effectiveness of combinatorial testing in Siemens Suite.\",\"PeriodicalId\":335145,\"journal\":{\"name\":\"2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW)\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-04-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICSTW.2016.33\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSTW.2016.33","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Analyzing Minimal Failure-Causing Schemas in Siemens Suite
Combinatorial testing has been widely utilized in testing softwares, e.g. Siemens Suite. This paper aims to investigate the reason why combinatorial testing works in Siemens Suite. Experiments are designed to get the MFS(minimal failure-causing schema) for Siemens Suite, which has been used as a benchmark to evaluate the effectiveness of many testing techniques. The lowerbound of fault-detecting probability of T-way combinatorial test suite for each program is calculated by analyzing the strengths and the number of MFS for each faulty version. Computational results could explain the effectiveness of combinatorial testing in Siemens Suite.